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October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 1 Quality Assurance Test Stand University of Rochester oQTC at Rochester,

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Presentation on theme: "October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 1 Quality Assurance Test Stand University of Rochester oQTC at Rochester,"— Presentation transcript:

1 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 1 Quality Assurance Test Stand University of Rochester oQTC at Rochester, NY What’s new compared to KSU  Vacuum Base Chuck Positioner  Extra switch to decouple guard box oTest crosscheck 5 Test Structures  Tested by Vienna, Karlsruhe QTC 2 OB2 sensors  Tested by Perugia QTC oHandling the results Data Base oConclusion, plans

2 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 2 Setup is completed Hardware is in place and operational. Software is working as well, - test results are consistent with other testing centers (more details later). Clean room is to be completed by 20 th of October.

3 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 3 Personnel Regina Demina (585) 275-7357 Thomas Ferbel (585) 275-4396 Elizabeth A. Groves (585) 275-4001 Sergey Korjenevski (585) 275-8550 David R. Martell (585) 275-5938 Daniel Schwaab (585) 275-4394

4 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 4 List of the Equipment Probe Station Alessi REL-6142 8 in. guarded chuck, Semi-Auto Microscope Mitutoyo 2x 10x 20x, 10x Vacuum base positioners with 4 coax probes Needles diameter 5  m LCR HP 4284A V-source/Ammeter Keithley 237 and Keithley 487 Switching Matrix Agilent 34970A with two 8x4 switch 34904A Vibration-free table Kinetics 1201 Custom made dark box

5 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 5 New Features Solid stable location of the chuck positioner. Significant to ensure safety and helps to minimize noise

6 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 6 New Features New switch is added to discharge decoupling capacitors. Significant to ensure safety and helps to minimize noise.

7 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 7 Cross Check, - Full strip tests Two OB2 sensors, ST, tested by Perugia –30210420275924 –30210414739923 5 Test Structures, HPK –60548-050from Karlsruhe –60548-051 from Karlsruhe –60549-055 from Vienna –60550-065 from Vienna –60551-087 from Vienna

8 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 8 IV Test

9 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 9 IV Test

10 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 10 CV Test

11 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 11 CV Test

12 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 12 Strip tests - Leakage

13 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 13 Strip tests - Leakage

14 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 14 Strip tests - Rpoly

15 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 15 Strip tests - Rpoly

16 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 16 Strip tests - Cac at 100Hz

17 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 17 Strip tests - Cac at 100Hz

18 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 18 Strip tests - Idiel

19 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 19 Strip tests - Idiel

20 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 20 Data Base We were not able to simulate data handling with fictitious names though we believe our.xml format is correct. The problem may disappear as we proceed with real actions. Error: –“DB: ERROR: fatal error: 0RA-02291: integrity constraint (CMSTRKDB.REF_INPUT14) violated – parent key not found –ORA-06512: at “CMSTRKDB.STORED_FUNCTIONS”, line 788 –ORA-06512: at line 1 –…error goes on to list the text in the file. It is not just IV_TEST in particular. If this test is deleted and it goes straight to CV, the problem basically is repeated.

21 October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 21 Conclusions and Plans QTC at University of Rochester complies with CMS requirements to test Si detectors. Rate of the testing is estimated to be 2 OB2 sensors per day. Data Base remains an issue. The problem may disappear if everything is done in proper order using appropriate bar codes and all.


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