1. Date of download: 6/25/2016 Copyright © 2016 SPIE. All rights reserved. Temporal profiles of a laser pulse at 1064, 532, and 355nm measured with a 1-ns risetime photodetector. The normalized intensity is plotted versus the time duration in nanoseconds. Figure Legend: From: Differentiation of defect populations responsible for bulk laser-induced damage in potassium dihydrogen phosphate crystals Opt. Eng. 2006;45(10):104205-104205-6. doi:10.1117/1.2363166

2. Date of download: 6/25/2016 Copyright © 2016 SPIE. All rights reserved. Spatial profile of the laser intensity along the vertical and horizontal axes at the focal plane for all three laser wavelengths used for damage testing. Each profile is an average of 50 measurements. Figure Legend: From: Differentiation of defect populations responsible for bulk laser-induced damage in potassium dihydrogen phosphate crystals Opt. Eng. 2006;45(10):104205-104205-6. doi:10.1117/1.2363166

3. Date of download: 6/25/2016 Copyright © 2016 SPIE. All rights reserved. Digitized scattering intensity profiles along horizontal and vertical directions from images of damage sites resulting from (a) 1064 and (b) 532nm [shown as white dashed arrows in Figs. ]. Scattering from cracks are clearly visible with damage sites from 1064nm but not with damage sites at 532nm. Figure Legend: From: Differentiation of defect populations responsible for bulk laser-induced damage in potassium dihydrogen phosphate crystals Opt. Eng. 2006;45(10):104205-104205-6. doi:10.1117/1.2363166

4. Date of download: 6/25/2016 Copyright © 2016 SPIE. All rights reserved. Schematic layout of high resolution damage testing and site characterization system. Figure Legend: From: Differentiation of defect populations responsible for bulk laser-induced damage in potassium dihydrogen phosphate crystals Opt. Eng. 2006;45(10):104205-104205-6. doi:10.1117/1.2363166

5. Date of download: 6/25/2016 Copyright © 2016 SPIE. All rights reserved. 100× magnification white light scattering images of damage sites resulting from a single pulse at 46J∕cm2 at (a) 1064nm and (b) 532nm and 20J∕cm2 at (c) 355nm and (d) 532nm. The direction of propagation of the damage testing pulsed beam is indicated by the arrow in (d) and it is the same for all images. Figure Legend: From: Differentiation of defect populations responsible for bulk laser-induced damage in potassium dihydrogen phosphate crystals Opt. Eng. 2006;45(10):104205-104205-6. doi:10.1117/1.2363166

6. Date of download: 6/25/2016 Copyright © 2016 SPIE. All rights reserved. HeNe damage scatter images illustrating damage testing at 355nm in material previously damage tested at 532nm: (a) ∼ 100pinpoints∕mm3 resulting from a single pulse at 19J∕cm2 at 532nm, (b) ∼ 92pinpoints∕mm3 resulting from a single pulse at 13.5J∕cm2 at 355nm, (c) ∼ 111pinpoints∕mm3 resulting from a single pulse at 19J∕cm2 at 532nm [shown in (a)] followed by a single pulse at 13.5J∕cm2 at 355nm, and (d) the difference image [(c)−(a)] better showing the new damage pinpoints from the 355-nm pulse. The arrow in (a) indicates the direction of propagation of the damage testing pulsed beam for all images. Figure Legend: From: Differentiation of defect populations responsible for bulk laser-induced damage in potassium dihydrogen phosphate crystals Opt. Eng. 2006;45(10):104205-104205-6. doi:10.1117/1.2363166