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Testing the Enclosure Original Plan: Intrinsic safety and wireless communication New Plan: Sensor circuitry and relay together, and totally enclosed EE.

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Presentation on theme: "Testing the Enclosure Original Plan: Intrinsic safety and wireless communication New Plan: Sensor circuitry and relay together, and totally enclosed EE."— Presentation transcript:

1 Testing the Enclosure Original Plan: Intrinsic safety and wireless communication New Plan: Sensor circuitry and relay together, and totally enclosed EE team will verify the enclosure excludes dust – Using FM Global Approval Notes – ISA requirements

2 Dust Circulation Testing We will build an apparatus to determine whether the enclosure is dust tight. – Create vacuum within enclosure – Circulate talcum powder within chamber

3 Impact Testing 2.7 J impact test for Class II 1kg test mass, falling from height 270mm Steel hemisphere 25mm diameter as impact point Unit assembled, mounted on concrete with mass over 20kg (Drop test not necessary- not portable)

4 Thermal Endurance Non-metallic elements which dust-protection is dependent must undergo thermal endurance testing Heat: 4 weeks at (90±5)% humidity, (20±2)K above maximum service temperature Cold: 24hr, 5 to 10K below minimum service temperature


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