IEEE Nuclear Science Symposium and Medical Imaging Conference Short Course The Geant4 Simulation Toolkit Sunanda Banerjee (Saha Inst. Nucl. Phys., Kolkata,

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IEEE Nuclear Science Symposium and Medical Imaging Conference Short Course The Geant4 Simulation Toolkit Sunanda Banerjee (Saha Inst. Nucl. Phys., Kolkata, India) Min Cheol Han (Hanyang Univ., Seoul, Korea) Steffen Hauf (XFEL, Hamburg, Germany) Maria Grazia Pia (INFN Genova, Italy) Seoul, 27 October This course encompasses training material developed by several Geant4 members: thanks to all of them!

Preliminary slides The printed handouts are a preliminary version of the course slides in response to the conference organizers’ request to deliver slides for printing more than one month before the course The actual slides of the course will be available at the course web site one week before the course Colour-coded information contained in UML diagrams is available online only in PDF files We support environmentally-conscious attitudes

Event biasing Basic concepts of simulation with Geant4 a s a general purpose Monte Carlo toolkit

Event biasing What is analogue simulation ?  Sample using natural probability distribution, N(x)  Predicts mean with correct fluctuations  Can be inefficient for certain applications What is non-analogue/event biased simulation ?  Cheat - apply artificial biasing probability distribution, B(x) in place of natural one, N(x)  B(x) enhances production of whatever it is that is interesting  To get meaningful results, must apply a weight correction  Predicts same analogue mean with smaller variance  Increases efficiency of the Monte Carlo  Does not predict correct fluctuations  Should be used with care

Event biasing Geant4 provides built-in general use biasing techniques The effect consists in producing a small number of secondaries, which are artificially recognized as a huge number of particles by their statistical weights  reduce CPU time Event biasing can be used, for instance, for the transportation of particles through a thick shielding An utility class G4WrapperProcess support user- defined biasing

Event biasing techniques Production cuts / threshold  This is a biasing technique – most popular for many applications: set high cuts to reduce secondary production Geometry based biasing  Importance weighting for volume/region  Duplication or sudden death of tracks Primary event biasing  Biasing primary events and/or primary particles in terms of type of event, momentum distribution  generate only primaries that can produce events that are interesting for you

Event biasing techniques Forced interaction  Force a particular interaction, e.g. within a volume Enhanced process or channel and physics-based biasing  Increasing cross section for a given process (e.g. Bremsstrahlung)  Biasing secondary production in terms of particle type, momentum distribution, cross-section, etc. Leading particle biasing  Take into account only the most energetic (or most important) secondary  Currently NOT supported in Geant4

Variance Reduction Use variance reduction techniques to reduce computing time taken to calculate a result with a given variance (= statistic error) Want to increase efficiency of the Monte Carlo s = variance on calculated quantity T = computing time

Geometric Biasing * Importance sampling technique * Weight window technique The purpose of geometry-based event biasing is to save computing time by sampling less often the particle histories entering “less important” geometry regions, and more often in more “important” regions

Importance sampling technique Importance sampling acts on particles crossing boundaries between “importance cells” The action taken depends on the importance value (I) assigned to the cell In general, a track is played either split or Russian roulette at the geometrical boundary depending on the importance value assigned to the cell I=1I=2 X W=1 W=0.5 W=1 P = 0.5 P = 2 less important more important

Importance biasing Importance biasing Analogue simulation 10 MeV neutron in thick concrete cylinder Importance biasing increasing importance

Physics biasing Built-in cross section biasing for PhotoInelastic, ElectronNuclear and PositronNuclear processes G4ElectroNuclearReaction * theeReaction = new G4ElectroNuclearReaction; G4ElectronNuclearProcess theElectronNuclearProcess; theElectronNuclearProcess.RegisterMe(theeReaction); theElectronNuclearProcess.BiasCrossSectionByFactor(100); Similar tool for rare EM processes (e + e - annihilation to  pair or hadrons,  conversion to  +  - ) G4AnnihiToMuPair* theProcess = new G4AnnihiToMuPair(); theProcess->SetCrossSecFactor(100); It is possible to introduce these factors for all EM processes, with a definition of customized processes that inherit from the “normal” ones (  extended example) Artificially enhance/reduce cross section of a process (useful for thin layer interactions or thick layer shielding) General implementation under development