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Ringberg seminar AK Butt : 24.05.04 – 28.05.04 Tip characterisation Uwe Rietzler.

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Presentation on theme: "Ringberg seminar AK Butt : 24.05.04 – 28.05.04 Tip characterisation Uwe Rietzler."— Presentation transcript:

1 Ringberg seminar AK Butt : – Tip characterisation Uwe Rietzler

2 The influence of tip geometry imaging of surfaces adhesion rapture forces lipid penetration Self-Assembled Monolayers

3 Different possibilities for tip characterisation SPIP Software SEM-based SPM-based Tipcheck sampleSiGrating TGT01 sample Nanoscope Software

4 Method 1 TipCheck 1.Acquire a picture 2.Analyse the data with the SPIP Software SPIP Software TipCheck

5

6 Method 1 TipCheck 1.Acquire a picture 2.Analyse the data with the SPIP Software SPIP Software TipCheck

7 SPIP, the Scanning Probe Image Processor software y-axis x-axis 11 radius 28nm radius 20nm radius 38nm

8 Method 2 SiGrating TGT01 SiGrating TGT01 1.Acquire a picture 2.Analyse the data with the SPIP software 3.Or analyse the data with the NanoScope software

9 Grating TGT01

10 Method 2 SiGrating TGT01 SiGrating TGT01 1.Take a picture 2.Analyse the data with the SPIP software 3.Or analyse the data with the NanoScope software

11 Method 2 SiGrating TGT01 3.Analyse the data with the NanoScope software

12 Method 2 SiGrating TGT01 3.Analyse the data with the NanoScope software 1x1 aspect ratio

13 Method 2 SiGrating TGT01 3.Analyse the data with the NanoScope software

14 Method 3 SEM r=31nm

15 Data interpretation 1234 ± ± ± ± ± ± ± ± ± ± ± ± ± ± ± ± Radius nm Radius 5-40 nm

16 Correlation

17 Conclusion Advantages of the software based methods no additional equipment powerful software tools offline evaluation Disadvantages of the software methods change of the sample and second approach (tip crash) take a long time ~ 30 min large errors

18 Conclusion Advantages of the SEM method checking quality of the whole tip (i.e. coatings) and measure radius at the same time each takes 5min, measuring 50 tips in one SEM session recommended by cantilever manufacturers Disadvantages of the SEM method metal coating if standard SEM is used (SiN-tips) contaminate or damage the tip if standard SEM is used limited tilt angle using Leo-Gemini SEM

19 Acknowledgements Nice atmosphere and help: AK Prof. Butt and in particular to my office colleagues: Gabi, Candie and Susana Rüdiger Berger SPM and proof-reading Marco Möller SPIP and TipCheck Gunnar Glaßer SEM Rüdiger Stark NanoScope-Software Markus Wolkenhauer proof-reading... and you for your attention

20 SEM value 84,8nm SiGrating TGT01 TipCheck SPIP, the Scanning Probe Image Processor software

21 Data interpretation


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