From Ink-Jet Technology to Nano Array Writing Technology By Szu-kang Hsien Ayodeji Coker.

Slides:



Advertisements
Similar presentations
Scanning Probe Microscopy
Advertisements

Scanned-proximity Probe Microscopy (SPM) Background Emphasis on Atomic Force Microscopy (AFM) Reading SPM Features AFM Specifics AFM Operation (Conceptual)
An Introduction to Electrostatic Actuator
SCANNING PROBE MICROSCOPY By AJHARANI HANSDAH SR NO
Nanofabrication Breakout Session Results. Vision Elements Ability to fabricate, by directed or self assembly methods, functional structures or devices.
Part 4ii: Dip Pen Nanolithography (DPN) After completing PART 4i of this course you should have an understanding of, and be able to demonstrate, the.
Development of Scanning Probe Lithography (SPL)
Atomic Force Microscopy Studies of Gold Thin Films
ME-381 Dec. 5Xiaohui Tan, Rui Qiao A STUDY ON CELL ADHESION BY USING MEMS TECHNOLOGY Rui Qiao Xiaohui Tan ME-381 Dec. 5.
Sample laser cantilever quadrant photodetector tip AFM measures x, y, and z dimensions. The AFM works by scanning a silicon or silicon nitride tip, with.
Notre Dame extended Research Community 1 The Atomic Force Microscope Michael Crocker Valerie Goss Rebecca Quardokus Natalie Wasio.
Design of a compact AFM scanner
NATSYCO. microscopy Optical microscopy Electron microscopy Scanning probe microscope.
An Introduction to Dip-Pen Nanolithography. What is DPN? Direct-write patterning technique based on AFM scanning probe technology Direct-write patterning.
MEMS for NEMS Solutions for the Fat Finger Problem Michael Kraft.
Using Contact Probes For Nanomechanical Measurements Mark R. VanLandingham U. S. Army Research Laboratory Instrumentation and Metrology for Nanotechnology.
Scanning Probe Lithography in BioNanoTechnology
Tools to Make Nanostructures “the challenge to Moore’s Law“
Introduction to Atomic Force Microscopy. AFM Background Invented by Binnig, Quate, and Gerber in 1986 Measures the interaction forces between the tip.
ATOMIC FORCE MICROSCOPE Presented By Er. RANJAN CHAKRABORTY, B.Tech; A Student in M.Tech (VLSI & MICROELECTRONICS) 1 st Year, 2 nd Semester.
Demolding ENGR Pre Lab.
TAPPINGMODE™ IMAGING APPLICATIONS AND TECHNOLOGY
Tuning Fork Scanning Probe Microscopy Mesoscopic Group Meeting November 29, 2007.
FNI 1A1 Scanning Probe Microscopes SPM History of scanning probe microscopes SPM System Overview Piezoelectric Effect Scanning Tunneling Microscope (STM)
Stamp deformation during nanopattern thermal imprinting on a double-curved substrate Jiri Cech a, Alexander Bruun Christiansen a, Rafael Josef Taboryski.
Introduction to Atomic Force Microscopy
KIT – University of the State of Baden-Württemberg and National Large-scale Research Center of the Helmholtz Association INSTITUTE OF NANOTECHNOLOGY
MARL Field-Emission Scanning Electron Microscope (FE-SEM) Current JEOL SEM is over 20 years old and has a rated resolution of 4.0 nm New FEI SEM uses a.
ATOMIC LITHOGRAPHY & SOL GEL PROCESSING Dhruvi Mehta SAP ID: Batch: A2.
© Pearson & GNU Su-Jin Kim MEMS Manufacturing Processes MEMS Devices The MEMS(Microelectromechanical systems) devices can be made through the IC Process:
NANO 225 Micro/Nanofabrication Characterization: Scanning Probe Microscopy 1.
Center for Materials for Information Technology an NSF Materials Science and Engineering Center Nanolithography Lecture 15 G.J. Mankey
AFM. The cantilever holder The cantilever dimensions Tip position.
Tutorial 4 Derek Wright Wednesday, February 9 th, 2005.
Dip-Pen Nanolithography (DPN) DPN is a direct-write scanning-probe-based lithography in which an AFM tip is used to deliver chemical reagents directly.
Common scanning probe modes
Today –Homework #4 Due –Scanning Probe Microscopy, Optical Spectroscopy –11 am NanoLab Tour Tomorrow –Fill out project outline –Quiz #3 in regular classroom.
NANO 101 Introduction to Nanotechnology
Direct deposition of continuous metal nanostructures by thermal dip-pen nanolithography Applied Physics Letter, January 2006 B.A. Nelson and W.P. King,
Atomic Force Microscopy (AFM)
Top-Down Meets Bottom-Up: Dip-Pen Nanolithography and DNA-Directed Assembly of Nanoscale Electrical Circuits Student: Xu Zhang Chad A. Mirkin et al. Small.
Liquid Crystals at Nanopatterned Surfaces. AFM Contact Nanolithography AFM used as a probe of the surface topography.
“Polymer Pen” Nanolithography
Presented by Darsen Lu (3/19/2007)
Atomic Force Microscope Nanoindentation/Scratching
EEM. Nanotechnology and Nanoelectronics
3.052 Nanomechanics of Materials and Biomaterials Prof. Christine Ortiz DMSE, RM Phone : (617) WWW :
Imaging Molecular Structures with Atomic Force Microscopy Tyler Flanagan, Unurbat Erdenemunkh Sponsor - (Professor Michael Boyer) Abstract As part of the.
Scanning Probe Microscopy
Date of download: 11/12/2016 Copyright © 2016 SPIE. All rights reserved. (a) A close-up SEM of a rotary comb actuated device. The innermost and outermost.
Absolute Displacement Calibration for Atomic Force Microscopy
Scanning Probe Microscopy: Atomic Force Microscope
Lecture 7 Fundamentals of Multiscale Fabrication
Scanning Tunneling Microscopy
Scanning Probe Microscopy
Work done by a variable force
Characterization of CNT using Electrostatic Force Microscopy
Scanning Probe Microscopy History
CHE 5480 Summer 2005 Maricel Marquez
Modelling of Atomic Force Microscope(AFM)
Scanning Probe Microscopy History
Tapping mode AFM: simulation and experiment
MODULE B-3: SCANNING TUNNELING MICROSCOPY
Scanning Probe Microscope
SILICON MICROMACHINING
Introduction to Atomic Force Microscopy
Nanocharacterization (III)
Atomic Force Microscope
Atomic Force Microscopy
Fig. 5 High-speed printing and process performance metrics.
Presentation transcript:

