1. 1 Sébastien Boutet sboutet@slac.stanford.edu 1 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 Coherent X-ray Imaging Instrument Sébastien Boutet CXI Instrument Scientist June 9, 2009

2. 2 Sébastien Boutet sboutet@slac.stanford.edu 2 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 Outline Update since the last FAC KB mirrors New CXI layout Sample Chamber/KB mirror integration for the 0.1 micron focus

3. 3 Sébastien Boutet sboutet@slac.stanford.edu 3 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 Coherent Diffractive Imaging of Biomolecules Combine many measurements into 3D dataset Noisy diffraction pattern LCLS pulse Particle injection One pulse, one measurement Wavefront sensor or second detector Data Frames Combined Data SetReconstruction

4. 4 Sébastien Boutet sboutet@slac.stanford.edu 4 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 CXI Instrument Location XCS AMO CXI Endstation XPP Near Experimental Hall Far Experimental Hall X-ray Transport Tunnel Source to Sample distance : ~ 440 m SXR

5. 5 Sébastien Boutet sboutet@slac.stanford.edu 5 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 Far Experimental Hall Coherent X-ray Imaging Instrument CXI Control Room Lab Area X-ray Correlation Spectroscopy Instrument Hutch #6 XCS Control Room

6. 6 Sébastien Boutet sboutet@slac.stanford.edu 6 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 CXI Instrument Overview Sample Chamber Detector Stage (back position) Particle injector LCLS Beam Precision Instrument Stand Detector Stage (upstream position)

7. 7 Sébastien Boutet sboutet@slac.stanford.edu 7 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 CXI KB Mirrors CXI has two sets of KB mirrors to produce a 1 micron beam and a 0.1 micron beam Discussed at last FAC Coating 45 degree geometry Update Apply single coating strip (SiC) But leave space for at least another strip for later The 45 degree geometry was abandoned Benefits were not worth the risks

8. 8 Sébastien Boutet sboutet@slac.stanford.edu 8 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 New CXI Layout Discussed at last FAC Put both sample chambers in series and have each KB system focus at different planes Put KB1 system first and focus past the KB0.1 system Place Be lenses between the 2 sample chambers to refocus the 100 nm beam into the second sample chamber Keep ability to use the unfocused beam Update The new layout was implemented The unfocused beam can be used in the 1 micron Sample Chamber

9. 9 Sébastien Boutet sboutet@slac.stanford.edu 9 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 CXI with 1 micron and Unfocused Beam Diagnostics & Wavefront Monitor 1 micron Sample Environment Diagnostics/ Common Optics 1 micron KB Reference Laser

10. 10 Sébastien Boutet sboutet@slac.stanford.edu 10 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 CXI with 0.1 micron Beam Diagnostics/ Common Optics 1 micron KB Reference Laser 0.1 micron KB & Sample Environment Wavefront Monitor

11. 11 Sébastien Boutet sboutet@slac.stanford.edu 11 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 New Layout Advantages Allows serial experiment configuration Allows separation of mirror vacuum Allows the use of a thin window to separate KB0.1 mirror vacuum from 0.1 micron sample chamber Allows the second chamber to be removed without disturbing the mirrors Allows a user chamber to be attached if needed

12. 12 Sébastien Boutet sboutet@slac.stanford.edu 12 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 CXI 0.1 µm KB Mirrors/Sample Environment Purpose Produce a ~100 nm focus Focal lengths 0.9 m for M1 0.5 m for M2 Requirements Identical to 1 micron KB System in every way except for the mirror curvature Integrated system with 0.1 micron Sample Chamber due to close proximity Extend vacuum enclosure by ~600 mm for sample area Separate both parts of the vacuum enclosure with valve and window

13. 13 Sébastien Boutet sboutet@slac.stanford.edu 13 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 0.1 micron KB/Sample Chamber

14. 14 Sébastien Boutet sboutet@slac.stanford.edu 14 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 0.1 micron KB/Sample Chamber

15. 15 Sébastien Boutet sboutet@slac.stanford.edu 15 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 0.1 micron KB/Sample Chamber

16. 16 Sébastien Boutet sboutet@slac.stanford.edu 16 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 Custom Valves 2 custom valves will be used First one will hold vacuum in order to vent the Sample Chamber Second valve will have a very thin x-ray transmissive window to separate UHV in KB tank from poor vacuum (~10 -7 Torr) in Sample Chamber

17. 17 Sébastien Boutet sboutet@slac.stanford.edu 17 Coherent X-ray Imaging Instrument FAC Meeting, June 9 2009 Summary The CXI KB mirrors will use a SiC coating strip Space will be left available for another coating strip once some LCLS experiments have occurred Use 2 sample chambers One for each KB mirror pair CXI abandoned the 45 degree KB mirror configuration Maintain the ability to use the direct unfocused beam into the 1 micron Sample Chamber The 0.1 micron KB/Sample Chamber System will utilize custom valves to allow venting of the Sample Chamber and a thin window to separate the vacuum of the mirrors from the sample