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Revolution in RF Test Formula LitePoint

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Presentation on theme: "Revolution in RF Test Formula LitePoint"— Presentation transcript:

1 Revolution in RF Test Formula LitePoint
Black Ma 2014-Apr

2 Who is LitePoint 2

3 LitePoint is

4 LitePoint

5 LitePoint

6 LitePoint Delivers… Innovation at the Intersection of
Presentation Title LitePoint Delivers… Innovation at the Intersection of Wireless Technology and Mass Production Source: Earth 911, Info Dingo

7 LitePoint Consumer Electronics Companies Manufacturers Chipset Makers
Smart Appliances Tablets Smart Phones Consumer Electronics Companies Smart Appliances Audio & Video LitePoint When you think about the 50 billion wireless devices projected to be in the market by 2020, think variety. And think beyond mobile devices. Increasingly complex radios will be found inside an increasingly broad range of products. It’s becoming a very complex and large ecosystem. And to maintain quality and manage wholly unprecedented volume, the entire value chain will need to be in synch. We work with everyone in the value chain. We work with all of the chipset manufactures, most of the device and handset makers, and the tablet and PC makers—anyone that makes a wireless device. We are based in Silicon Valley and are surrounded by the leading chip makers and device makers. We’re right in the middle of the action and can reach them all with a short drive. And, our solutions cover the entire testing process—from silicon to device, from sand to product—so you can rely on test results and transparency throughout the product development lifecycle. NETGEAR uses LitePoint test systems in the lab and then again on the manufacturing line to ensure that they don’t sacrifice quality even as volume increases. Manufacturers Smart Power Grid Consumer Electronics Chipset Makers Billions of Devices Consumer Electronics Consumer Electronics

8 What LitePoint matters with you
--Speed to Market & Cost Savings

9 Innovation Drives Speed to Market
Presentation Title VS To Market Lightning-Fast Test Times VS Ease of Use LitePoint innovations that: Enable speedy rollout in the production environment Reduce training times and provide operator ease of use Speed the testing process per device All drive faster times to market. With faster throughput, you can still meet launch dates even when there are delays receiving product. It also means you’ll be ready to meet increased demand. Implementation Fast VS

10 Maximize Lifetime Value
LitePoint test systems continue to create value and help you save money over time. Starting with the initial adoption that includes the streamlined rollout and faster training. There are also immediate factory footprint savings: when you require fewer, one-box test systems to meet throughput demand, you’ll save the floor space, energy bills, and operator expenses associated with the additional equipment you’d need with another solution. LitePoint systems also help reduce costs associated with daily operating expenses: testing more devices faster and easily switching configurations to test different standards. The average LitePoint test system pays for itself in xx, and over time saves xx hours. (Brad, do we have any data to populate a statement like this)? OPERATING EXPENSES THROUGHPUT Time to market Value Over Time

11 Don’t Sacrifice Quality
Presentation Title Throughput Quality LitePoint Competitors With everyone in the value chain under pressure to increase production and speed time to market, there’s an increasing need for high-throughput test solutions that ensure quality. With LitePoint solutions, you can increase quality even as production rates increase. (insert more from Vernon’s story here)

12 Why LitePoint -- Formular LitePoint 12

13 #1 Cellular multi-DUT Parallel Tester – Y2011
First Parallel Testing Solution

14 Utilization Maximizing Technology (UMT)
Smart Multi-DUT Testing Architecture Optimized resource usage – best utilization Optimized hardware and software integration – highest throughput Key Elements Dynamic Signal Control (DSC) Intelligent Signal Processing Smart Data Export Built in Calibration Point to Point Connections Dynamic Reference Level Control Per DUT Signal Detection Synchronized Captures Parallel Processing Pipelined Data Transfer Smart Data Export Dynamic Signal Control Data Capture Data Processing Data Export Data Processing Data Processing Data Processing DUTs

