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FE8113 ”High Speed Data Converters”

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Presentation on theme: "FE8113 ”High Speed Data Converters”"— Presentation transcript:

1 FE8113 ”High Speed Data Converters”

2 Course outline Focus on ADCs. Three main topics: 1: Architectures
”CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters,” 2nd ed., Rudy van de Plassche, Kluwer Academic Publishers, Ch. 1-3 2: Digital background calibration Selected papers 3: State-of-the-art converters

3 Part 1: Architectures First three chapters of van de Plassche’s textbook Ch.1: The Converter as a black box Ch.2: Specifications of converters Ch.3: High-Speed A/D Converters

4 Chapter 2 Specifications of converters

5 Digital data coding TTL, CMOS, ECL Serial to parallel conversion
- Data latched out by latch clock - Directly drives switches in DA-converters - Output glitches - Deglitching - Switch optimization - Accurate board layout for matched delays

6 Digital coding schemes
Offset binary code Major carry transition for signal around zero Glitch sensitive Sign-magnitude code Signal inversion around zero Low-level linearity issues Twos complement Used for computational operations

7 DC specifications Absolute accuracy Relative accuracy
Full-scale input or output compared to the absolute standard of the National Bureau of Standards Mostly related to the reference source Relative accuracy Deviation of the output signal or code from a straight line Also called integral non-linearity (INL) No missing codes (monotonicity): INL<±1/2LSB

8 Nonlinearity calculation
Binary w. output bit: Full-scale value B: Ideal step-size: Linearity error of kth bit: INL:

9 Nonlinearity calculation II
Monotonicity: D/A: No increase in analog output value when input increases by a value of one LSB: To guarantee monotonicity the sum of errors for all bits must never exceed ½ LSB level

10 Other static specifications
DNL Quote from book: ”The difference between two adjacent analog signal values compared to the step-size (LSB-weight) of a converter generated by transitions between adjacent pairs of digital code numbers over the full range of the converter” (...) Offset: Non-zero output when zero input. Temperature dependence: For thermal mismatch below ¼ LSB: Supply voltage variations: Typically specified, e.g. ±5%

11 Dynamic specification
SNR Signal power divided by integrated noise power. Harmonics not included If harmonics included: SNDR: Signal to noise and distortion ratio 6.02n+1.76 dB SFDR Ratio between full-scale fundamental and largest harmonic distortion component ENOB (SNDR-1.76)/6.02

12 Element matching vs. INL
Requirements: INL≤ ½ LSB See book for details. Based on measurement of many samples. σ=mismatch standard variation.

13 ENOB and SDNR vs. INL model
Transfer-function with INL: INL-model (differential): Out vs. in with three coefficients in INL-model: Gives odd harmonics: Only one coefficient: Resulting ENOB:

14 SFDR and IMD vs. INL model
Distortion: Quantization component: SFDR: Intermodulation:

15 Glitches Important for performance of DAC Major carry-code transition
Modelled with square glitch with area/energy (for MSB glitch): Compare to LSB-energy:

16 Noise Thermal noise No correlation with q-noise:
In a 16b DAC with 98.1dB quantization-SNR, the thermal noise must be less than dB for 0.5dB loss in total SNR.

17 Noise ADC: Noise dithers the comparator in an ADC
Estimating comparator output-noise by using probability of wrong desicion: Noise: σ = ½ LSB: Bias quantizer ½ LSB over quantization-level:

18 Other error sources Minimum reference step-size: Bit-error rate
k 2Q(k) 3 2.9∙10-3 4 6.7∙10-5 5 5.9∙10-7 6 2.0∙10-9 7 2.6∙10-12 8 1.3∙10-15 Minimum reference step-size: The possibility noise amplitude is bigger than kσ Min. Reference step size should be 6-7 times greater than comparator RMS-noise Bit-error rate Number of desicion errors For ADC typically to 10-10 Max sampling-rate Rate where DR is decreased 3dB Digital signal feed-through Couple HF signals to the output

19 Other error sources Distortion PSRR Settling-time Aquisition-time
Signal band also present at multiples of fs. Inter-modulation products may occur when applied to analog amplifier. Mixing fs-fin with fs+fin Product at 2fs Harmonic Mixing 2(fs-fin) with fs+fin Product at fs-3fin Non-harmonic Only harmonics in baseband if fs>4fin. PSRR Immunity no power-supply noise Settling-time Very important in any successive approximation ADC (internal DAC) Aquisition-time Track-command to response delay Limits max fs

20 Other error sources Aperture-time Sample-and-hold step Droop-rate
Time-difference between hold-command and the time the sample is taken Can give input-dependent error in sample-and-hold amplifier Sample-and-hold step Charge-feedthrough can give step in transition from sample-to-hold phase Droop-rate Discharge of hold-capacitor in hold-phase Signal feed-through To capacitor in hold mode Must be attenuated 70-80dB in 8-10bit ADC Noise in S/H-amplifier Input-noise will be tracked Peak-noise must be below LSB-level

21 Other error sources Overview of S/H-specifications Settling-time
Aquisition-time Aperture time / jitter S/H step Droop rate Hold-mode feedthrough S/H amplifier noise

22 Other error sources Analog system bandwidth ERB Figure of merit:
In an ideal converter system the maximum analog bandwidth is equal to fs/2. ERB Effective resolution bandwidth Bandwidth where resolution is within -3dB of nominal. Figure of merit: Standard for comparison FOM expected to drop factor 10 every 10th year

23 Discussion...


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