Why is AFM challenging? 1.Jump to contact: k>max(-   V TS /  z  (static) kA>max(-F TS  oscillating mode)  ideal amplitude is A~ ] 2. Non-monotonic.

Slides:



Advertisements
Similar presentations
Beyond The Standard Quantum Limit B. W. Barr Institute for Gravitational Research University of Glasgow.
Advertisements

AFM Basics Xinyong Chen.
AFM Basics Xinyong Chen.
Qfext07 Leipzig 17 Sep Casimir force measurements with quartz tuning fork and AFM Dr. Thorsten Ludwig Binnotec e.V. Bouchéstr. 12, Haus Berlin.
Yongho Seo Center for Near-field Atom-photon technology, Seoul Nation University, Rep. of Korea & Department of Physics, University of Virginia Kyungho.
Gravitational Wave Astronomy Dr. Giles Hammond Institute for Gravitational Research SUPA, University of Glasgow Universität Jena, August 2010.
SCANNING PROBE MICROSCOPY By AJHARANI HANSDAH SR NO
Lecture 10. AFM.
Koji Arai – LIGO Laboratory / Caltech LIGO-G v2.
Measuring Fluid Properties on a Microscopic Scale Using Optically Trapped Microprobes Mark Cronin-Golomb Biomedical Engineering Tufts University.
Nanoscale Imaging of Buried Structures via Scanning Near-Field Ultrasound Holography G. S. Shekhawat and V. P. Dravid, Science, 310, 89(2005). Journal.
Nanomechanical Detection of Living Cell Surface April 10, 2006 Joseph Abel USU Dept of Physics Living SH-SY5Y Neuroblastoma Cell
Imaging of flexural and torsional resonance modes of atomic force microscopy cantilevers using optical interferometry Michael Reinstaedtler, Ute Rabe,
Atomic Force Microscopy: characterization of surface topography Andrius Martinavičius.
Atomic force microscopy Jiří Boldyš. Outline Motivation Minisurvey of scanning probe microscopies Imaging principles Ideas about application of moment.
P. Grutter, McGill University An Introduction to Atomic Force Microscopy Peter Grutter Physics Department
History and Applications of Atomic Force Microscopy Gregory James PhD Candidate Department of Chemical Engineering 1.
Get to the point!. AFM - atomic force microscopy A 'new' view of structure (1986) AlGaN/GaN quantum well waveguide CD stamper polymer growth surface atoms.
Atomic Force Microscopy
Introduction to Nanomechanics (Spring 2012) Martino Poggio.
Scanning Probe Microscopy (SPM) Real-Space Surface Microscopic Methods.
TeV Particle Astrophysics August 2006 Caltech Australian National University Universitat Hannover/AEI LIGO Scientific Collaboration MIT Corbitt, Goda,
Generation of squeezed states using radiation pressure effects David Ottaway – for Nergis Mavalvala Australia-Italy Workshop October 2005.
Slide # 1 SPM Probe tips CNT attached to a Si probe tip.
Methods and Tehniques in Surface Science
Microcantilevers III Cantilever based sensors: 1 The cantilever based sensors can be classified into three groups (i)General detection of any short range.
TAPPINGMODE™ IMAGING APPLICATIONS AND TECHNOLOGY
UIC Atomic Force Microscopy (AFM) Stephen Fahey Ph.D. Advisor: Professor Sivananthan October 16, 2009.
Tuning Fork Scanning Probe Microscopy Mesoscopic Group Meeting November 29, 2007.
Single spin detection Maksym Sladkov Top master nanoscience symposium June 23, 2005.
Creative Research Initiatives Seoul National University Center for Near-field Atom-Photon Technology - Near Field Scanning Optical Microscopy - Electrostatic.
Creative Research Initiatives Seoul National University Center for Near-field Atom-Photon Technology Yongho Seo Wonho Jhe School of Physics and Center.
AFM. The cantilever holder The cantilever dimensions Tip position.
Tutorial 4 Derek Wright Wednesday, February 9 th, 2005.
Scanning Probe Microscopy – the Nanoscience Tool NanoScience & NanoTechnology Tools that operate in real space with Ångstrom to nanometer spatial resolution,
Common scanning probe modes
Scanning Probe Microscopy Colin Folta Matt Hense ME381R 11/30/04.
Koji Arai – LIGO Laboratory / Caltech LIGO-G v2.
Atomic Force Microscopy (AFM)
Quantum noise observation and control A. HeidmannM. PinardJ.-M. Courty P.-F. CohadonT. Briant O. Arcizet T. CaniardJ. Le Bars Laboratoire Kastler Brossel,
Tuning Fork Scanning Probe Microscopy Mesoscopic Group Meeting November 29, 2007.
Electric Force Microscopy (EFM)
Fachgebiet 3D-Nanostrukturierung, Institut für Physik Contact: Office:
Opto-mechanics with a 50 ng membrane Henning Kaufer, A. Sawadsky, R. Moghadas Nia, D.Friedrich, T. Westphal, K. Yamamoto and R. Schnabel GWADW 2012,
Thermal Noise in Thin Silicon Structures
SQL Related Experiments at the ANU Conor Mow-Lowry, G de Vine, K MacKenzie, B Sheard, Dr D Shaddock, Dr B Buchler, Dr M Gray, Dr PK Lam, Prof. David McClelland.
EEM. Nanotechnology and Nanoelectronics
PONDEROMOTIVE ROTATOR: REQUIREMENTS Zach Korth (Caltech) – GWADW ‘12 – Waikoloa, HI.
P. Grutter, McGill University BIMR Wokshop, May 15th, 2002 An Introduction to Atomic Force Microscopy Peter Grutter Physics Department
1/16 Nawrodt, Genoa 09/2009 An overview on ET-WP2 activities in Glasgow R. Nawrodt, A. Cumming, W. Cunningham, J. Hough, I. Martin, S. Reid, S. Rowan ET-WP2.
SPM Users Basic Training August 2010 Lecture VIII – AC Imaging Modes: ACAFM and MAC Imaging methods using oscillating cantilevers.
ET-ILIAS_GWA joint meeting, Nov Henning Rehbein Detuned signal-recycling interferometer unstableresonance worsesensitivity enhancedsensitivity.
Get to the point!.
Metallurgha.ir1. Lecture 5 Advanced Topics II Signal, Noise and Bandwidth. Fundamental Limitations of force measurement metallurgha.ir2.
Get to the point!.
An Introduction to Atomic Force Microscopy
Interferometer configurations for Gravitational Wave Detectors
Overview of quantum noise suppression techniques
Generation of squeezed states using radiation pressure effects
Characterization of CNT using Electrostatic Force Microscopy
7x7 surface have been removed and deposited.
A brief overview of ImAFM with some applications
Quantum effects in Gravitational-wave Interferometers
Advanced LIGO Quantum noise everywhere
Mapping vibrational modes of Si3N4 membrane - Ultrasonic Force Microscopies vs Laser Doppler Vibrometry The development of new micro and nano-electromechanical.
NANO 230 Micro/Nano characterization
A. Heidmann M. Pinard J.-M. Courty P.-F. Cohadon
Advanced Optical Sensing
Mechanics of Nanowires
Magnetic force resonance microscopy
Presentation transcript:

