2 Field-Programmable Gate Array (FPGA) Configurable Logic Blocks (CLBs)Implement logic using flip-flops and LUTsMultipliers and DSPsImplement signal processing using multiplier and multiplier-accumulate circuitryMemory BlocksStore data sets or values in user defined RAMProgrammable InterconnectsRoute signals through the FPGA matrixI/O BlocksDirectly access digital and analog I/OAt the highest level, FPGAs are reprogrammable silicon chips that are configured to implement custom hardware functionality.They consist of logic blocks (digital logic), programmable interconnects, i/o blocksFPGAs instantly take on a brand new “personality” when you recompile a different configuration of circuitry. Like a CD-RWYou don’t have to understand the low level technical details of FPGAs to use them…For those of you not familiar with FPGAs, an FPGA is a device that contains a matrix of reconfigurable gate array logic circuitry. When an FPGA is configured, it's quite different from programming a processor. The internal circuitry is connected in a way that connects the hardware implementation of the software application. Unlike processors, FPGAs use dedicated hardware for processing logic and do not have an operating system. FPGAs are truly parallel in nature, so different processing operations do not have to compete for the same resources. As a result, the performance of one part of the application is not affected when additional processing or logic is added. Also, multiple control loops can run independently on a single FPGA device at different rates.FPGA-based control systems can enforce critical interlock logic and can be designed to prevent I/O forcing by supervisory control algorithms, or an operator. However, unlike hardwired printed circuit board designs which have fixed hardware resources, FPGA based systems can literally rewire their internal circuitry to allow reconfiguration after the control system is deployed to the field. This is a big advantage in areas where the requirements and IP is changing rapidly.FPGA devices deliver the performance and reliability of dedicated hardware circuitry. A single FPGA can replace thousands of discrete components by incorporating millions of logic gates in a single integrated circuit chip. The internal resources of the chip consist of a matrix of configurable logic blocks and hardcore DSP slices, and these are surrounded by a periphery of communication interconnect and I/O blocks. Signals are routed with the FPGA matrix by programmable interconnect switches and wire routes.Now, a big game changer in the FPGA world over the past few years is the incorporation of hardcore DSP slices. These are like mini DSPs inside the FPGA fabric that can communicate with the outside world with very low latency. DSP slices are ideal for implementing IP for complex mathematics.What is an FPGA?
3 FPGAs - Why Are They Useful? Hard determinism – Realistic simulation timing, local intelligenceOff-load processing – Achieve real-time performance with more complex simulationsCustom Hardware – Create custom H/W instrumentsReconfigurable hardware personalities – Adapt to multiple UUT types and changing UUT interfacesIndustry standard technology – Off the shelf chips used for specific applications get COTS benefits like Moore’s Law
4 FPGAs in HIL Test Systems Test ApplicationIOUUTSignalConditioningLet’s look at how FPGAs fit into a HIL test system architecture. A traditional HIL test system consists a microprocessor connected to IO devices that communicate with the unit under test (UUT).
5 FPGAs in HIL Test Systems PersonalityIOUUTSignalConditioningTest Application<click>When using FPGAs to develop HIL test systems, one or more FPGA devices are placed between the microprocessor and the IO devices allowing them to access the test system tasks being performed by the microprocessor as well as the IO devices communicating with the UUT.
6 FPGAs in HIL Test Systems NI Reconfigurable I/O (RIO) PlatformµPFPGAPersonalityIOUUTTest ApplicationInterfacesHardware I/OInterfacesSignalConditioningTest ApplicationTo implement this test architecture, National Instruments provides a Reconfigurable I/O platform that couples a programmable FPGA with modular signal conditioning interfaces that convert the UUT signals to levels that can be handled by the FPGA.<click>The FPGA can be programmed with traditional hardware descriptive languages or with NI LabVIEW Graphical Development Environment. To improve development efficiency, LabVIEW provides blocks that abstract the communication between the FPGA and the microprocessor and IO interfaces to configurable blocks seen here.Let’s look at some examples of how this architecture is used to create more powerful and flexible HIL test systems.
