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SNAP spectrograph demonstrator : AIT/AIV Cedric CERNA CNRS (IN2P3,INSU) FRANCE,

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Presentation on theme: "SNAP spectrograph demonstrator : AIT/AIV Cedric CERNA CNRS (IN2P3,INSU) FRANCE,"— Presentation transcript:

1 SNAP spectrograph demonstrator : AIT/AIV Cedric CERNA CNRS (IN2P3,INSU) FRANCE,

2 2 November 15 & 16, 2005 Cerna, C.Summary Assembly Integration Tests and Verifications 1.Overview 2.Subsystems a.General philosophy b.Steering unit c.Spectrograph unit d.Offner relay unit e.Slicer unit 3.Full demonstrator assembly 4.Warm test integration 5.Cold test integration 6.Schedules & Quality plan

3 3 November 15 & 16, 2005 Cerna, C.Overview steering unit slicer unit general support spectrometer unit detector offner relay unit

4 4 November 15 & 16, 2005 Cerna, C. General philosophy Modular philosophy : Till the full assembly each unit is an independent system : Each optical unit have an entrance/exit focal plane conception manufacturing assembly test & verification

5 5 November 15 & 16, 2005 Cerna, C. AIT/V General philosophy 1.Sub-Unit mechanical assembly done at CPPM 2.Survey done at CPPM 3.Optical mounting done at LAM 4.Tests and verification of the sub-Unit done at LAM A.For each unit B.Full assembly of the units on the same bench done at LAM C.Warm test integration D.Cold test integration

6 6 November 15 & 16, 2005 Cerna, C. Alignment & focus 1 entrance beam exit beam conjugated focal planes

7 7 November 15 & 16, 2005 Cerna, C. Alignment and focus 2 dedicated AIT/V bench pinhole target conjugated focal planes

8 8 November 15 & 16, 2005 Cerna, C. Alignment & focus 2

9 9 November 15 & 16, 2005 Cerna, C. Alignment & focus 3

10 10 November 15 & 16, 2005 Cerna, C.Alignment laser beam large (100  m) pinhole laser shoot frosted glass

11 11 November 15 & 16, 2005 Cerna, C.focus laser beam small (10  m) pinhole far screen Foucault knife

12 12 November 15 & 16, 2005 Cerna, C. Spectrograph Unit target plane mirror entrance pinhole entrance focal plane exit focal plane reference stoppers

13 13 November 15 & 16, 2005 Cerna, C. Offner Relay Unit

14 14 November 15 & 16, 2005 Cerna, C.Slicer Same philosophy : dedicated AIT/V tool (tbd) Alignment and focus tests done by the same way : laser beam, large & small pinhole, frosted glass & Foucault knife Only difference : we will check only the central slice (the others ones are already checked by the manufacturer)

15 15 November 15 & 16, 2005 Cerna, C. Sub-Units schedule

16 16 November 15 & 16, 2005 Cerna, C. Steering integration Mechanics and electronic control of the steering unit already presented (see Blanc,P.E. & Cerna,C. talk) Requirements on the steering mirror motion : Pointing accuracy of a tenth of slice (50  m) is (slit effect R4):  pointing = atan(0.05/250) ≈ 41” Pointing stability can be defined as a tenth of the pointing accuracy which means :  stability ≈ 4”

17 17 November 15 & 16, 2005 Cerna, C. Steering qualification Qualification test 4” 0.2mm

18 18 November 15 & 16, 2005 Cerna, C. Steering schedule

19 19 November 15 & 16, 2005 Cerna, C. Full assembly General bench

20 20 November 15 & 16, 2005 Cerna, C. Full assembly

21 21 November 15 & 16, 2005 Cerna, C. Warm test integration Tests foreseen in a dedicated clean room at LAM (possibly class 100) Bench will be mounted on a support

22 22 November 15 & 16, 2005 Cerna, C. Warm test integration Spherical mirror Plane mirror lamps apertures collimated beam

23 23 November 15 & 16, 2005 Cerna, C. Visible detector U2

24 24 November 15 & 16, 2005 Cerna, C. Warm schedule

25 25 November 15 & 16, 2005 Cerna, C. Cold test integration

26 26 November 15 & 16, 2005 Cerna, C. Cold test integration

27 27 November 15 & 16, 2005 Cerna, C. Cold test integration

28 28 November 15 & 16, 2005 Cerna, C. Cold schedule test plan & integration tools

29 29 November 15 & 16, 2005 Cerna, C. General schedule

30 30 November 15 & 16, 2005 Cerna, C.Organization LAM : optic, steering mirror, cryostat, quality CPPM : mechanic, thermal studies, electronic, AIT/AIV, calibration, software (simulation/data reduction) IPNL : detector, electronic, software IR with an independent test system

31 31 November 15 & 16, 2005 Cerna, C. Quality plan set of documentation under EDMS database (Electronic Document Management System) An integration and test control procedure Definition of reviews and milestones Monthly progress meeting (CPPM/LAM/IPNL) Interface Control Document : SNAP demonstrator / test equipments (cryostat) Internal interfaces mechanical frame steering mirror detectors Test plan AIT/AIV plan Proto 0 : logbook and results online in the website (see this presentation) First tested at Proto 0 Then during Warm tests of demonstrator with possibility of direct intervention Finally ready for Cold tests of demonstrator Inter-lab meeting Minutes Action list Major risk : ensure results in time for the JDEM ITT (spring 07)  Management risk : manpower, funding, interfaces (people, labs, company) problems

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