15 Multi-Channel Measurement Architecture
Traditional Test Architecture supports only one measurement at a time PWR EVM OBW ACLR setup setup setup setup measure measure measure measure fetch fetch fetch fetch IQxstream Architecture Multiple instrument channels support multiple, simultaneous measurements setup Capture PWR Data setup EVM Data setup OBW Data Data setup ACLR

16 Better Test Coverage, Less Test Time
W-CDMA TX test example ILPC ACLR EVM I/Q Imb. Time Power Level 1 Power Level 2 ACLR EVM I/Q Imbalance Power Level (dBm) Slot ILPC I/Q Imb. Time

17 Sequence-Based Test Programming
Presentation Title Traditional Methods require sending instructions to (“setup”) the DUT at the beginning of each measurement in a series of tests Test Time Traditional Non-Signaling DUT + TE setup meas #1 TE setup meas #2 TE setup meas #3 TE setup meas #N IQxstream Method: pre-program a “sequence” (several SCPI commands) only once IQxstream and then execute many times with one command In #2 – Sequence makes testing faster Sequence Based Non-Signaling DUT setup meas #1 meas #2 meas #3 DUT setup meas #1 meas #2 meas #3 Execute test sequence Load the test sequence

18 IQxstream Enables Fastest Throughput
Tester “x” 1 DUT signaling IQxstream 1 DUT non-signaling IQxstream 4 DUT non-signaling Test Speed >2X Improvement Test Speed >6X Improvement 6X More Throughput!

19 Throughput -- more than RF Test Speed

20 Offering Flexibility in Manufacturing (And a smooth transition to automated, multi-DUT testing)
Automated Loading / Panel Test Manual Loading Manual Loading 1-DUT Sequential (1x1 ping-pong) Multi-DUT Asynchronous (4 devices in semi-parallel) Multi-DUT Synchronous (4 devices in 1 chamber) 2013 and before Now When you’re ready

21 Why Does APT Work? (Example: TX Calibration)
1-DUT DUT control, settling time, NV write 30% Utilized 0% 100% 70% Idle 2-DUT 60% Utilized 0% 40% Idle 3-DUT 90% Utilized 0% 10% 4-DUT Nearly 100% Utilized 0% 100%

22 APT Integration Requirements
LitePoint APT easily PnP in any ATE SW with minimal changes required Keys: “Turn off” tester when DUT fails “Turn off” tester when DUT passes “Turn off” tester when DUT finishes (before NVs written) Upper S/W layer does not need to need to be: “Multi-DUT aware” – just starts multiple 1-DUT programs Aware of any other DUT program – all handled through in-box tokens Thread safe Zero Risk to any ATE SW How to implement? Litepoint APT is very easy, which can be easy plugs into existing test driver, no need modify test framework and test flow, very easy.

23 Maximum performance using APT
Asynchronous Parallel Test drivers benefits Application side driver is written as a single threaded driver No shared memory, or application side synchronization required Works with 1 – …n DUT’s. Plugs into existing API’s from any test framework without any architecture changes required. Maximum performance achieved with simple API call to turn off the Generator when testing is completed. (Pass, Fail, Abort, Prior to NVM) Works for both calibration and verification Common core driver can operate in multiple modes of operation Exclusive Resource Maximum distribution Shared Resource Cadence Enforced Mode ( CEM-1, CEM-2, CEM-4) CEM-1 = 1x1x1 CEM-2 = 1x2x2 CEM-4 = 1x4

24 “Asynchronous” Does Not Mean “Chaotic”
New token priority system helps manage asynchronous test processes Key benefits: Ensures maximum operator efficiency in the factory – minimal idle time Asynchronous processes do not need to be aware of other processes DUT #1 DUT #2 DUT #3 DUT #4 Time Unmanaged Asynchronous Processes Maximum Asynchronous Distribution

25 Synchronizing Asynchronous Processes
How do we go from: DUT #1 DUT #2 DUT #3 DUT #4 Here DUT #1 DUT #2 DUT #3 DUT #4 …to here? Asynchronous Synchronous

