Design of single-shot time/energy- resolved XES spectrometer for the LCLS Katherine Spoth Dennis Nordlund, mentor August 11, 2011.

Slides:



Advertisements
Similar presentations
RHESSI Investigations of the Neupert Effect in Solar Flares Brian R. Dennis AAS/SPD Meeting 6 June 2002.
Advertisements

Soft X-ray Self-Seeding
The waves spread out from the opening!
Eyes for Relighting Extracting environment maps for use in integrating and relighting scenes (Noshino and Nayar)
Sub-picosecond Megavolt Electron Diffraction International Symposium on Molecular Spectroscopy June 21, 2006 Fedor Rudakov Department of Chemistry, Brown.
First of all, do you know any methods to check chemical composition? Or how you know what is what? First of all, do you know any methods to check chemical.
SLAC National Accelerator Center
Reflection of light.. Specula Reflection. Reflection from a mirrored or glossy surface Specula Reflection.
10.2 Properties of Light and Reflection
Mirrors Physics 202 Professor Lee Carkner Lecture 22.
Rays and Plane Mirrors The line of particles on the crest of a wave is called a wave front Huygen’s Principle = a wave front can be divided into point.
Photon Tracing with Arbitrary Materials Patrick Yau.
Some Chandra Basics. Chandra X-Ray Observatory.
Physics 110G Light TOC 1 What do we see? Law of Reflection Properties of Spherical Mirrors Ray Tracing Images and the Equations.
SPD May 25, 2005 RHESSI soft X-ray imaging spectroscopy H. Hudson & A. Caspi (SSL/UCB) And B. Dennis & K. Phillips (NASA/GSFC.
Copyright © 2007, Pearson Education, Inc., Publishing as Pearson Addison-Wesley. The ray model of light Reflection Refraction Dispersion Ray tracing for.
Possible spectrometers
Reflection of Light. Slide 2 Luminous objects – generate their own light (the sun) Illuminated objects – reflect light (the moon) Line of Sight – a line.
LCLS Studies of Laser Initiated Dynamics Jorgen Larsson, David Reis, Thomas Tschentscher, and Kelly Gaffney provided LUSI management with preliminary Specifications.
1 A Grating Spectrograph for the LCLS Philip Heimann Advanced Light Source Observe the spontaneous radiation spectrum of the individual undulators Observe.
On-Orbit Adjustment Calculation for the Generation-X X-ray mirror Figure D. A. Schwartz, R. J. Brissenden, M. Elvis, G. Fabbiano, D. Jerius, M. Juda, P.
Reflection Physics Department, New York City College of Technology.
1 Michael Rowen 1 SXR Instrument FAC SXR Instrument Michael Rowen – Engineering Physicist June 9, 2009.
© 2012 Pearson Education, Inc. { Chapter 36 Diffraction (cont.)
John Arthur X-ray April 20, 2006 X-Ray Beamline and Experiment Layout John Arthur LCLS Photon Systems Manager.
John Arthur Mirror June 23, Effects of LCLS X-Ray Mirrors John Arthur Presenting work by Peter Stefan and Mike.
Interference Diffraction and Lasers
Curved Mirrors The most common type of curved mirror is a spherical mirror A spherical mirror has the shape of a section from the surface of a sphere.
Seminar Author: Bojan Hiti Mentor: doc. dr. Matjaž Kavčič Determination of trace impurities on Si wafers with x-ray fluorescence.
1 Components of Optical Instruments, Cont… Lecture 7.
Light and Sight Progress Test. Light is a form of energy 1. True 2. False.
Chapter 18: Ray Optics Lisa & Becky. Ray Model of Light  Light rays travel in straight lines  Light rays cross but do not interact  Light rays travel.
Scanning Electron Microscope (SEM) – Shoots a high energy beam of electrons (waves of electrons) at a target. Electron gun Focusing coil Objective lens.
Refraction is the change of direction of a light wave caused by a change in speed as the wave crosses a boundary between materials.
Midterm Distribution 31 A’s, 37 B’s, 26 C’s, 21 D’s, 17 F’s.
Electromagnetic spectrum Light is just a small part of the electromagnetic spectrum. Microwaves, infra-red radiation and x-rays are other parts. The various.
Lecture 31—Rays, Reflection, Refraction Chapter 18: 1-3 Wednesday April 22.
14 October Observational Astronomy SPECTROSCOPY and spectrometers Kitchin, pp
Scanning Electron Microscope (SEM)
10.2 Properties of Light and Reflection. Reflection  When light (electromagnetic waves) hits a surface its direction is changed  This change in direction.
Principal maxima become sharper Increases the contrast between the principal maxima and the subsidiary maxima GRATINGS: Why Add More Slits?
Characterizing surface layers in Nitinol using XPS Rebecca Christopfel Western Washington University Mentor: Apurva Mehta August 15, 2007.
Unit 5, Chapter 15 Integrated Science. Unit Five: Light and Optics 15.1 Seeing an Image 15.2 The Human Eye 15.3 Optical Technology Chapter 15 Optics.
PCB Soldering Inspection. Structured Highlight approach Structured Highlight method is applied to illuminating and imaging specular surfaces which yields.
Optical Characterization of Nonimaging Focusing Heliostat First version published: NON-IMAGING, FOCUSING HELIOSTAT Solar Energy, Vol. 71, No. 3, pp. 155–164,
The waves spread out from the opening!
Fundamental Physics II PETROVIETNAM UNIVERSITY FACULTY OF FUNDAMENTAL SCIENCES Vungtau, 2013 Pham Hong Quang
Difference of Optical Path Length Interference Two waves One wave Many waves Diffraction.
Plane Mirrors.
Law of reflection Watch the next 5 slides for Part IV.
1.Stable radiation source 2.Wavelength selector 3.Transparent sample holder: cells/curvettes made of suitable material (Table 7- 2) 4.Radiation detector.
Calibration of the Nikon D200 for Close-Range Photogrammetry
Lab 9: Geometrical optics Only 3 more labs to go!! Today we are going to do three experiments: 1. Measure the intensity of light as a function of distance.
The amount of reflection depends on how different the media are.
Chapter 4: Telescopes. E O Optical telescopes: Reflectors and refractors Refractors use lenses E: eyepiece O: objective.
Detection Scheme of Single Shot Time Resolved X-ray Emission Spectroscopy of Chemical Dynamics at LCLS Kathleen R. Geyer August 12, 2010 Mentor: Dennis.
Suzaku: Technology, Science and Education Suzaku E/PO Team (NASA/GSFC) The Suzaku Satellite Suzaku is a Japanese X-ray.
1 BROOKHAVEN SCIENCE ASSOCIATES Lonny Berman EFAC May 10 th 2007 ID Beamline Optics and Damping Wigglers.
Gas Heating Effect in High Power FEL Operations Y. Feng, J. Krzywinski, D. Schafer, and T. Raubenheimer 11/12/2014 LCLS-II Accele. Phys. Meeting.
Laws of Reflection and Plane Mirror Images
LCLS Facility Planning for LCLS-II. 2 LCLS vs. LCLS-II NowHXU - CuSXU - CuHXU - SCSXU - SC Photon Energy Range (eV)
Mirrors.
06 Oct 05Space Science & Technology Dept1 Solar Orbiter Consortium Meeting 03 Mar 06 Optical Design Of Solar Orbiter Normal Incidence Spectrometer KF Middleton.
Optical Characterization and Performances of Aerogel Radiator L.Barion, G.Battaglia, M. Contalbrigo, P. Lenisa, A.Movsisyan, L. Pappalardo, M. Turisini.
SSRL Beam Line Infrastructure Update February 2002
Chapter 35-Diffraction Chapter 35 opener. Parallel coherent light from a laser, which acts as nearly a point source, illuminates these shears. Instead.
SPEAR3 Beam Line Upgrades
Light Reflection – the “bouncing” of light off of a surface. The light does not pass through the surface (called a medium), Refraction – is the “bending.
OBJECTIVES 1) Trace light rays as they reflect from a plane mirror.
The waves spread out from the opening!
Presentation transcript:

Design of single-shot time/energy- resolved XES spectrometer for the LCLS Katherine Spoth Dennis Nordlund, mentor August 11, 2011

Surface Chemistry 2

X-ray Emission Process (XES) 1s 2s 2p 1s 2s 2p 1s 2s 2p Energy Ground StateExcitationDecay 3

Resonant X-ray Emission (RIXS) 1s 2s 2p 1s 2s 2p 1s 2s 2p Energy Ground StateExcitationDecay 4

Basic Spectrometer Design 5

Non-Dispersive Imaging: Time Resolved XES 6

Non-Dispersive Imaging: Variable-Energy RIXS 7

Design Goals Optimize for study of Oxygen at 520 eV Best energy resolution (grating) of 0.25 eV – Also allow high-throughput resolution up to 1 eV for certain applications Imaging resolution (mirror): – Time-resolved XES: 10 um on source, corresponding to 30 fs – Variable-energy RIXS: 200 um on source, corresponding to 0.25 eV 8

Ray tracing - SHADOW Simulated spectrometer’s performance: – Mirror position, shape, incidence angle – Illumination distance of mirror, grating

Final Design 10

Results of Ray-Tracing 1:10 imaging, ideal elliptical shape are best choices for non-dispersive focusing mirror Determine maximum length on grating, mirror that can be illuminated keeping required resolution Large source sizes (sample footprints) are not imaged well 11

Monochromator Dispersion on sample for θ=12° LCLS SXR: 1 eV/mm SSRL BL 13: 10 eV/mm Ideally, want higher eV/mm at smaller angle θ 12

Conclusions This design is capable of: – Time-resolved XES – Variable-energy RIXS SXR at normal incidence (bulk measurements) BL 13 SSRL, grazing incidence (allows surface chemistry experiments) To observe surface reactions using RIXS at LCLS SXR, need modifications to monochromator or new BL at LCLS-II 13

Acknowledgements 14 My mentor, Dennis Nordlund SLAC and the DOE for supporting the SULI program The staff at SLAC which make this program possible My fellow interns!