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Modeling defect level occupation for recombination statistics Adam Topaz and Tim Gfroerer Davidson College Mark Wanlass National Renewable Energy Lab Supported.

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Presentation on theme: "Modeling defect level occupation for recombination statistics Adam Topaz and Tim Gfroerer Davidson College Mark Wanlass National Renewable Energy Lab Supported."— Presentation transcript:

1 Modeling defect level occupation for recombination statistics Adam Topaz and Tim Gfroerer Davidson College Mark Wanlass National Renewable Energy Lab Supported by the American Chemical Society – Petroleum Research Fund

2 A semiconductor: Conduction Band Valence Band Defect States Energy

3 Electrons Equilibrium Occupation in a Low Temperature Semiconductor. Holes Electron Trap Hole Trap

4 Photoexcitation Photon

5 Photoexcitation Photon

6 Photoexcitation

7

8 Radiative Recombination.

9 Photon

10 Radiative Recombination. Photon

11 Electron Trapping.

12

13 Defect Related Recombination.

14 Heat

15 Defect Related Recombination. Heat

16 What do we measure?  Recombination rate includes radiative and defect-related recombination.  Measurements were taken of radiative efficiency vs. recombination rate. (radRate)/(radRate+defRate) vs. (radRate + defRate)  Objective: Information about the defect-related density of states.

17 The Defect-Related Density of States (DOS) Function Conduction Band Valence Band Defect States Energy Ev Ec Energy

18 Band Density Of States  Conduction Band Valence Band Energy

19 Looking at the Data…

20 Calculate x-Axis Use Rate value for y-Axis dP = hole concentration in valence band dN = electron concentration in conduction band

21 The simple theory…  Assumptions: dP = dN = n Defect states located near the middle of the gap  No thermal excitation into bands.  Fitting the simple theory: radB is given. Find defA to minimize logarithmic error   defA is the defect related recombination constant  radB is the radiative recombination constant.

22 Simple Theory Fit…

23 A Better Model…  Assumptions: defA independent of temperature (and is related to the carrier lifetime)  Calculations: Calculate Ef for a given temperature, bandgap and defect distribution Calculate QEfp / QEfn for a given exN (the value of exN is chosen to match experimental dPdN) Calculate occupations (dP, dN, dDp, and dDn)  dDp = trapped hole concentration  dDn = trapped electron concentration  Ef is the Fermi energy  QEFp/n is the quasi-Fermi energy for holes and electrons respectively  exN is the number of excited carriers

24 Calculating Ef…  The Fermi energy Ef is the energy where: (# empty states below Ef) = (# filled states above Ef) Red area = Blue area Valence Band Conduction Band Defect States Ef Energy

25 Calculating QEFp and QEFn…  Find QEFp and QEFn such that: exN = increased occupation (red area) Ef QEFp QEFn exN Filled Hole States Filled Electron States Increased hole occupationIncreased electron occupation Energy

26 Calculating band occupations…  dP and dN depend on QEFp and QEFn, respectively. QEFn dN Conduction Band Valence Band QEFp dP Energy

27 Calculating defect occupation…  dDp and dDn depend on Ef, and QEF’s Note: graph represents an arbitrary midgap defect distribution QEFp QEFnEf Electron Traps dDpHole Traps dDn Trapped hole occupationTrapped electron occupation Energy

28 Symmetric vs. Asymmetric defect distribution…  Symmetric Defect DOS: EvEc

29 Symmetric Defect Fit…

30 Asymmetric defect DOS…  Using 2 Gaussians…(fit for 2 Gaussians) EvEc

31 2-Gaussian Asymmetric Fit…

32 3-Gaussian Asymmetric Fit. EvEc

33 3-Gaussian Asymmetric Fit…

34 Conclusion…  Simple Theory  Defect slope is too steep and theory does not allow for temperature dependence!  Temperature dependence and shallow defect slope can be modeled using: An occupation model that allows for thermal defect-to-band excitation. An asymmetric defect level distribution

35 In-depth look at the model…  Calculating DOS(e) DOS(e) = ValenceBand(e) + ConductionBand(e) + defDos(e)  ValenceBand(e) = 0 if e > Ev, if e >= Ev  ConductionBand(e) = 0 if e < Ec, if e <= Ec  defDos(e) is an arbitrary function denoting the defect density of states. defDos(e) = 0 when e = Ec

36 Fermi Function, and calculating Ef…  Fermi Function:  To calculate Ef, find Ef where:

37 Calculating QEFp/n  QEFp denotes the point where:  QEFn denotes the point where:

38 Calculating Occupations…         Note: see slide 7 for rate value.

39 Numerical Infinite Integrals…  Need: a bijection  And  Then:  Using ArcTan,


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