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1 A Behavioral and Temperature Measurements- Based Modeling of an Operational Amplifier Using VHDL-AMS Sahbi Baccar 12, Timothée Lévi 1, Dominique Dallet.

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Presentation on theme: "1 A Behavioral and Temperature Measurements- Based Modeling of an Operational Amplifier Using VHDL-AMS Sahbi Baccar 12, Timothée Lévi 1, Dominique Dallet."— Presentation transcript:

1 1 A Behavioral and Temperature Measurements- Based Modeling of an Operational Amplifier Using VHDL-AMS Sahbi Baccar 12, Timothée Lévi 1, Dominique Dallet 1, Vladimir Shitikov 2, François Barbara 2 1 IMS Laboratory- Université Bordeaux 1, France 2 Schlumberger Riboud Product Center (SRPC), Clamart, France 17th IEEE International Conference on Electronics, Systems and Systems Athens-13th December 2010

2 2 Outlines Outline Motivation and Context Op-amp Description and Characterization Development of HT Op-amp Models Conclusion and Prospects

3 3 HTE (high temperature electronics), a recent growing market with specific circuit requirements Validity of SPICE industrial components models in HT? Outlines Motivation and Context Reviewing transistor factors in HT ?? MarketTemperature (°C) Down-hole Instruments150-300 Turbine Engine200-300 Internal Combustion Engine >150

4 4 Outlines Motivation and Context SPICE: among first simulator for ICs Working conditions effect modeling in SPICE macro-model? VHDL-AMS language: modern tool for AMS and multi-domain modeling and simulating huge time of computation: 23.5 hours for simulating a feedback of a PLL loop!! Emergence of: - new simulators - new modeling approaches HTE Behavioral Modeling

5 5 Outlines Outline Motivation and Context Op-amp Description and Characterization Development of HT Op-amp Models Conclusion and Prospects

6 6 High Temperature Front End Op-amp Description and Characterization AmplifierAnaog Filter

7 7 Outlines Op-amp Description and Characterization V os, I os, PSRR, CMRR, R in,C in, Z cm… Aol, GBPW, fol, SR-, SR+.. Voutlimp, Voutlimn, Rout… Op-amp Stage 1 Stage 2Stage 3 performance parameters

8 8 Outlines Outline Motivation and Context Op-amp Description and Characterization Development of HT Op-amp Models Conclusion and Prospects

9 9 Outlines Development of HT op-amp Models Parameter Measurement(T1, T2,..) Fitting by Mathematical Functions Simulation HT Behavioral Model Development Error Evaluation

10 10 Outlines Development of HT op-amp Models Input Stage Model

11 11 Outlines Development of HT op-amp Models Middle Stage Model sub-stage 1sub-stage 2

12 12 Outlines Development of HT op-amp Models Output Stage Model

13 13 Outlines Simulation Results and Discussions Voltage Offset and Saturation Voltage Test-bench circuit Voutlimp (T1=25°C) Voutlimp (T2=150°C) Voutlimn (T1=25°C) Voutlimn (T2=150°C) Slope1=Aol(T1=25°C) Slope2=Aol(T2=150°C) Vos (T1=25°C) Vos (T2=150°C)

14 14 Outlines Simulation Results and Discussions Voltage Offset and Saturation Voltage Rl=1K Vin=1V Rs=1K Op Amp Developed Model Rf=10K Test-bench circuit

15 15 Outlines Simulation Results and Discussions Frequency Response and Open-Loop Gain Test-bench circuit Temperature Increases

16 16 Outlines Parameter Extraction and Model Validation Title: Comparison of measured and simulated voltage offset for different temperatures

17 17 Outlines Motivation and Context Op-amp Description and Characterization Development of HT Op-amp Models Conclusion and Prospects

18 18 Outlines Conclusion and Prospects A novel behavioral op-amp model in HT Simulation of major op-amp performance parameters Modeling methodology based on measurement of performance parameters Confirmation of VHDL-AMS abilities as a useful and modern modeling language A first step to model the whole analog-front end of a data acquisition system: Op-amp, Filter and ADC

19 19 Outlines References [1] E. Bruls, M. Verstraelen, T. Zwemstra, and P. Meijer, “Analogue fault simulation in standard VHDL,” IEE Proc. Circuits, Devices and Systems, vol. 143, 1996, pp. 380. [2] F. Pecheux, C. Lallement and A. Vachoux, “VHDL-AMS and Verilog- AMS as alternative hardware description languages for efficient modeling of multidiscipline systems,” Computer- Aided Design of Integrated Circuits and Systems, IEEE Trans. on, vol. 24, n. 2005, pp. 204-225. [3] R. Kirschman, High-Temperature Electronics, Wiley-IEEE Press, 1998. [4] R. Johnson, J. Evans, P. Jacobsen, J. Thompson and M. Christopher, “The changing automotive environment: high-temperature electronics,” Electronics Packaging Manufacturing, IEEE Trans. on, vol. 27, 2004, pp. 164-176. [5] S. Baccar, S.M. Qaisar, D. Dallet, T. Levi, V. Shitikov and F. Barbara, “Analog to digital converters for high temperature applications: The modeling approach issue,” Instrumentation and Measurement Technology Conf. (I2MTC) IEEE, pp. 550-554, Austin, 3-6 May 2010 [6] G.B. Clayton et S. Winder, Operational Amplifiers, Fifth Edition, Newnes, 2003. [7] P.J. Ashenden, G.D. Peterson and D.A. Teegarden, The System Designer's Guide to VHDL- AMS: Analog, Mixed-Signal, and Mixed- Technology Modeling, Morgan Kaufmann, 2002. [8] H. Qin, F. Wang, “ Modeling of Operational Amplifier based on VHDLAMS”, in Proc. IEEE International Conference on Electronics Circuits and Systems 2006, pp. 894-897, Nice, 10-13 December 2010

20 THANK YOU FOR YOUR ATTENTION Questions?


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