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(1)[12~13/Dec/2009] Optical inspection (2)[14/Dec] frequency & field flatness measurement (3)[10/Mar/2010] pre-EP (5μm) (4)[11/Mar] EP1 (100μm) (5)[11/Mar]

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Presentation on theme: "(1)[12~13/Dec/2009] Optical inspection (2)[14/Dec] frequency & field flatness measurement (3)[10/Mar/2010] pre-EP (5μm) (4)[11/Mar] EP1 (100μm) (5)[11/Mar]"— Presentation transcript:

1 (1)[12~13/Dec/2009] Optical inspection (2)[14/Dec] frequency & field flatness measurement (3)[10/Mar/2010] pre-EP (5μm) (4)[11/Mar] EP1 (100μm) (5)[11/Mar] Degreasing (FM-20, 1hour) (6)[11/Mar] HPR (2hours) (7)[15~19/Mar] Annealing (8)[7~14/Apr] pre-tuning (1297.180MHz, 97.1%) (9)[14~30/Apr] Optical inspection (10) [12/May] EP2 (20μm, 35mA/cm 2 ) (11) [12/May] Degreasing (FM-20, 2hours) (12) [12~13/May] HPR (10hours) (13) [13/May] Assembly working in C.R. & Baking (14) [20/May] 1 st V.T. (23.8MV/m, 1.11x10 10, cell #1 heating) (15) [25~27/May] Optical inspection (16) [31/May~2/Jun] pre-tuning (1297.010MHz, 95.5%  1297.107MHz, 97.4%) (17) [9/Jun] EP2 (20μm, 32mA/cm 2 ) (18) [9/Jun] Degreasing (LIQUINOX, 2hours) (19) [9~10/Jun] HPR (10hours) (20) [10/Jun] Assembly working in C.R. & Baking (21) [17/Jun] 2 nd V.T. (25.7MV/m, 0.81x10 10, cell #1 heating) (22) [22~28/Jun] Optical inspection & Making replica (23) [30/Jun] frequency & field flatness measurement (1296.975MHz, 95.0%) (24) [12~29/Jul] Manually & Locally grinding by sponge (25) [30/Jul] EP1 (100μm) / Scrubbing around beampipe & HOM couplers (exercise) (26) [2~5/Aug] Annealing (27) [5~7/Aug] pre-tuning (1296.193MHz, 69.1%  1296.368MHz, 98.9%) (28) [9~13/Aug] Optical inspection & Making replica (29) [13~21/Jul] New EP acid exchange (30) [25/Aug] EP2 (20μm, 33mA/cm 2 ) / Scrubbing around beampipe & HOM couplers by clean cloth (31) [25/Aug] Degreasing (FM-20, 2hours) (32) [25~26/Aug] HPR (9hours) (33) [26/Aug] Assembly working in C.R. & Baking (34) [3/Sep] 3 rd V.T. (19.5MV/m, 1.12x10 10, cell #1 heating) (35) [7~10/Sep] Optical inspection & Making replica (36) [13/Sep] frequency & field flatness measurement (1296.259MHz, 94.7%) (37) [14~15/Sep] pre-tuning (1296.259MHz, 94.7%  1296.194MHz, 98.2%) (38) [?] Shipping to J-Lab Recent Results of 1.3GHz 9-cell Superconducting Cavities in KEK-STF Y. Yamamoto, H. Hayano, E. Kako, S. Noguchi, M. Satoh, T. Shishido, K. Umemori, K. Watanabe(KEK) abstract MHI#10 and #11 cavities were measured in KEK-STF as the s0 plan for ILC. After these vertical tests, they will be sent to J-Lab and tested at least once there. Recently, two new cavities without HOM coupler were fabricated and measured in STF, which were made by two new vendors (HITACHI and TOSHIBA). As the international collaboration, one cavity from IHEP in Beijing was sent to KEK, optical inspected, high pressure rinsed and vertical tested. In this report, the results of the vertical test for these cavities will be presented in detail. Introduction In the fabrication of MHI#10 and #11 (4 th batch) in 2009-2010, the procedure of the electron beam welding (EBW) was changed. Specifically, the centring location at the dumbbell connection was introduced for the first time. This technology is already used in some foreign companies. Due to this change, the condition of EBW had also changed. However, the parameters of EBW were same as before, not changed. There is not any other changing condition for these cavities at the stage of the fabrication, compared to the old ones. Two new Japanese vendors joined in the fabrication of the 1.3GHz superconducting cavity from 2009. This trial was successful and their first prototype cavities were completed. After the normal process, including the optical inspection, EP, annealing and pre-tuning, they were vertical-tested at STF. KEK-IHEP collaboration started from 2008 for the superconducting cavity technology. The first prototype, which shape is the Low- Loss type, was completed at IHEP in 2010 and sent to STF for the vertical testing after the final surface treatment THP018 Result of MHI#10 25.7MV/m@Cell#1 quench by defect 23.8MV/m@Cell#1 quench by defect 19.5MV/m@Cell#1 quench by defect Summary of vertical tests at KEK-STF 1 st batch : MHI#1-#4  STF Phase-1 2 nd batch : MHI#5, #6 S1-Global 3 rd batch : MHI#7-#9 (except for MHI#8) 4 th batch : MHI#10-#11  S0 plan 1 st batch2 nd batch3 rd batch From 1 st batch to 3 rd batch, the average gradient is gradually increased. However, any cavity reach the ILC specification yet at STF. In 4 th batch, the average gradient dropped below 20MV/m, because the centering location was introduced for the first time at the connection of the dumbbells, and the condition of EBW was changed. For low current density EP, there are four successful examples including two 2-cell cavities for the cERL injector. Average gradient @final V.T. STF Phase-1S1-GlobalS0 plan 23MV/m 31MV/m19MV/m Max. Achievable Gradient for each cell by passband measurement 4~9π/9 @26~27MV/m 1 st V.T. @20/May/20102 nd V.T. @17/Jul/2010 4~9π/9 @24~25MV/m 3 rd V.T. @2/Sep/2010 5~9π/9 @20~21MV/m 4π/9 @24MV/m 3π/9 @41MV/m T-mapping result Process History of MHI#10 after arrival at STF Cell #1, equator, 354° 3D Analysis disappearance New defect (other location) caldera-like defects 1 st EP2 @12/May/2010 2 nd EP2 @ 9/Jun/2010 3 rd EP2 @25/Aug/2010 average current density [mA/cm 2 ] cavity temperature [ ℃ ] Making replica brown stains observed after 3 rd V.T. R. Geng C. Ginsburg S. Aderhold Local grinding equator iris After the exchange to new EP acid, they appears suddenly. 115μm original defect new defect degradation of field flatness date# of V.T.field flatnessfrequencyfield flatnessfrequencyΔ before V.T.after V.T. %MHz% % 2010/5/311 st V.T.97.11297.179995.51297.0097-1.6 2010/6/302 nd V.T.97.41297.106695.01296.9747-2.5 2010/9/133 rd V.T.98.91296.368094.71296.2590-4.2 98.9% Manual grinding T cavity [ ℃ ] average current density [mA/cm 2 ] 32.8±2.0mA/cm 2 31.6±0.9mA/cm 2 35.1±0.8mA/cm 2 26.1±0.5 ℃ 25.1±0.4 ℃ 22.4±0.4 ℃ comparison between new and old EP acid Result of MHI#11 They disappears after annealing... field emission Result of HIT#1, TOS#1 & IHEP#1 scrubbing by clean cloth processed! New Vendors of Cavity Fabrication in Japan International Collaboration between KEK and IHEP


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