From Ink-Jet Technology to Nano Array Writing Technology By Szu-kang Hsien Ayodeji Coker

OVERVIEW Objective. Approach. Our Nano Array Writing Device. Conclusion. Acknowledgements.

OBJECTIVE The use of nano-technology and microfabrication techniques for nano array writing. Replacing conventional lithography methods with nano array writing capable of producing 30nm line widths. The independent control of each AFM tip used in the nano-array writing technology using comb-drive actuators.

APPROACH Using the concept employed in Dip Pen Nanolithography (DPN) for nano array writing. Using ink-jet technology as a mode of delivering ink to an AFM tip capable of writing line widths on the order of nano-meters. Motion control in the x-y-z plane is done using comb-drive and electrostatic actuators.

INK JET TECHNOLOGY Drop On Demand (DOD) ink-jet printing is to be utilized in our device. A high voltage is to be applied to a PZT crystal causing it to bend. This effect in turn applies a pressure on the ink reservoir. As a result of the applied pressure, the reservoir jets out ink on demand, in our case to coat the AFM tip.

Schematic of Ink delivery structure

INK JET TECHNOLOGY A change in voltage gives rise to a corresponding change in force and the resulting dimensional change in length.  V=d ij  F j x/(  o  r A)  F will be 0.11 N using PZT film dimension 100  m*100  m,  r =3000, d 11 =370 pC/N, d 31 =110 pC/N, V=10V and x = 2  m. The displacement of the crystal,  L= LV/(td 31 ), will be around 0.2  m. So we can stack around 5 PZT crystals together in order to have 1  m pressing into the ink

DIP-PEN NANOLITHOGRAPHY (DPN) Old technique of dip pen writing. In place of the nib used in the regular dip-pen, an AFM tip is employed. Using ink-jet technology, “ink” is transported to the AFM tip, which it coats. The ink is delivered to the substrate, by choosing an “ink” and substrate that have an affinity for one another e.g ODT and Au.

ATOMIC FORCE MICROSCOPE (AFM) AFM relies on a scanning technique to to produce very high resolution 3-D images of sample surfaces. There are three methods used in AFM applications. They are the contact mode, the intermittent contact mode and the non contact imaging. The method employed NAWT is the intermittent contact mode method.

Force vs. distance curve showing tip sample Separation of different AFM operating modes.

Schematic of AFM

COMB DRIVE AND ELECTROSTATIC ACTUATORS A large number of fine interdigiated fingers are actuated by applying a voltage between them. This will provide the x-y motion for our device. The z-motion is achieved by electrostatically actuating the cantilever on which the AFM is attached.

Comb Drive Actuators

Our Nano Array Writing Device Ink Jet Structure. Scream Process for the fabrication of the comb drive actuators. AFM tip fabrication. 3-D image of our nano array writing device.

Ink Jet Fabrication

Scream Process

AFM tip Fabrication

3-D Structure Of Our Device

Conclusion Technology is feasible. NAWT is a faster way of doing lithography. Comb drive in Collaboration with electrostatic cantilever deflection is a good method of control in all 3 dimentions.

Acknowledgements. Prof. Horacio Espinosa for his guidance and advice. Prof. Chad Mirkin for taking time to provide us with all the necessary information on DPN. Zhu the TA for all the literature and help he gave us.