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Shekhar Mishra, Fermilab Mark J. Oreglia, Univ. of Chicago

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Presentation on theme: "Shekhar Mishra, Fermilab Mark J. Oreglia, Univ. of Chicago"— Presentation transcript:

1 Development of Chemical-Mechanical Polishing for Superconducting Cavities
Shekhar Mishra, Fermilab Mark J. Oreglia, Univ. of Chicago Cliff Spiro, Cabot Microelectronics

2 ANL-FNAL-UofC Collaboration Meeting
Project Summary High Gradient (~35 MV/m) and high yield of the SRF cavities are needed for International Linear Collider (ILC) and High Intensity Proton Accelerator (Project-X). State of the art cavity manufacturing and processing : Electo-polishing and High Pressure Rinse Remove the damaged Niobium layer Average Gradient is 20% lower Yield is less than 25% Limitation: Complicated procedure, dangerous chemical, expensive Niobium surface contamination and/or surface imperfection caused by either manufacturing or processing (Sulfur contamination) Proposal: Chemical-Mechanical Planarization technology to remove the damaged Niobium layer 4/21/2017 ANL-FNAL-UofC Collaboration Meeting

3 ANL-FNAL-UofC Collaboration Meeting
9-cell Test Results ILC Goal Average A6-8, AES2,4 = 32 MV/m A9 reprocess at Jlab 4/21/2017 ANL-FNAL-UofC Collaboration Meeting 3

4 Why alternate technique ?
The electrolyte is a mixture of hydrofluoric and sulfuric acid. Details not fully understood. Manufacturing or acid related defect: 1mm θ z ~600µm beads on Nb cavity Acid related contamination Sulfur Deposit Surface Smoothness: RMS: 1247 nm fine grain BCP 27 nm single crystal BCP 251 nm fine grain ep These two problems will require mechanical polishing that can make a smooth surface. 4/21/2017 ANL-FNAL-UofC Collaboration Meeting

5 Introduction to Cabot Microlectronics and Chemical Mechanical Planarization (CMP)
Leader in CMP slurries Pioneer in CMP technology Copper, Tungsten, Dielectric, Data Storage CMP pad offering in early stage commercialization ESF consumable and service offering in non-semiconductor applications Unparalleled track record Deliver tens of millions of gallons to customers globally Outstanding technology and manufacturing infrastructure Robust ramp of new products to high volume production Provide global support and service World-class team of scientists and technologists Non-planarized IC product Planarized IC product © 2005 Cabot Microelectronics Corporation

6 CMP of Nb 20X Field of View (approx. 230um x 300um)
BEFORE Rq = 603nm Heavily cratered surface from machining AFTER Rq = 3.5nm Small islands appear to be grains. Highest point to lowest point around 18.6nm. © 2005 Cabot Microelectronics Corporation

7 Fermilab Tumbling Machine
Not installed. Design and Engineering needed to hold the cavity in place and liquid flow etc. 4/21/2017 ANL-FNAL-UofC Collaboration Meeting

8 New Vertical Test @ FNAL
Nine-cell Tesla-style cavity Recently commissioned (IB1) Existing 1.8 K Cryogenic plant RF system in collaboration with Jlab Capable of testing ~50 Cavities/yr Evolutionary upgrades: Thermometry for 9-cells, 2 cavities at a time, 2 top plates, Cryo upgrades Plan for two additional VTS cryostats Ultimate capacity ~ 264 cavity tests/yr Plan for 2 more VTS pits VTS Cryostat:IB1 New RF & Control Room 4/21/2017 ANL-FNAL-UofC Collaboration Meeting

9 Plans and Possibilities
Development of the chemical that would be used in the Chemical Mechanical Polishing (CMP) of Niobium Small sample test Accelerating Gradient Test: Polish 1-cell (1.3 GHz) Nb cavity using the Fermilab Tumbling machine Rinse with high purity water RF test in the Fermilab Vertical Test Facility Possible Advantage No dangerous chemical A much simplified procedure that could lead to considerable cost saving Could potentially reduce acid related defects and contamination Could eliminate surface defects produced during manufacturing Small size R&D project with great potential Excellent training opportunities for students in Accelerator R&D 4/21/2017 ANL-FNAL-UofC Collaboration Meeting

10 ANL-FNAL-UofC Collaboration Meeting
Budget %FTE UofC Fermilab Cabot Salary and Fringe Benefits - Post-doctoral -Graduate Student Assistant -Undergraduate Student Assistant -Engineers -Technician 100% 5% 20% $12,500 $6,500 $26,000 Graduate Student Tution Material and Supplies $1,000 $17,500 $35,000 Publication Cost (Conference) $1,500 Total Direct Cost $15,000 $50,000 Build on Surface science Research Student training in Accelerator R&D (Fermilab Accelerator Ph.d Program) Local Industry involvement Leverage existing laboratory infrastructure 4/21/2017 ANL-FNAL-UofC Collaboration Meeting


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