Detection of Percolating Paths in PMMA/CB Segregated Network Composites Using EFM and C-AFM Jacob Waddell, Runqing Ou, Sidhartha Gupta, Charles A. Parker,

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Presentation transcript:

Detection of Percolating Paths in PMMA/CB Segregated Network Composites Using EFM and C-AFM Jacob Waddell, Runqing Ou, Sidhartha Gupta, Charles A. Parker, and Rosario A. Gerhardt Georgia Institute of Technology Katya Seal, Sergei V. Kalinin, and Arthur P. Baddorf Oak Ridge National Laboratory 07/30/2009

Outline Brief Review of Percolation Random Microstructure Vs Segregated Network Microstructure Scanning Probe Microscopy Modes EFM Detection of Microstructure TUNA Detection of Conductive Paths

Percolation in Composites Percolation is reached when the second-phase forms a connected network in the matrix. Matrix Filler

Filler-poor and filler-rich regions Desired properties with less filler Obtained through immiscible polymer blends, and mechanical mixing Segregated Vs Random Evenly dispersed filler Homogeneous properties Obtained through melt mixing or solution mixing

SEM Images of Fracture Surfaces 3.17 vol% CB Mechanically Mixed Sample 3.17 vol% CB Solution Mixed Sample Carbon Black/ Poly(Methyl Methacrylate) Samples SEM images allows for good visualization of PMMA structure but it is difficult to determine the location of the carbon black.

Resistivity vs. CB vol.%

Atomic Force Microscopy As the atoms on the AFM tip and the atoms on the sample approach each other, the cantilever beam bends. Using a laser aimed at the head of the cantilever beam, the amount of bending can be determined. Sample Detector Cantilever Beam AFM Tip Laser

Different AFM Modes Contact AFM –Operates on atomic repulsion Non-Contact AFM –Operates on atomic attraction Electrostatic AFM –Operates where atomic interactions are at a minimum but electrostatic forces still exist

Electrostatic Force Microscopy The electrostatic forces of the sample affect the vibration of the EFM tip. The signal shows the conductive nature of different regions of the sample at the surface of the material.

Goal of Using EFM To determine the location of carbon black in the samples. Carbon black regions of the samples should show a larger signal than the surrounding polymer matrix. TEM image of highly aggregated CB powder

EFM Operating Parameters Instrument – Veeco Dimension V AFM Mode - EFM Cantilever Tip – NSC35 Cr-Au tip Tip Bias - 7 volts Frequency – 336 kHz

Segregated Network EFM Images TopographyEFM AmplitudeEFM Phase 3.17 vol% Carbon Black Sample 1.93 vol% Carbon Black Sample

Segregated Network EFM Images (2) Topography EFM Amplitude EFM Phase 20 X 20 Micron Images 5X5 Micron Images 3.17 Vol% CB Samples

Solution Method EFM Images 2 X 2 Micron Images Topography EFM Amplitude EFM Phase 4.09 vol% Carbon Black Sample

Conductive AFM In C-AFM, a dc bias is applied to either the base of the sample or the AFM tip and any current that is passed through the sample is measured on the other side. TUNA operates like a C-AFM, but is more sensitive. Allowing for detection of currents less than 1 picoamp. AFM Tip position sensitive photo-diode detector electrically sensitive base Samplecharged filler network

Goal of Using TUNA To determine the carbon black on the surface of the sample that is part of a percolated network The carbon black that is conducting current will show a higher electrical signal than regions of polymer matrix or carbon black that is not part of a percolated network

TUNA Operating Parameters Instrument – Veeco Dimension V AFM Mode – TUNA Cantilever Tip – CSC36 Cr-Au tip Applied Voltage – 2 V

Segregated Network TUNA Images TUNA Image Topography 20 X 20 Micron Scan 5 X 5 Micron Scan 0.65 vol% Carbon Black

Segregated Network TUNA Images (2) TUNA Image Topography 20 X 20 Micron Scan 5 X 5 Micron Scan 0.39 vol% Carbon Black

TUNA Image Topography 0.13 vol% Carbon Black 20 X 20 Micron Scan Segregated Network TUNA Images (3)

Solution Method TUNA Images TUNA Image Topography 4.09 vol% Carbon Black 15 X 15 Micron Scan

Summary EFM effectively detected the presence of the carbon black at the boundaries of polymer grains in the mechanically mixed samples. EFM also showed the random distribution in the solution mixed samples. TUNA images detected carbon black that was part of a percolated network. EFM and TUNA imaging allowed for confirmation of the microstructures of the mechanical mixed and solution mixed samples.

Acknowledgments