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Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from.

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Presentation on theme: "Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from."— Presentation transcript:

1 Jose Alberto Rodriguez

2  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from your suggestions and comments 6/19/2007 1 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez

3  Description of the 30 GHz test stand  Before the test starts  Typical testing history  After the test is finished 6/19/2007 2 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez

4 e - gun linac PETS Beam dump Accelerating Structure P INC coupler P TRANS coupler Faraday Cup CTF3 CTF3 control room CTF2 Variable attenuator Analog electronics Digitizers Klystron gallery Control software User interface CCC Data logging 6/19/2007 3 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez

5 6/19/2007 4 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez

6 P INC coupler Calibration Data acq. and Control software 6/19/2007 5 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez Variable attenuator Downmix to 1.5 GHz Scope in control room I-Q Demodulator Digitizer IDigitizer Q User Interface Data Logging Data acq. software User Interface Data Logging Calibration e - gun Variable attenuator

7  Cold rf measurements  Metrology  Cleaning  Surface treatment  Inspection with an optical microscope  Inspection with SEM  Final assembly  Cold rf measurements 6/19/2007 6 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez

8 6/19/2007 7 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez DESCRIPTION ESTIMATED TIME (days) NEW STRUCTURE INSTALLATION 1 Opening CTF2 Removing cover plate of the previous structure 1 2 Low level RF measurements of previous structure Installing new structure in the cover plate Low level RF measurements of new structure 1 3 Installing cover plate with new structure in the tank Installing all the other RF components Leak checking 2 4Pumping down to ~ 10 -7 - 10 -8 torr2 TOTAL TIME7

9 6/19/2007 8 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez DESCRIPTION ESTIMATED TIME (days) CONDITIONING THE STRUCTURE 5Implementing and checking calibrations0.25 6Conditioning of a Cu like structure7.25 TOTAL TIME (assuming 75% machine uptime) 10 INTERMEDIATE STRUCTURE CHARACTERIZATION 7Searching working conditions0.5 8BDR ~ 10 -3, T = 70 ns, f = 10 Hz, N = 1000.125 9BDR ~ 10 -4, T = 70 ns, f = 10 Hz, N = 1001.25 10BDR ~ 10 -5, T = 70 ns, f = 25 Hz, N = 251.25 11BDR ~ 10 -4, T = 70 ns, f = 10 Hz, N = 1001.25 12BDR ~ 10 -3, T = 70 ns, f = 10 Hz, N = 1000.125 TOTAL TIME (assuming 75% machine uptime) 6

10 6/19/2007 9 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez DESCRIPTION ESTIMATED TIME (days) FINAL STRUCTURE CHARACTERIZATION 13BDR @ 70 ns (as in intermediate characterization)4.5 14BDR @ 40 ns (as in intermediate characterization)4.5 15Dedicated pulse length dependence measurements1 16Dark current and ion current measurements1 17Calibration checking0.5 18 Investigation of structure transmission properties: nonlinearity and effect of temperature (repetition rate) 1.5 19BDR as a function of repetition rate2 20Vacuum related experiments0 TOTAL TIME (assuming 75% machine uptime) 20

11 6/19/2007 10 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez We can capture, analyze and log information about every rf pulse (tested up to 25 Hz) We can define: -Target final values for T and P - Speed to approach target final values - Intermediate T and P values - Interlock on Faraday cup currents, reflected power, missing energy, vacuum pressures… We will implement feedback loops to improve stability of the rf pulses in the near future

12 6/19/2007 11 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez Circular π/2 Cu

13 6/19/2007 12 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez HDS11 Ti

14 6/19/2007 12 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez HDS11 Ti Problems with the stability of the power source

15 6/19/2007 13 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez Circular π/2 Cu

16 6/19/2007 14 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez HDS60 Cu Large

17 6/19/2007 15 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez Dark currents to determine β at different conditioning states will soon be available Circular 2π/3 Cu Circular π/2 Cu Positive ion currents were occasionally measured It will be done systematically in the future

18 6/19/2007 16 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez Losses in the structure are measured using high power to detect discrepancies in the calibration and non-linear effects (maybe due to dark current capture) HDS11 Ti Large HDS11 Mo Large

19 6/19/2007 17 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez Main rf properties of the structures are measured after every high power test HDS11 Ti Large

20 6/19/2007 18 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez HDS60 LargeHDS60 Small The whole structure is inspected using an optical microscope HDS11 Ti Large Generally one quadrant in inspected using a Scanning Electron Microscope (SEM)

21 6/19/2007 2 The X-Band Accelerating Structure Design and Test-Program Workshop Jose Alberto Rodriguez


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