Chapter 24 Wave Optics. The particle nature of light was the basis for ray (geometric) optics The wave nature of light is needed to explain various phenomena.

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Presentation transcript:

Chapter 24 Wave Optics

The particle nature of light was the basis for ray (geometric) optics The wave nature of light is needed to explain various phenomena such as interference, diffraction, polarization, etc.

Interference

Light waves interfere with each other much like mechanical waves do All interference associated with light waves arises when the electromagnetic fields that constitute the individual waves combine For sustained interference between two sources of light to be observed, there are two conditions which must be met: 1) The sources must be coherent, i.e. they must maintain a constant phase with respect to each other 2) The waves must have identical wavelengths

Producing Coherent Sources Old method: light from a monochromatic source is allowed to pass through a narrow slit The light from the single slit is allowed to fall on a screen containing two narrow slits; the first slit is needed to insure the light comes from a tiny region of the source which is coherent Currently, it is much more common to use a laser as a coherent source The laser produces an intense, coherent, monochromatic beam, which can be used to illuminate multiple slits directly

Young’s Double Slit Experiment Light is incident on a screen with a narrow slit, S o The light waves emerging from this slit arrive at a second screen that contains two narrow, parallel slits, S 1 and S 2 The narrow slits, S 1 and S 2 act as sources of waves The waves emerging from the slits originate from the same wave front and therefore are always in phase Thomas Young (1773 – 1829)

Young’s Double Slit Experiment The light from the two slits form a visible pattern on a screen, which consists of a series of bright and dark parallel bands called fringes Constructive interference occurs where a bright fringe appears Destructive interference results in a dark fringe Thomas Young (1773 – 1829)

Interference Patterns Constructive interference occurs at the center point The two waves travel the same distance, therefore they arrive in phase The upper wave has to travel farther than the lower wave The upper wave travels one wavelength farther Therefore, the waves arrive in phase and a bright fringe occurs

Interference Patterns The upper wave travels one-half of a wavelength farther than the lower wave The trough of the bottom wave overlaps the crest of the upper wave A dark fringe occurs This is destructive interference

Interference Equations The path difference, δ, is found from the tan triangle: δ = r 2 – r 1 = d sin θ This assumes the paths are parallel Although they are not exactly parallel, but this is a very good approximation since L is much greater than d

Interference Equations For a bright fringe, produced by constructive interference, the path difference must be either zero or some integral multiple of the wavelength: δ = d sin θ bright = m λ; m = 0, ±1, ±2, … m is called the order number When m = 0, it is the zeroth order maximum and when m = ±1, it is called the first order maximum, etc. Within the assumptions L >> d (θ is small) and d >> λ, the positions of the fringes can be measured vertically from the zeroth order maximum y = L tan θ  L sin θ ; sin θ  y / L

Interference Equations When destructive interference occurs, a dark fringe is observed This needs a path difference of an odd half wavelength δ = d sin θ dark = (m + ½) λ; m = 0, ±1, ±2, … Thus, for bright fringes And for dark fringes

Uses for Young’s Double Slit Experiment Young’s Double Slit Experiment provides a method for measuring wavelength of the light This experiment gave the wave model of light a great deal of credibility It is inconceivable that particles of light could cancel each other

Chapter 24 Problem 8 If the distance between two slits is mm and the distance to a screen is 2.50 m, find the spacing between the first- and second-order bright fringes for yellow light of 600-nm wavelength.

Phase Changes Due To Reflection An electromagnetic wave undergoes a phase change of 180° upon reflection from a medium of higher index of refraction than the one in which it was traveling (similar to a reflected pulse on a string

Phase Changes Due To Reflection There is no phase change when the wave is reflected from a boundary leading to a medium of lower index of refraction (similar to a pulse in a string reflecting from a free support)

Interference in Thin Films

Interference effects are commonly observed in thin films (e.g., soap bubbles, oil on water, etc.) The interference is due to the interaction of the waves reflected from both surfaces of the film Recall: the wavelength of light λ n in a medium with index of refraction n is λ n = λ / n where λ is the wavelength of light in vacuum

Interference in Thin Films Recall: an electromagnetic wave traveling from a medium of index of refraction n 1 toward a medium of index of refraction n 2 undergoes a 180° phase change on reflection when n 2 > n 1 and there is no phase change in the reflected wave if n 2 < n 1 Ray 1 undergoes a phase change of 180° with respect to the incident ray

Interference in Thin Films Ray 2, which is reflected from the lower surface, undergoes no phase change with respect to the incident wave Ray 2 also travels an additional distance of 2t before the waves recombine For constructive interference, taking into account the 180° phase change and the difference in optical path length for the two rays: 2 n t = (m + ½) λ; m = 0, 1, 2 …

Interference in Thin Films Ray 2, which is reflected from the lower surface, undergoes no phase change with respect to the incident wave Ray 2 also travels an additional distance of 2t before the waves recombine For destructive interference 2 n t = m λ; m = 0, 1, 2 …

Interference in Thin Films Two factors influence thin film interference: possible phase reversals on reflection and differences in travel distance The conditions are valid if the medium above the top surface is the same as the medium below the bottom surface If the thin film is between two different media, one of lower index than the film and one of higher index, the conditions for constructive and destructive interference are reversed

Interference in Thin Films, Example An example of different indices of refraction: silicon oxide thin film on silicon wafer There are two phase changes

Newton’s Rings Another method for viewing interference is to place a planoconvex lens on top of a flat glass surface The air film between the glass surfaces varies in thickness from zero at the point of contact to some thickness t A pattern of light and dark rings – Newton’s Rings – is observed Newton’s Rings can be used to test optical lenses

Problem Solving for Thin Films Identify the thin film causing the interference Determine the indices of refraction in the film and the media on either side of it Determine the number of phase reversals: zero, one or two The interference is constructive if the path difference is an integral multiple of λ and destructive if the path difference is an odd half multiple of λ The conditions are reversed if one of the waves undergoes a phase change on reflection

Problem Solving for Thin Films Equation1 phase reversal 0 or 2 phase reversals 2 n t = (m + ½) constructivedestructive 2 n t = m destructiveconstructive

Chapter 24 Problem 23 An air wedge is formed between two glass plates separated at one edge by a very fine wire, as in the figure. When the wedge is illuminated from above by 600-nm light, 30 dark fringes are observed. Calculate the radius of the wire.

