page 1 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 MDA based approach for generation of TTCN-3 test specifications Hideto Ogawa, Hitachi Ltd. Hajo Eichler, Fraunhofer FOKUS

page 2 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 Contents Introduction and problem description Overview on MDA based software development Adaptation of MDA process to the test development Combination and alignment of System and Test process The role of TTCN-3 in a MDA based test process Alignment to W process model Conclusion Outlook

page 3 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 Introduction Model driven development - Is done for years on software development - Is done for years in testing domain - But: only on specific point of interest and proprietary solutions Upcoming problems - Integration of different tools and process artifacts - Reuse of (parts of) system’s specification - Methodology for process wide model basis Object Management Group announced MDA in Set of standardization for modeling - Model transformation - Technology mappings A possible answer on the question “How to use the TTCN-3 metamodel?”

page 4 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 From Model Driven Development… PIM = Platform Independent (System) Model PSM = Platform Specific (System) Model Transformation - Generate skeletons for next abstraction level - Ensure backward consistency by traceability PIM System code PSM

page 5 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 Advantages of MDA approach Reuse of artifacts defined on different level - Abstract system design can be easily adapted to new versions of PSM - Language PSMs are used by all code transformations Covering different platforms of PSM - Business logic is surrounded by different platform interfaces - Covering more than one PSM for one system (e.g. EJB, WSDL and IDL) Standardized technologies - Metamodeling with MOF (Meta Object Facility) - Technology mappings (MOF to XML, IDL, Java etc.)  Standardized integrated infrastructure for tool connectivity Transformation ideas and approaches - Model-to-Model transformation - Visualization-based input of transformation rules  code generation

page 6 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 … to MD test development PIT = Platform Independent Test Model PST = Platform Specific Test Model Transformation - Generate test specifications from test design artifacts - Reuse of test ideas/approaches for different test platforms PIT Test code PST

page 7 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 What is a PIT and PST – an interpretation Aspect PIT Platform Independent Test Model PST Platform Specific Test Model Modeling languageU2TPTTCN-3 Test definitionMainly test behaviorConcrete test interfaces, behavior and data added Access to SUTTAI (test abstract interface)TSI (test specific interface) Test implementationTTCN-3Test code + test adapter

page 8 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 Combined System and Test process PIM System code PSM PIT Test code PST

page 9 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 Transformation of test artifacts PIM to PIT - Behavior mapping (“use cases to test cases”) - Derivation of abstract type definitions - High-level communication aspects PSM to PST - System interfaces - System configuration - System behavior (lifecycle management) - Concrete types BUT: An open question: PIM  PIT  PST = PIM  PSM  PST

page 10 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 … in a concrete scenario UML (EDOC) System source EJB TTCN-3 Test code TTCN-3

page 11 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 TTCN-3 as PIT and PST TTCN-3 in the MDA world - MOF compliant metamodel - Abstract syntax representation TTCN-3 as PIT - Test control definition - Data types are platform independent - System interfaces are abstraction from real SUT TTCN-3 as PST - Concrete test data definition - Strong alignment to test adapter

page 12 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 Alignment to V / W process Analysis Design Imple- mentation Integration Application Test Design Test Specification Unit Test Production Test Integration Test

page 13 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 Conclusion Successful usage of MDA approach for test development - Reuse of test artifacts - Generation of test specifications out of system information - Alignment to process models - Consistency checks via traces TTCN-3 - MDA ready by defining MOF compliant metamodel - Usage of TTCN-3 for platform independent and specific test aspects - (TTCN-3 is usable for enterprise applications)

page 14 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 Outlook MDA also defines CIM (Computation Independent Model) - CIM  PIM  PSM  code - What is a CIT? “From requirements to acceptance criteria” MDA QVT is still in process – is it useable? - Testing of transformation rules - Testing of transformation output Current usage for OO system - Alignment for embedded systems

page 15 Hitachi Ltd. – FhI FOKUS TTCN-3 User Conference, June 2005 ? Questions