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Review of Electron Cloud R&D at KEKB 1.Diagnostics 1.Beam Size Blow-up 2.Beam Instabilities 3.Electron Density 4.SEY (Secondary Electron Yield) 2.Mitigation.

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Presentation on theme: "Review of Electron Cloud R&D at KEKB 1.Diagnostics 1.Beam Size Blow-up 2.Beam Instabilities 3.Electron Density 4.SEY (Secondary Electron Yield) 2.Mitigation."— Presentation transcript:

1 Review of Electron Cloud R&D at KEKB 1.Diagnostics 1.Beam Size Blow-up 2.Beam Instabilities 3.Electron Density 4.SEY (Secondary Electron Yield) 2.Mitigation 1.Solenoid 2.Beam Pipe with Antechambers 3.Coating to Reduce SEY 4.Clearing Electrode 3.Summary Y. Suetsugu for KEKB Group 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ. 1

2 Diagnostics Beam size blow-up: Starting point of our EC R&D –The KEKB LER (positron ring) has suffered vertical beam size blow-up due to electron clouds, which deteriorated the luminosity. –Single beam and multi-bunch effect of EC. 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ. 2 Typical example (1189 bunches) Basic parameters of KEKB LER Energy 3.5 GeV Circumference3016.26 m Nominal bunch current1.3 mA Nominal bunch spacing2~8 ns Harmonic number5120 RMS beam size (x/y)0.42/0.06 mm Betatron tune45.51/43.57 RF voltage8 MV Synchrotron tune0.024 Radiation damping time40 ms (Measured by interferometer) Threshold

3 Diagnostics Beam size blow up: Threshold –The blowup had a threshold which was determined by the charge density (bunch current/bunch spacing).  Support the blowup due to head-tail instability 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ. 3 H. Fukuma, ECLOUD02 I b,th (threshold current of blow-up) / L sep ~ const. This supports that the head-tail instability is a cause of blow-up. (Beam Beam Breakup)

4 Diagnostics Beam size blow up: Effect on luminosity –Measured Using Bunch-by-Bunch Luminosity monitor 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ. 4 J. Flanagan, ECLOUD02 Specific luminosity of observer bunch is lower than that of regular bunches above 0.4 mA, but is the same below 0.4 mA. Consistent with sideband behavior, and explanation that loss of specific luminosity is due to electron cloud instability. Specific Luminosity (a. u.) [4 bkt] [3 bkt] [2 bkt]

5 Diagnostics Build up –Tune shift is another indication of EC. –Vertical betatron tune increased along the train and almost saturated after several ten bunches. 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ. 5 Tune shift and build-up time is consistent with simulation. H. Fukuma, ECLOUD02

6 Diagnostics Head-tail instability: Synchro-Betatron sidebands –Direct evidence of Head-Tail instability due to EC 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 6 Sideband appears at beam-size blow-up threshold, initially at ~ b + s, with separation distance from b increasing as cloud density increases. Sideband peak moves with betatron peak when betatron tune is changed. Sideband separation from b changes with change in s. Position of the first bunch exhibiting the side band shifted with s. Bunch Oscillation Recorder (BOR) – Digitizer synched to RF clock, plus 20-MByte memory. – Can record 4096 turns x 5120 buckets worth of data. – Calculate Fourier power spectrum of each bunch separately. J. Flanagan, ECLOUD07

7 Diagnostics Head-tail instability: Synchro-Betatron sidebands –The behavior is consistent with simulation 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 7 J. Flanagan, ECLOUD07

8 Diagnostics Coupled bunch instability –A small betatron oscillation of a bunch is transmitted, amplified to other bunches via the electron cloud.  Transverse coupled-bunch instability is excited. –Clear evidence of an electron cloud induced coupled- bunch instability. 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 8 Unstable modes without a solenoid field Unstable modes with a full solenoid field M. Tobiyama, ECLOUD07 Vertical B sol = OFF Vertical B sol = ON

9 Diagnostics Coupled bunch instability –The experimental results supported the simulation where the instability is dominated by the electron clouds in the drift space with the lower secondary emission rate  max = 1.0 rather than 1.5. 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 9 S. S. Win et al, PRST-AB 8, 094401 (2005) Horizontal Vertical No solenoid,  max = 1.0 Horizontal Vertical Solenoid field = 10 G

10 Diagnostics Electron Density 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 10 K. Kanazawa, ECLOUD07 200

11 Diagnostics Electron Density 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 11 K. Kanazawa, ECLOUD07 Electron density around the beam can be estimated by measuring electron with a sufficient high energy. [In field-free region]

12 Diagnostics 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 12 K. Kanazawa, ECLOUD07 Electron Density –Example of measurement –Useful to directly estimate the electron density. Measurements in solenoid and Q-magnet are planned  Kanazawa-san’s talk.

