SWIRE-SDSS FIR LLFs  Well-Matched SWIRE MIPS 24/70/160 micron & SDSS Optical Coverage  Particularly so at low (0<Z<0.25) redshifts  Three Fields : Lockman Hole, ELAIS N1, ELAIS N2 ~ 22.6 deg 2  Total Number of SWIRE-SDSS Sources –24 micron > 0.5 mJy : 7,289 ( 0<Z<0.25 ) Sources –70 micron > 15 mJy : 2,593 ( 0<Z<0.25 ) Sources –160 micron > 75 mJy : 1,145 at ( 0<Z<0.25 ) Sources  Good Spec-Z Coverage from SDSS  SDSS Phot-Z also available based on Neural Networks  Further Miscellaneous Redshifts from NED  Overall Spec-Z % is ~25/35/55% at 24/70/160 micron and 0<Z<0.25

24 micron Rodighiero+ (sub) (Spitzer GOODS/VVDS) Marleau+ 07 (Spitzer FLS) Shupe+ 98 (IRAS) SWIRE-SDSS Imperial/IRAS FSC z-cat

70 micron Saunders+ ’90 (IRAS) Takeuchi+ 03 (IRAS) SWIRE-SDSS Imperial/IRAS FSC z-cat

160 micron Takeuchi+ 06 (ISO) SWIRE-SDSS

 The homogeneity, quality, well-characterized limits as well as the sheer size of the SWIRE-SDSS database allow a relatively straighforward estimate of the FIR Local Luminosity Function down to flux levels order(s) of magnitude fainter than IRAS (albeit over a smaller area)  Ample opportunity to extend such a study –Higher redshift ( 0.25 < Z < 0.5 ) –New spectroscopic observations of complete samples –Herschel observations of same fields at µm SWIRE-SDSS FIR LLF

SWIRE-SDSS Workflow  Download Input Catalogs : SDSS (Pub), IRSA (Pub), IRSA (SWIRE), SSC (Pub), WSA (ESO),, NED (Pub)  Source Identification : based on position and flux matching, e.g. Nearest-Neighbor or Likelihood Ratio  Quality Control : based on several SWIRE & SDSS flags  Source Characterization : Star/Galaxy  Phot-z calculation following an optimized procedure (TBD skipped so far in favor of SDSS & NED phot-z)  Completeness & Reliability Analysis of all previous steps  Finally : Ad Hoc Science Analysis (e.g. 1/V max )