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ODL: Status and Issues Mike Regan, Eddie Bergeron, Kevin Lindsay, & Doug Long.

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Presentation on theme: "ODL: Status and Issues Mike Regan, Eddie Bergeron, Kevin Lindsay, & Doug Long."— Presentation transcript:

1 ODL: Status and Issues Mike Regan, Eddie Bergeron, Kevin Lindsay, & Doug Long

2 Outline Using warm reference pixels to test for EMI How to drop bits to improve data compression Current Issues and Testing

3 Raw reference pixels look significantly different on a warm detector RMS is 5 times higher Standard deviation of the RMS is 20 times higher. COLD WARM

4 Our selectable noise source, the fans in the readout electronics.

5 Filtering out the 1/f noise leads to an RMS that is only 10% higher when warm.

6 Webb generates a lot of data and has only one 8 hour contact a day. The assumption has always been that we could do lossless 2:1 compression in hardware. Using simulations with CRs and bad pixels -> 1.7:1 What if we drop low order bits? –1 bit = 1.9:1 –2 bits = 2.1:1 –3 bits = 2.5 :1 What is the noise effect?

7 You can drop up to three bits and have no effect on the noise. Drop 5 bits Drop 4 bits

8 The noise effect is larger for reference pixels. Drop 5 bits Drop 4 bits Drop 3 bits

9 We have many issues we are investigating that will not be dealt with in instrument testing.


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