13 Diagnostics SEY (Secondary Electron Yield) –SEY is an important parameters in considering EC build up by multipactoring. –Measurement of SEY of various materials, such as copper, copper with coatings and graphite, using sample pieced has been performed in laboratories. –Measurements of samples exposed to real positron beam were also tried recently. 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 13 Sample Surface S. Kato, KEK Review 2007 In situ. Measurement (i.e. without exposure to air) is possible.

14 Diagnostics SEY –Direct measurement using samples 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 14 At Lab After e- Irradiation At LER After Exposure At LER Before Exposure S. Kato, KEK Review 2007 After Exposure to beam: Drastic decease of  max for all samples. Results are almost consistent with those results obtained at Lab. e - beam induced graphitization was found for copper surface exposed to e - cloud as found in lab experiment. In lab, the same graphite formation at TiN surface + graphite and carbide formation at NEG surface were found.

15 Diagnostics SEY –Estimation from measured electron current, utilizing a simulation. 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 15 0.28 1.1-1.25 0.23 1.0-1.15 0.120.8-1.0 Cu NEG TiN ee  max 3.5 bucket spacing 1389 bunches Repeller -1000V Measured I e can be reproduced with estimated  max and  e (photoelectron yield), which are consistent with those obtained at arc section. TiN still seems better from a view point of low  max and also low  e. Measured I e and fitting Estimate  max and  e

16 Mitigation Solenoid –Very effective method for field-free region. –Solenoid has been wound since 2000, and now over 95 % of drift region was covered. –Blow up is now almost suppressed up to 1.7 A (3.06 RF bucket spacing). 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 16 H. Fukuma, ECLOUD02

17 Mitigation Solenoid 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 17 H. Fukuma, ECLOUD02 Solenoid is also useful to determine the location of EC.

18 Mitigation Beam pipe with antechamber –Effective to reduce photoelectron effect Photoelectron: Seed of EC –Important in field-free region 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 18 [Linear Scale] -30 V 1/1284/3.77 [Meas.]

19 Mitigation Coating to reduce SEY –TiN or NEG coating has been said to be effective to reduce SEY. Important in magnet. –Test chambers with coatings were installed into the ring, and the electron densities were measured and compared each other. 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 19 K.Kanazawa, ECLOUD07 TiN coating is the most promising coating at present h e (photoelectron yield) is also low

20 Mitigation Coating to reduce SEY –Recently, combination of beam pipe with antechambers and TiN coating was studied. –Coating system available for ~4 m pipe was set up. –Thickness is ~200 nm, which is determined from adhesiveness of film and  max (~0.84). 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 20 ~4 m Gas inlet Duct Pumping system Solenoid ~3.6 m f 90 mm K. Shibata, EPAC2008

21 Mitigation Coating to reduce SEY –Beam pipe with antechambers with TiN coating was installed into the ring. 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 21 V r = -1 kV 4/200/3 Without TiN Coating Coated at only beam channel part f 90 mm Field free region

22 Mitigation Clearing Electrode –One of the effective cure method in magnet. –Recently, an experiment in KEKB LER has just started. 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 22 Test chamber Monitor Electrode

23 Mitigation Clearing Electrode –Drastic decrease in electron density was demonstrated by applying positive voltage. 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 23 V r = 0 kV Log I e [A] Collectors V elec [V] Details will be reported later.

24 Summary Various measurements, simulations to understand EC properties, and experiments for its mitigation have been performed at KEKB positron ring. Simulation explained the observations well, but questions still remains. Mitigation methods, such as solenoid, coating, duct structure and clearing electrode gave reasonable effect. The solenoid showed a marvelous effect. The cure in magnets is a still remained problem. KEKB will stop next year. We have to utilize it as efficiently as possible. 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ 24

25 Backup slide 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ. 25

26 Diagnostics Beam size blow up: Effect of chromaticity –Blow-up was not observed when the chromaticity was enough high. 2015/5/14ILCDR 2008.07.08 - 11 Cornell Univ. 26 H. Fukuma, ECLOUD02 Vertical: 2.2x10 12 + 5.8x10 9 Q’y Even if DQ’y = 10, size change ~ 3 % Inconsistent?

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