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GRE-65-04 ’ s Justification HE Yuntang China Automotive Technology and Research Centre UNOG , Geneva , 31 March 2011 GRE-65-04 ’ s Justification HE Yuntang.

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Presentation on theme: "GRE-65-04 ’ s Justification HE Yuntang China Automotive Technology and Research Centre UNOG , Geneva , 31 March 2011 GRE-65-04 ’ s Justification HE Yuntang."— Presentation transcript:

1 GRE ’ s Justification HE Yuntang China Automotive Technology and Research Centre UNOG , Geneva , 31 March 2011 GRE ’ s Justification HE Yuntang China Automotive Technology and Research Centre UNOG , Geneva , 31 March 2011 Informal document No. GRE (65th GRE, March 2011, agenda item 14(d))

2 Point 1 Three new samples (lenses or samples of material) shall be exposed to radiation from a source having a spectral energy distribution similar to that of a black body at a temperature between 5,500 K and 6,000 K. daylight spectral energy distribution described in CIE Publication No. 85:1989, Table 4. Three new samples (lenses or samples of material) shall be exposed to radiation from a source having a spectral energy distribution similar to that of a black body at a temperature between 5,500 K and 6,000 K. daylight spectral energy distribution described in CIE Publication No. 85:1989, Table 4.

3 SAE J2527 Figure c2 Daylight filter VS. Sunlight spectral power distribution The spectral energy distribution of sun light described in CIE Publication No. 85:1989, Table 4 is much more accurate than that described with Black body temperature. The spectral energy distribution of sun light described in CIE Publication No. 85:1989, Table 4 is much more accurate than that described with Black body temperature. Point 1 : reason

4 Point 2 Reduce radiations with wave lengths smaller than 295 nm and greater than 2,500 nm, Reduce radiations with wave lengths smaller than 295 nm and greater than 2,500 nm, and the minimum and maximum levels of the relative spectral irradiance in the UV wavelength range are given in Table 1. Spectral passband (λ=wavelength in nm) Minimu m % CIE No. 85:1989, Table 4 % Maxim um % λ< ≤λ≤ <λ≤ <λ≤ Table 1 – Relative spectral irradiance of xenon- arc lamps with daylight filters

5 Point-2: reason Threshold UV Wavelengths  For degradation of polymer material, UV range is severer than visible and IR range.  UV table from ‘CIE Publication No. 85:1989, Table 4

6 Point-3 The samples shall be exposed to The samples shall be exposed to an energetic illumination of 1,200 W/m 2 an energetic illumination of 1,200 W/m 2 ±200 W/m 2 an light source with irradiance of 0.68 ±0.02 W/m 2 at 340nm, for a period such that the luminous energy that they receive is equal to 4,500 MJ/m 2 ±200 MJ/m 2 the radiation energy that they receive is equal to 2,550 ±75 kJ/m 2. of 0.68 ±0.02 W/m 2 at 340nm, for a period such that the luminous energy that they receive is equal to 4,500 MJ/m 2 ±200 MJ/m 2 the radiation energy that they receive is equal to 2,550 ±75 kJ/m 2.

7 Point-3: reason UV is more severe than visible and IR light, exposure of the sample under 50 W/m 2 of UV or IR light for 1000 hours will have totally different result. UV is more severe than visible and IR light, exposure of the sample under 50 W/m 2 of UV or IR light for 1000 hours will have totally different result. It will be more accurate to set the irradiance of the light source base on UV version instead of total irradiance/illumination It will be more accurate to set the irradiance of the light source base on UV version instead of total irradiance/illumination

8 Point-4 In order to ensure a regular exposure, In order to ensure a regular exposure, the samples shall revolve around the source of radiation at a speed between 1 and 5 r/min the irradiance at any position in the area used for specimen exposure shall be at least 80 % of the maximum irradiance. the samples shall revolve around the source of radiation at a speed between 1 and 5 r/min the irradiance at any position in the area used for specimen exposure shall be at least 80 % of the maximum irradiance.

9 Point-4: reason Rotating Drum Xenon Arc Tester Cross Section Hardware based, limiting the use of test equipment Hardware based, limiting the use of test equipment Performance based description is accepted by ISO 4892 Performance based description is accepted by ISO 4892

10 Thank you!


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