1. Secondary-Ion Mass Spectrometry (SIMS) 二 次 離 子 質 譜 法 To determine both the atomic and the molecular composition of solid surface. Primary beam: ions (e.g., Ar + ) bombard the surface of the sample Secondary beam: ions (both atoms and molecules) to be determined by a mass analyzer (e.g., quadrupole, time-of-flight) 21D Ion Spectroscopic Techniques

2. 21E Surface Photon Spectroscopic Methods Disadvantages of XPS, AES and SIMS: require ultra-high vacuum can not deal with surfaces in contact with liquid

3. Surface Plasmon Resonance, SPR 表面電漿共振 surface plasmon waves: the surface electromagnetic waves that propagate in the xy plans of a metal film when the free electrons interact with photons. total internal reflection With total internal reflection, an evanescent wave is generated in the medium of lower refractive index. When the angle is suitable for surface plasmon resonance, a sharp decrease in the reflected intensity is observe. The most interesting aspect of surface plasmon resonance (SPR) is its sensitivity to materials adsorbed onto the metal film. SPR has become an important technique for biosensors.

4. FIGURE 21-14 Surface plasmon resonance. Laser radiation is coupled into the glass substrate coated with a thin metal film by a half-cylindrical prism. If total internal reflection occurs, an evanescent wave is generated in the medium of lower refractive index. This wave can excite surface plasmon waves. When the angle is suitable for surface plasmon resonance, a sharp decrease in the reflected intensity is observed at the detector. P.605 Ch21 Surface Characterization by Spectroscopy and Microscopy

5. Homework #1 What is self-assembled monolayer (SAM)? 1 ~ 2 pages (A4); Good figures/tables are often useful. List the references in correct format. Be sure to include at least one reference book. Due: 03/06 (Thur.)

6. Course: Instrumental Analysis Spring 2007 Instructor: Dr. Tai-Sung Hsi ( 眭台生 ) Office: C2008 Office Hour: Wed 12:30 – 14:00 Telephone: 3921 E-mail: tshsi@mail.nsysu.edu.tw Textbook: D.A. Skoog, F.J. Holler and T.A. Nieman, Principles of Instrumental Analysis, 5th ed., Harcourt Brace & Company, Philadelphia, 1998. References : 1. D. C. Harris, Quantitative Chemical Analysis, 6th ed., W. H. Freeman and Company, New York, 2003. 2. J. W. Robinson, E. M. S. Frame and G. M. Frame II, Undergraduate Instrumental Analysis, 6th ed., Marcel Dekker, New York, 2005. 3. G. D. Christian and J. E. O'Reilly, Instrumental Analysis, 2nd ed., Allyn and Bacon, Boston, 1986. 4. R. D. Braun, Introduction to Instrumental Analysis, McGraw-Hill, New York, 1987. Grade : Homework + Quiz = 15 % Examination x 3 = 89 % [(100 + 105 + 110) / 3] x 85 %

7. Mi’croscopy / ‘Microscope to image the surface Optical Microscopy Scanning Electron Microscopy (SEM) Scanning Tunneling Microscopy (STM) Atomic Force Microscopy (AFM) 顯微術 顯微鏡 掃描穿隧顯微術 原子力顯微術

10. STM / AFM = Scanning Probe Microscope (SPM) x/y raster pattern: a scanning pattern To measure the surface to’pography of sample: 3-D atomic scale resolution 地形

11. ? I-atom STM 3 nm x 3 nm, on Pt 29

12. AFM two double-stranded DNA mica 30

13. Scanning Tunneling Microscopy (STM) HOPC Microscopy: to image the surface (physical features) C - atom Tunneling current: Two conductors are within a few nanometers of one another, and one of the conductor is in the form of a sharp tip. The tunneling current is held constant to remain d constant. The surface being examined must conduct electricity (i.e., a conductor or semiconductor). 1982- first described by G. Binnig and H. Roher 1986- Nobel Prize in Physics 地形圖 24

14. e.g., V : !.5 V d : 2 nm I t : 100 pA I t = V e -kd tunneling current Probe : single atom tip (W, Pt) C - atom Distance (nm) const

15. (exponential decay with d)tunneling current constant I t = V e -kd distance

16. pi’ezoelectric scanner Stepping-motor 步進馬達 壓電 nm range μm range 26

17. Schematic view of an STM