The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories Dr. Richard Young Optronic Laboratories, Inc.

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Presentation transcript:

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories Dr. Richard Young Optronic Laboratories, Inc.

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories Thanks to the excellent quality of modern scanning instruments, NVIS compatibility measurements have become almost routine. What improvements could instrument manufacturers make…

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories Better sensitivity, so low luminance small spot sizes can be measured as easily as high luminance large spot sizes. Less variation in results Faster scans Greater portability and ruggedness Lower cost A wish-list for improvements…

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories Much of the variability is due to the longer wavelengths Scanning systems have plenty of sensitivity

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories There is no dramatic change in longer wavelength sensitivity The OL 770-NVS detector is based on silicon, and hence has a different shape,

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories When all the light is “seen” all the time: –Noise is decreased. –Sensitivity is increased. –Measurements can be faster. The multiplex advantage means that an instrument simultaneously measuring a signal over a range of frequencies obtains a t 1/2 advantage in the time t required to obtain a given signal-to-noise ratio compared to that which would be necessary using dispersive methods if the noise is detector-limited.

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories The OL 770-NVS is a special type of spectroradiometer, many decades better than other multi-channel devices. –Far higher sensitivity –Much lower noise –Orders of magnitude lower stray light –Vastly improved electronics –Dedicated software –State-of-the-art technology

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories A.3.3. Wavelength accuracy & repeatability –Accuracy typical <0.5 nm, spec. 1 nm –Repeatability typical <0.01 nm, spec. 0.5 nm A.3.4. Current Resolution –16 bit, spec. 12 bit. A.3.5. Zero Drift –Typical <0.01%, spec. 0.2%

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories A.3.6. Linearity –In scale <0.5%, spec. 1% –Between scales <0.1%, spec. 2% A.3.7. Signal Conditioning –Required controls for improving s/n provided A.3.8. Stray light –Passes easily

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories A.3.9. Spectroradiometer Optics –Full scale at <0.1 fL, spec. 1 fL (at 0.007” spot size) A Spectroradiometer Viewing System –Exact, spec. <5% of spot diameter A Spectroradiometer Accuracy –Typically < 1%, spec. 5% –Typically u’v’ <0.0003, spec

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories Since there are no moving parts –the construction is rugged and compact –results are highly repeatable –time taken in moving the monochromator, changing filters etc. is avoided

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories Since there is no photomultiplier –A very expensive component is avoided –The detector is not damaged by strong light –High voltages are not required Since all the wavelengths are measured at the same time –It doesn’t matter if the source is d.c., a.c., modulated or flashed

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories Green B NVIS Red NVIS Yellow

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories For <1 second scan For 1-2 minute scan

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories For 2 minute scan For 1-2 minute scan For <1 second scan

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories All systems gave extremely good repeatability in NRa, NRb and chromaticity. All systems gave the same results with very low uncertainties. All systems showed that NRa and NRb were essentially constant across a wide luminance range for each display. All systems showed chromaticity was essentially constant with luminance for each display.

The Future of NVIS Display Measurement ALI Advanced Seminar, 2006Optronic Laboratories Developments over the past year have made it possible to design a new type of system for NVIS display measurements. This new type of system represents a quantum leap in performance and value. All the wish-list items are fulfilled.