Electrical Transport Studies of Electro Optically Active Semiconductors Master’s Thesis Proposal Committee Members Dr.Terry Golding Dr. Roman Stemprok.

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Presentation transcript:

Electrical Transport Studies of Electro Optically Active Semiconductors Master’s Thesis Proposal Committee Members Dr.Terry Golding Dr. Roman Stemprok Dr. Mitty Plummer Presented By Srikala Kambhampati

Overview Motivation Background Work to be performed Sample Preparation Anticipated Results Anticipated Timeline Summary

Motivation Silicides ( β-FeSi 2 ) Urgent requirement for an optical emitter that is compatible with standard silicon based ultra large scale integration(ULSI) technology. III-V Semiconducting materials Engineering of existing III-V semiconductors such as GaAsSb.

Background Direct bandgap semiconductors are efficient for optical emission properties. Direct Bandgap transition Indirect Bandgap transition

Background Silicon Bulk silicon has an indirect energy bandgap and is therefore highly inefficient as light source. GaAs GaAs has a direct band gap.

Band Structure Silicon Band structure GaAs Band structure

Why β-Fesi 2 ? It exhibits quasi direct bandgap around 0.8eV corresponding to 1.5μm wavelength.

β-Fesi 2 band structure

Light emission has been observed only in strained films of β-Fesi 2.An alternative to strain is band structure modification by alloying. β-Fesi 2

Crystal Structure of GaAsSb

Ordering in III-V Semiconductor alloys

Reduction in the Band Gap

Characterization techniques Electrical Magneto transport technique. Optical Transmission measurements like absorption coefficient and photoluminescence. Electro-Optical Photocurrent measurements.

Magneto Transport Technique Hall Effect Hall effect sign conventions for p-type sample Hall effect sign conventions for n-type sample

Hall Effect Hall Coefficient R H : R H =V H t/(BI) Conductivity: σ = I l/(VA ) Mobility: µ=σ R H

Work To Be Performed Studying the electrical characteristics of β-Fesi 2 as a function of different dosages and implantation energies of ions. Sample No.substrate Concentration Thickness (opt) Thickness (RBS) 344n-Si(100)-251nm250nm 324n-Si(111)X Cr =0.01 (EDX) 268 nm- 358n-Si(100)X Cr =0.003 (EDX) -250nm 367p-Si(100)X Co =0.009 (RBS) 282nm264nm 352p-Si(100)X Co =0.066 (RBS) 290 nm266 nm 353p-Si(100)X Co =0.14 (RBS) 307 nm273 nm

Work To Be Performed Examining the anisotropic properties of GaAsSb as a function of the degree of ordering. Sample NoSubstrate orientation% Sb from XRD IC 479(001)66.9 IC 480(001) 8˚ towards (111)A65

Sample Preparation Silicides Molecular Beam Epitaxy by W.Henrion, Hahn-Meitner- Institut Berlin GmbH, Berlin, Federal Republic of Germany, A.G.Birdwell, University of Texas at Dallas, Texas, U.S.A, V.N.Antonov, Institute of Metal Physics National Academy of Sciences of Ukraine, Ukraine, Jepsen, Max-Planck-Institutf ur Festko rperforschung, Federal Republic of Germany. GaAsSb Molecular Beam Epitaxy at National Renewable Energy Laboratory by A.G.Norman.

Equipment Available Electrical characterization High Field Cryostat. Sample Holder Sample with contacts

Magnets used for Magneto Transport Characteristics Equipment Available

Anticipated Results The electrical characteristics of β-Fesi 2 material will be studied for various dosages of ions and implantation energies. GaAsSb The Electrical anisotropic characteristics of the samples will be studied for the different degrees of ordering β-Fesi 2

Anticipated Timeline Activity Timeline in Months Review of Literature Sample Preparation Experimentati -on and Analysis of Results Documentation and write-Up

Summary The proposed study of the semi conducting β-Fesi 2 and the anisotropic properties of GaAsSb are presented. The study of the opto electronic properties of these materials may be potentially useful in novel device applications.