1. IEEE P1505.1.1 Practical Representation of P1505.1 using IEEE1671.6

2. Agenda Description Process review –Input Data –Intermediate Data –Trial Results Open Items and future actions

3. P1505.1 Use the existing Standards documents to implement a test station interface definition/instance for P1505.1 Automate the process as much as practical for rapid draft iterations Closely work with TII - 1671.5/6 for best implementation –Coordinate with Signal Path work for Port definitions

4. Input Data P1505.1 Standard document –IEEE P1505.1™/D10 Draft Trial-Use Standard for The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 –June 2008 Transpose Tables into MS Excel

5. Intermediate Data Parse out ‘unnecessary’ information Structure for easy manipulation

6. Resulting Trial Implementation XML Test Station Interface Port definitions

7. Open Items Enumeration for (currently csv-text) –Legacy Systems –Recommended Attributes Incorporation of performance requirements –CTI connector module/contact module performance requirements –Signal switch performance requirements –Power switch performance requirements –Coax switch performance requirements –CTI Switch configuration requirements (Table 6) Additional Port or Path information based on signal path task group