OTA Testing For MIMO Based Devices – Run-to-Run Variation in Data 2/23/2019 doc.: IEEE 802.11-05/1158r0 July 2006 OTA Testing For MIMO Based Devices – Run-to-Run Variation in Data Date: July 2006 Authors: Notice: This document has been prepared to assist IEEE 802.11. It is offered as a basis for discussion and is not binding on the contributing individual(s) or organization(s). The material in this document is subject to change in form and content after further study. The contributor(s) reserve(s) the right to add, amend or withdraw material contained herein. Release: The contributor grants a free, irrevocable license to the IEEE to incorporate material contained in this contribution, and any modifications thereof, in the creation of an IEEE Standards publication; to copyright in the IEEE’s name any IEEE Standards publication even though it may include portions of this contribution; and at the IEEE’s sole discretion to permit others to reproduce in whole or in part the resulting IEEE Standards publication. The contributor also acknowledges and accepts that this contribution may be made public by IEEE 802.11. Patent Policy and Procedures: The contributor is familiar with the IEEE 802 Patent Policy and Procedures <http:// ieee802.org/guides/bylaws/sb-bylaws.pdf>, including the statement "IEEE standards may include the known use of patent(s), including patent applications, provided the IEEE receives assurance from the patent holder or applicant with respect to patents essential for compliance with both mandatory and optional portions of the standard." Early disclosure to the Working Group of patent information that might be relevant to the standard is essential to reduce the possibility for delays in the development process and increase the likelihood that the draft publication will be approved for publication. Please notify the Chair <stuart.kerry@philips.com> as early as possible, in written or electronic form, if patented technology (or technology under patent application) might be incorporated into a draft standard being developed within the IEEE 802.11 Working Group. If you have questions, contact the IEEE Patent Committee Administrator at <patcom@ieee.org>. Neeraj Sharma, Intel Lemberger Uriel, Intel

2/23/2019 doc.: IEEE 802.11-05/1158r0 July 2006 Abstract In this presentation, results are presented to show the run-to-run variation in data collected for MIMO based devices in an indoor OTA LOS and NLOS test environments The test methodology and test environments used for collecting data is the same as described in IEEE P802.11.2/D0.8 draft Neeraj Sharma, Intel Lemberger Uriel, Intel

Agenda Purpose Test Results Conclusions July 2006 2/23/2019 doc.: IEEE 802.11-05/1158r0 July 2006 Agenda Purpose Test Results Conclusions Neeraj Sharma, Intel Lemberger Uriel, Intel

Purpose of OTA Testing For MIMO Based Devices July 2006 Purpose of OTA Testing For MIMO Based Devices The purpose of this presentation is to demonstrate that the currently proposed methodologies and test environments defined in IEEE P802.11.2/D0.8 draft are applicable to MIMO based devices (DUT and WLCP) This objective is achieved by providing run-to-run variation in data collected for indoor LOS and NLOS test environments Neeraj Sharma, Intel

Motivation July 2006 The test results provided for OTA in the past in this forum were limited to SISO based 802.11a/b/g devices Need to ensure the test methodologies and environments applicable to SISO based devices are applicable to MIMO based devices Neeraj Sharma, Intel

Test Environment Setup July 2006 Test Environment Setup The test uses OTA Indoor LOS and NLOS test environments [IEEE P802.11.2-D0.8 sections 5.5 and 5.6, respectively] Neeraj Sharma, Intel

Configuration Setup Parameters 2/23/2019 doc.: IEEE 802.11-05/1158r0 July 2006 Configuration Setup Parameters Maximum Tx power setting for DUT and WLCP Both the DUT and WLCP in maximum data rate MIMO mode in 2.4GHz band. No security (Open System) DUT and WLCP on AC power with all power saving features disabled DUT rotating at 1 rpm All fluorescent lights kept constant throughout testing Neeraj Sharma, Intel Lemberger Uriel, Intel

Run-to-run Data Variation July 2006 Run-to-run Data Variation Data collected on a off-the-shelf MIMO based 802.11b/g NIC Product claims to be a MIMO based solution though not able to confirm Data collected 5 times at 4 different locations Mode Location 1 (6 meters linear distance from AP, no obstructions) Location 2 (26 meters linear distance from AP with 2 walls and 1 cube as obstructions) Location 3 (34 meters linear distance from AP with no walls and 4 cubes as obstructions) Location 4 (60 meters linear distance from AP with no walls and 10 cubes as obstructions) Max Rx 1.0% 3.8% 1.6% 5.0% Max Tx 0.6% 0.9% 1.3% 5.5% Neeraj Sharma, Intel

July 2006 Conclusions Presented test results using MIMO based devices in Indoor OTA LOS and NLOS test environments using test methodologies in IEEE P802.11.2/D0.8 Data shows low % variation in run-to-run tests OTA Test methodologies and test environments in the draft are suitable for MIMO based devices Neeraj Sharma, Intel

References [1] IEEE 802.11-1999 [2] IEEE P802.11.2/D0.8 July 2006 Neeraj Sharma, Intel