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High fidelity Josephson phase qubits winning the war (battle…) on decoherence “Quantum Integrated Circuit” – scalable Fidelity b reakthrough: single-shot.

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Presentation on theme: "High fidelity Josephson phase qubits winning the war (battle…) on decoherence “Quantum Integrated Circuit” – scalable Fidelity b reakthrough: single-shot."— Presentation transcript:

1 High fidelity Josephson phase qubits winning the war (battle…) on decoherence “Quantum Integrated Circuit” – scalable Fidelity b reakthrough: single-shot tomography Tunable qubit – easy to use Two qubit gates – new results Collaboration with NIST – Boulder UC Santa Barbara John Martinis Andrew Cleland Robert McDermott Matthias Steffen (Ken Cooper) Eva Weig Nadav Katz PD GS Markus Ansmann Matthew Neeley Radek Bialczak Erik Lucero

2 The Josephson Junction SC ~1nm barrier Silicon or sapphire substrate SiN x insulator Al top electrode Al bottom electrode AlOx tunnel barrier Josephson junction  2 = i2i2 e  1 = i1i1 e I J = I 0 sin  V = (  0 / 2  ) . “Josephson Phase”  =  1 -  2

3 Qubit: Nonlinear LC resonator  23  2/3 0 00 /1 24 II I U      C  4/1 0 2/1 0 0 1 22 II I p              I R CLJLJ    Lifetime of state |1> 05 0.7 0.8 0.9 1  10  21  32   p n n E E   / 1    RC UU pp   U(  ) = 0 pulse (state measurement) I0I0 =  0 /2  I 0 cos  nonlinear inductor I  cos I 0j  V ) (1/L J  0  sinI I  LJLJ 2 V 0     1: Tunable well (with I) 2: Transitions non-degenerate 3: Tunneling from top wells 4: Lifetime from R E0E0 E1E1 E2E2 00 11 22 nn  n+1 1000~

4 Superconducting Qubits PhaseFluxCharge Ce I E E C J 2/ 2/ 2 00   10 4 10 2 1 Area (  m 2 ): 10-100 0.1-10.01 Potential & wavefunction Engineering Z J =1/w 10 C 10  10 3  10 5  Yale, Saclay, NEC, Chalmers Delft, Berkeley UCSB, NIST, Maryland

5 Josephson-Junction Qubit |0> |1> State Preparation Wait t > 1/   for decay to |0> Qubit logic with bias control State Measurement:  U( I+I pulse ) Single shot – high fidelity Apply ~3ns Gaussian I pulse I pulse (lower barrier) I = I dc +  I dc (t) + I  wc (t)cos  10 t + I  ws (t)sin  10 t phase potential ) 2 / ( )2( z  ws y  wc x I IH          I dc (t) dc IE  / 10 |0> |1> |2> I pulse Prob. Tunnel 96% |0> : no tunnel |1> : tunnel

6 The UCSB/NIST Qubit  11  01 I dc Qubit Flux bias 1 01 0 IwIw V SQ SQUID microwave drive Qubit Flux bias SQUID

7 Experimental Apparatus V source 20dB 4K 20mK 300K I-Q switch Sequencer & Timer  waves IsIs II VsVs fiber optics rf filters  w filters ~10ppm noise V source ~10ppm noise 20dB Z, measure X, Y IpIp IwIw IsIs II time Reset Compute Meas. Readout IpIp IwIw VsVs 0 1 XY Z Repeat 1000x prob. 0,1 10ns 3ns 20dB

8 Spectroscopy Bias current I (au) saturate IpIp IwIw meas. Microwave frequency (GHz)  10 ( I ) 26 few TLS resonances P 1 = grayscale

9 Qubit Fidelity Tests  Rabi:  Ramsey:  Echo:  T1:T1: Probability 1 state Large Visibility! T 1 = 110 ns, T  ~ 85 ns ~90% visibility

10 State Tomography |0  |1  |0  + |1  |0  + i|1  y x X,Y P1P1 state tomography Good agreement with QM Peak position gives state  ), amplitude gives coherence DAC-Q (X) DAC-I (Y) |0  |1  X Y |0  +|1  |0  +i|1 

11 Standard State Tomography (I,X,Y) time (ns) P1P1 I,X,Y I X Y |0  +|1 

12 State Evolution from Partial Measurement tomography & final measure state preparation 15 ns10 ns |0  +|1  Needed to correct errors. First solid-state experiment. partial measure p Prob. = p/2 “State tunneled” Prob. = 1-p/2 |0  IwIw IpIp p t Theory: A. Korotkov, UCR