Why is AFM challenging? 1.Jump to contact: k>max(-   V TS /  z  (static) kA>max(-F TS  oscillating mode)  ideal amplitude is A~ ] 2. Non-monotonic imaging signal 3. Long-range vs. short range forces [F(z)] 4. Noise in the deflection sensor ( particularly 1/f noise ) 5. FM AFM helps in all cases except 2!

Thermal limits Energy in damped driven harmonic oscillator = k B T This allows one to determine the thermal limit of force gradient sensing in AFM: {z osc = F’ z o Q/k Is the signal near resonance}

How does one measure a high Q system?

Challenge of measuring high Q system Albrecht, Grutter, Horne Rugar J. Appl. Phys. 69, 668 (1994)

Better sensitivity with high Q cantilevers Q=115 slope detection Q=65,000 FM detection Q=65,000 slope detection Albrecht, Grutter, Horne Rugar J. Appl. Phys. 69, 668 (1994)

P. Grutter, McGill University AC techniques Change in resonance curve can be detected by: Lock-in (A or  ) * FM detection (  f and A drive ) Albrecht, Grutter, Horne and Rugar J. Appl. Phys. 69, 668 (1991) (*) used in Tapping™ mode ff AA f 1 f 2 f 3

P. Grutter, McGill University Some words on Tapping™ Amount of energy dissipated into sample and tip strongly depends on operation conditions. Challenging to determine magnitude or sign of force. NOT necessarily less power dissipation than repulsive contact AFM. Anczykowski et al., Appl. Phys. A 66, S885 (1998 )

P. Grutter, McGill University Ultimate limits of force sensitivity 1. Brownian motion of cantilever! thermal limits Martin, Williams, Wickramasinghe JAP 61, 4723 (1987) Albrecht, Grutter, Horne, and Rugar JAP 69, 668 (1991) D. Sarid ‘Scanning Force Microscopy’ Roseman & Grutter, RSI 71, 3782 (2000) A 2 = k B T/k A…rms amplitude T=4.5K 2. Other limits: - sensor shot noise - sensor back action - Heisenberg D.P.E. Smith RSI 66, 3191 (1995) Bottom line: Under ambient conditions energy resolution ~ J << J/molecule

Other limitations? - sensor shot noise - sensor back action - Heisenberg D.P.E. Smith, Rev. Sci. Instr. 66, 3191 (1995)

Sensor Shot Noise Effectively, the fluctuations in laser pressure (due to photon statistics) give rise in a fluctuation in the mean position of the cantilever. P…laser power,  f…bandwidth … wavelength h…Planck’s constant c…speed of light  …i nterferometer phase NB: can be used to ‘cool’ high finesse cavities!

Sensor Back Action P…laser power,  f…bandwidth … wavelength h…Planck’s constant c…speed of light Optical pressure Off resonance On resonance

Optimization Minimize: and obtain optimized laser power (for off resonance set Q=1):

Heisenberg Minimal detectable energy withMinimal bandwidth Quantum limit

So what?

How about detecting a single spin? Idea: combine MFM and resonant excitation of the cantilever by combining ultimate AFM techniques and NMR.

MRFM D. Rugar, R. Budakian, H. J. Mamin & B. W. Chui, Nature 430, 329 (2004)

Magnetic Resonance Force Microscopy (MRFM)

Another cool thing: thermodynamic squeezed state D. Rugar and P. Grutter, Phys. Rev. Lett. 67, 699 (1993)

Course Evaluations!