Diffraction Huygen’s principle requires that the waves spread out after they pass through slits This spreading out of light from its initial line of travel is called diffraction In general, diffraction occurs when waves pass through small openings, around obstacles or by sharp edges

Diffraction A single slit placed between a distant light source and a screen produces a diffraction pattern It has a broad, intense central band The central band is flanked by a series of narrower, less intense secondary bands called secondary maxima The central band will also be flanked by a series of dark bands called minima This result cannot be explained by geometric optics

Fraunhofer Diffraction Fraunhofer Diffraction occurs when the rays leave the diffracting object in parallel directions The screen is very far from the slit and the lens is converging A bright fringe is seen along the axis (θ = 0) with alternating bright and dark fringes on each side Joseph von Fraunhofer 1787 –1826

Single Slit Diffraction According to Huygen’s principle, each portion of the slit acts as a source of waves The light from one portion of the slit can interfere with light from another portion The resultant intensity on the screen depends on the direction θ All the waves that originate at the slit are in phase

Single Slit Diffraction Wave 1 travels farther than wave 3 by an amount equal to the path difference (a / 2) sin θ If this path difference is exactly half of a wavelength, the two waves cancel each other and destructive interference results In general, destructive interference occurs for a single slit of width a when sin θ dark = mλ / a; m =  1,  2, …

Single Slit Diffraction The general features of the intensity distribution are shown A broad central bright fringe is flanked by much weaker bright fringes alternating with dark fringes The points of constructive interference lie approximately halfway between the dark fringes

Chapter 24 Problem 34 A screen is placed 50.0 cm from a single slit, which is illuminated with light of wavelength 680 nm. If the distance between the first and third minima in the diffraction pattern is 3.00 mm, what is the width of the slit?

Diffraction Grating The diffracting grating consists of many equally spaced parallel slits A typical grating contains several thousand lines per centimeter The intensity of the pattern on the screen is the result of the combined effects of interference and diffraction

Diffraction Grating The condition for maxima is d sin θ bright = m λ; m = 0, 1, 2, … The integer m is the order number of the diffraction pattern The zeroth order maximum corresponds to m = 0 The first order maximum corresponds to m = 1

Diffraction Grating Note the sharpness of the principle maxima and the broad range of the dark area in contrast to the broad, bright fringes characteristic of the two-slit interference pattern If the incident radiation contains several wavelengths, each wavelength deviates through a specific angle

Polarization of Light An unpolarized wave: each atom produces a wave with its own orientation of E, so all directions of the electric field vector are equally possible and lie in a plane perpendicular to the direction of propagation A wave is said to be linearly polarized if the resultant electric field vibrates in the same direction at all times at a particular point Polarization can be obtained from an unpolarized beam by selective absorption, reflection, or scattering

Polarization by Selective Absorption The most common technique for polarizing light Uses a material that transmits waves whose electric field vectors in the plane are parallel to a certain direction and absorbs waves whose electric field vectors are perpendicular to that direction

Polarization by Selective Absorption The intensity of the polarized beam transmitted through the second polarizing sheet (the analyzer) varies as I = I o cos 2 θ, where I o is the intensity of the polarized wave incident on the analyzer This is known as Malus’ Law and applies to any two polarizing materials whose transmission axes are at an angle of θ to each other Étienne-Louis Malus 1775 – 1812

Polarization by Reflection When an unpolarized light beam is reflected from a surface, the reflected light can be completely polarized, partially polarized, or unpolarized It depends on the angle of incidence If the angle is 0° or 90°, the reflected beam is unpolarized For angles between this, there is some degree of polarization For one particular angle, the beam is completely polarized

Polarization by Reflection The angle of incidence for which the reflected beam is completely polarized is called the polarizing (or Brewster’s) angle, θ p Brewster’s Law relates the polarizing angle to the index of refraction for the material Sir David Brewster 1781 – 1868

Polarization by Scattering When light is incident on a system of particles, the electrons in the medium can scatter – absorb and reradiate – part of the light (e.g., sunlight reaching an observer on the earth becomes polarized) The horizontal part of the electric field vector in the incident wave causes the charges to vibrate horizontally The vertical part of the vector simultaneously causes them to vibrate vertically Horizontally and vertically polarized waves are emitted

Chapter 24 Problem 54 Light of intensity I 0 and polarized parallel to the transmission axis of a polarizer, is incident on an analyzer. (a) If the transmission axis of the analyzer makes an angle of 45° with the axis of the polarizer, what is the intensity of the transmitted light? (b) What should the angle between the transmission axes be to make I/I 0 = 1/3?

Optical Activity Certain materials display the property of optical activity A substance is optically active if it rotates the plane of polarization of transmitted light Optical activity occurs in a material because of an asymmetry in the shape of its constituent materials

Answers to Even Numbered Problems Chapter 24: Problem m

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Answers to Even Numbered Problems Chapter 24: Problem nm

Answers to Even Numbered Problems Chapter 24: Problem nm

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