13 Partial Measurement |0  +|1  |0  p mm -30  -10  -20  0  /4  /2 3  /4 p=0.25 p=0.75

14 Decoherence and Materials Im{  }/Re{  } =  = 1/Q 1/2 [V] future a- Dielectric loss in x-overs Where’s the problem? TLS in tunnel barrier Two Level States (TLS) New design Theory: Martin et al Yu & UCSB group xtal Al 2 O 3 a-Al 2 O 3

15 New Qubits 60  m SiN x capacitor I: CircuitII: Epitaxial Materials (loss of SiN x limits T 1 ) Al 2 O 3 (substrate) Al 2 O 3 Re Al LEED: Bias current I  wave freq. (GHz) Spectroscopy: epi-Re/Al 2 O 3 qubit ~30x fewer TLS defects! (NIST)

16 Long T 1 in Phase Qubits t Rabi (ns) UCSB/NIST T 1 = 500 ns P 1 (probability) t Rabi (ns) These results: Conventional design (May 2005): High visibility more useful than long T 1 T 1 will be longer with better C dielectric

17 Future Prospects Coherence T 1 > 500 ns in progress, need to lengthen T  STOP USING BAD MATERIALS! Single Qubit operations work well Coupled qubit experiment in DR Simultaneous state measurement demonstrated Bell states generated Violate Bell’s inequality soon Tunable qubit : 4+ types of CNOT gates possible Scale-up infrastructure (for phase qubits) Very optimistic about 10+ qubit quantum computer

18 Dielectric Loss in CVD SiO 2 f [GHz] P out [mW] Im{  }/Re{  } =  = 1/Q P in lowering HUGE Dissipation C L 1/2 [V] P in P out T = 25 mK

19 Theory of Dielectric Loss Im{  }/Re{  } =  = 1/Q 1/2 [V] Two-level (TLS) bath: saturates at high power, decreasing loss high power Amorphous SiO 2 von Schickfus and Hunklinger, 1977 E Bulk SiO 2 : SiO 2 (no OH) SiO 2 (100ppm OH)

20 Theory of Dielectric Loss Im{  }/Re{  } =  = 1/Q 1/2 [V] Spin (TLS) bath: saturates at high power, decreasing loss high power Amorphous SiO 2 von Schickfus and Hunklinger, 1977 E Bulk SiO 2 : SiN x, 20x better dielectric Why?

21 Junction Resonances = Dielectric Loss at the Nanoscale qubit bias (a.u.)splitting size S' (GHz) N/GHz (0.01 GHz < S < S')  wave frequency (GHz) 13  m 2 70  m 2 13  m 2 S/h 70  m 2 avg. 5 samples: New theory (suggested by I. Martin et al): e d 1.5 nm Al AlO x theory d=0.13 nm (bond size of OH defect!) Explains sharp cutoff S max in good agreement with TLS dipole moment: Charge (not I 0 ) fluctuators likely explanation of resonances 2-level states (TLS).

22 Junction Resonances: Coupling Number N c 0 1 qubit junction resonances … N c >> 1, Fermi golden rule for decay of 1 state: Number resonances coupled to qubit: S g e Statistically avoid with N c << 1 (small area) Same formula for  i as bulk dielectric loss Implies  i = 1.6x10 -3, AlO x similar to SiO x (~1% OH defects) E 10

23 State Decay vs. Junction Area Monte-Carlo QM simulation: (  -pulse, delay, then measure) time (ns) probability P 1 A=2500 um 2 (Nc=5.3) A=260 um 2 (Nc=1.7)

24 State Decay vs. Junction Area Monte-Carlo QM simulation: (  -pulse, delay, then measure) time (ns) probability P 1 A=2500  m 2 (N c =5.3) A=260  m 2 (N c =1.7) A=18  m 2 (N c =0.45) N c 2 /2 Need N c < 0.3 (A < 10  m 2 ) to statistically avoid resonances ~~

25 State Measurement and Junction Resonances 0 1 qubit junction resonances … N c ’ >> 1, Landau-Zener tunneling: Number resonances swept through: tptp Couple to more resonances With t p ~ 10 ns, explains fidelity loss in measurement! (10 ns) -1


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