FNAL beam test G4 simulation update Aiwu Zhang 2015-02-02.

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Presentation transcript:

FNAL beam test G4 simulation update Aiwu Zhang

Topic 1: Check smearing on trackers Ex_expIn_expGM_exp Ex_G4In_G4GM_G4 Corrected resolution 32GeV/c pion case REF1X REF1Y REF2X REF2Y REF3X REF3Y REF4X REF4Y

Residuals on trackers in X coordinates REF1 exclusive REF1 inclusive REF2 exclusive REF2 inclusive Geo. Mean 84um Geo. Mean 80um 3

Residuals on trackers in X coordinates REF3 exclusive REF3 inclusive REF4 exclusive REF4 inclusive Geo. Mean 76um Geo. Mean 79um 4

Geant4 residual width exp. Data Smear inputExerrInerrGMerr ExerrInerrGMerr REF1X REF1Y REF2X REF2Y REF3X REF3Y REF4X REF4Y Tracker resolutions In G4, after hit position smearing, we get very similar resolutions compare to the exp. Data. The table is for 32GeV/c beam. Same conclusion for the 120GeV/c beam. 5

Topic 2: Study Geant4 resolution for the FITEIC chamber in polar coordinate (W/O smearing) FIT_EIC_Phi Exclusive FIT_EIC_Phi Inclusive Offset(mm) Phi resolutions, unit in uradR resolutions, unit in um XYPhi_ExerrPhi_InerrGM_PhierrR_ExerrR_InerrGM_Rerr test test test

Geant4 Phi-resolution for the FITEIC (With smearing only trackers) FIT_EIC_Phi Exclusive FIT_EIC_Phi Inclusive Offset(mm) Phi resolutions, unit in uradR resolutions, unit in um XYPhi_ExerrPhi_InerrGM_PhierrR_ExerrR_InerrGM_Rerr test test Test

Geant4 Phi-resolution for the FITEIC (With smearing trackers as well as the FITEIC chamber) FIT_EIC_Phi Exclusive FIT_EIC_Phi Inclusive Offset(mm) Phi resolutions, unit in uradR resolutions, unit in um XYPhi_ExerrPhi_InerrGM_PhierrR_ExerrR_InerrGM_Rerr test test Test Smear FITEIC chamber with 166urad in phi ( and 70um in R). 2.The resolution comes out to be 154urad, which explains that Geometric mean method gives ~10% over estimation on the resolution when tested detector has worse resolution than trackers. 8

Another test on geometric mean method 1.Smear FITEIC chamber with 166um in X and Y. 2.The G4 simulation then gives resolutions of ~160um in X and Y, which is 9% better. 3.This supports that Geometric mean method gives ~10% over estimation on the resolution when tested detector has a much worse resolution than trackers. 9 Topic 3: looking resolutions in a wider range Remaining slides:

Unit:um ER (EE)IRGMERIRGM Sqrt(ER^2- EE^2) smear amount exp. Data (GM) Case 1not smear REF1smear REF1 REF1X REF1Y Case 2not smear REF2smear REF2 REF2X REF2Y Case 3not smear REF3smear REF3 REF3X REF3Y Case 4not smear REF4smear REF4 REF4X REF4Y Case 5 smearing trackers but not smearing FITEIC smearing trackers & FITEIC FITEICX FITEICY

The trackers are smeared by the amount shown in smear amount column of the previous table. Smearing the FITEIC chamber from 50 to 290 um with a 10um step, plot the output resolution vs. input resolution (the smeared amount on FITEIC) for both geometric mean method and error estimation method. Clearly we see (1) error estimation method gives accurate resolutions; (2) geometric mean method underestimates (overestimates) when real resolution is less than 120um (larger than 170um). 11

For checking, here all trackers are smeared with a 50 um resolution. The conclusion remains more or less the same. I think these two plots also explain the reason we observe different resolutions on trackers since the geometric mean method gives worse resolutions at <100um level. 12

Study in phi coordinate Smear trackers with numbers from exp. dataSmear trackers with a 50um resolution 13