26 Combining APT & SPT By leveraging token prioritization, the test program can automatically align multiple asynchronous processes Key benefits: Same operational benefit of APT, and eliminates wait time between Cal and Ver Again, asynchronous processes do not need to be aware of other processes DUT #1 DUT #2 DUT #3 DUT #4 Time Asynchronous Processes Synchronous Processes

27 Technology Trends: Multi-DUT and Panel Test 4 / 8 DUT, Asynchronous & Synchronous Parallel Test
1-DUT / Ping-Pong 4 / 8-DUT Asynchronous 4 / 8-DUT Synchronous 1dut to 4dut/8dut to panel testing

28 LitePoint – Continuous Throughput Improvement
Test innovation enabled through close cooperation with chipset providers and OEMs 4 / 8 DUT Parallel Test (WiFi / BT) Throughput IQxel-M First in Multi-DUT Parallel Test (2G/3G/4G) IQxstream MPS FAST PER IQ2010 2008 2011 2013 2014

29 Concurrent Test vs. Serial Test
Traditional approaches test multiple radios serially (“one at a time”) WiFi Bluetooth® Serial testing requires long test times GPS / GNSS FM Serial Tester WiFi BT GPS GNSS FM Test time Concurrent testing Significantly reduces test time Up to 50% IQxel-M offers concurrent testing of multiple radios WiFi WiFi GPS FM BT Bluetooth® GPS/GNSS GNSS FM Test time * DUT O/S must support concurrent test

30 Multi-DUT Configuration
Presentation Title Connectivity VSA Connectivity VSG Signal Routing Broadcast VSG Navigation Example set up of 4 smart phones for WLAN/BT, GPS / GLONASS and FM test

31 Flexible Multi-DUT Testing
Manual Loading Manual Loading Automated Loading 1-DUT Sequential (1x1 ping-pong) Multi-DUT Asynchronous (4 devices in semi-parallel) Multi-DUT Synchronous (4 devices in full parallel) 2013 and before Now When you’re ready a smooth transition to automated, multi-DUT testing

32 Formula LitePoint – Real Cases

33 META Turbo for MTK DUT Fromula LitePoint DUT1 DUT2 DUT3 DUT4

34 CFT Turbo for SpreadTrum
DUT Fromula LitePoint DUT1 DUT2 DUT3 DUT4

35 META Turbo Promotion 2.7 1.4 1.0 Test time/DUT UPH: 1.7x higher
Cal + Verf,MTK ATE GSM 3bands,WCDMA 2bands 148s Boot up 25s Test Time 104s 123s 25s 81s Test time/DUT UPH: 1.7x higher Same Tool, same operation Less stations, operators, and PCs. 55s 55s *Turbo approcah hide all boot up time cost 2.7 1.4 65pcs 1.0 UPH 34pcs 24pcs AG8960 (1-DUT) IQXS (1-DUT) IQXS (4-DUT)

36 Before: you have to Many manufacturers still rely on stacks of large outdated devices, that are expensive and hard to manage. 36

37 Today: You and LitePoint

38 Providing Best Test Economics
Focus on the problem Purpose-built for manufacturing to achieve lowest test cost, highest reliability, and best test yield Operational innovation through Continuity Fault Detection and automated path loss calibration Minimize test costs – maximize product quality Reduce test times while increasing test coverage Pioneering multi-DUT test Maximizing parallelism with minimal resource idle time Future-looking test techniques with concurrent test engines Support Providing wireless measurement expertise – not just instrument support Providing total chipset solutions, enabling optimal performance


40 Global Footprint, Local Support
Copenhagen Chicago Gumi Sunnyvale Chengdu Haifa Tokyo San Diego Shanghai LitePoint offers world-class, local support. LitePoint solutions are fully supported by local LitePoint personnel, often on-site. We’ll help implement in local environments and provide ongoing support. If you’re there, we’ll be there. We have people solving problems, not just products solving problems. We are out there looking to solve the customer’s problem, be your partner, and make sure you get the most out of LitePoint products. Our goal is to delight the local customer. We like to provide global customers with a clone of what we have in Sunnyvale. INSERT examples about custom, local solutions (Taipei?) Taipei Shenzhen

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