7 Mechanical Systems – Engine Sensor Simulation µPFPGA(Engine Simulation)I/OUUTRPMsCrankThe grey block in this FPGA personality receives the current engine RPM value from plant simulation executing on the test system microprocessor and the generation of the simulated position sensor output is performed by the block in the middle. The blue block in this personality is used to specify the tooth pattern being used for this particular test.Using this FPGA architecture, the processing necessary to generate the position signal corresponding to engine speed has been off-loaded to the FPGA - increasing the bandwidth available in the microprocessor to perform other test system tasks. Additionally, if the simulation of other mechanically coupled sensors such as a cam shaft sensor was necessary, the FPGA architecture is ideally suited for this task because of the nanosecond timing resolution and true parallelism it provides to preserve this relationship.
8 Free Engine Simulation Toolkit Fully featured for Engine Control Unit (ECU) testingFPGA-based sensor simulation and measurement for ultra-fast pin-to-pin response time & lifetime upgradabilitySeamless integration with NI FPGA hardware and NI VeriStandScalable design for simple to complex ECU testingSuitable for open loop or closed loopOpen source architecture customizable with LabVIEW FPGASupports any NI FPGA deviceDeploy with NI VeriStand 2013 or laterDesign with LabVIEW 2013 or later
9 Engine Simulation Toolkit Building Blocks CPUFPGAECU Event Waveform CaptureAngle Processing Unit (APU)Digital Pattern Generation(i.e. Hall)ECU Event Waveform CaptureDigital Pattern GenerationECU Event Waveform CaptureDigital Pattern GenerationDirectional Sensor SimulationAnalog Replay (i.e. VR)Directional Sensor SimulationAnalog Data ReplayDirectional Sensor SimulationAnalog Data ReplaySlide has animationsNote we will not talk about the individual IP here, we do that later. This is just the overview.The easiest way to describe how to create an engine controller HIL with a CPU and FPGA is with a block diagram showing the building blocks of the tester. First we start with the Engine Physics model running on the CPU. This talks back and forth with the FPGA personality built with the position simulation libraries provided by NI.Animate. The main block in the FPGA is the Angle Processing Unit (APU) that takes speed from the physics model and simulates the rotational position of the engine.Animate. It makes the variables for Speed, Crank Angle, and Cycle Angle available to the entire FPGA (like a global variable) so additional FPGA logic can be tied to speed or position easily.Animate. We can attach foundational FPGA IP libraries like Digital Pattern Generation, Analog Data Replay, and ECU Event Timing Capture to this variable easilyAnimate. We can also attach any other IP like ECU Event Waveform Capture, Directional Sensor Simulation, and Knock Sensor simulationAnimate. Finally, we can add any number of these IP blocks to do more stuff on a single FPGA. This means you can customize your particular FPGA personality depending on what your needs are and take advantage of the cost savings of a small FPGA or the flexibility of a large FPGA. As newer FPGAs are released giving more size for less $, you benefitKnock Sensor SimulationECU Event Timing Capture(Inject & Ignite)Knock Sensor SimulationECU Event Timing CaptureKnock Sensor SimulationECU Event Timing CaptureSpeed, Crank Angle, Cycle Angle
10 Engine Simulation Toolkit Roadmap ItemOld AES LibraryAngle Processing Unit (APU)2 and 4 stroke enginesDigital Pattern GenerationN-M Teeth GenerationCustom Edges GenerationAnalog ReplayPlay back any file by angleECU Event MeasurementDigital input timing capture of single event per cycleKnock SensorN/ADirectional Speed SensorFPGA space utilizationBaselineThe AES library has a long history at NI and many customers have used it and provided us feedback.
11 Engine Simulation Toolkit Roadmap ItemOld AES LibraryEngine Simulation ToolkitAngle Processing Unit (APU)2 and 4 stroke enginesImproved usabilityDigital Pattern GenerationN-M Teeth GenerationCustom Edges GenerationAnalog ReplayPlay back any file by angleECU Event MeasurementDigital input timing capture of single event per cycleWindowing, multi-event per cycle, error detection, & improved usabilityKnock SensorN/APseudorandom, amplitude & probability per cylinder.Directional Speed SensorDifferent forward/reverse digital pulse width triggered at tooth centersFPGA space utilizationBaseline3x Reduction
12 Engine Simulation Toolkit Roadmap ItemOld AES LibraryEngine Simulation ToolkitQ4 2014Angle Processing Unit (APU)2 and 4 stroke enginesImproved usabilityDigital Pattern GenerationN-M Teeth GenerationCustom Edges GenerationAnalog ReplayPlay back any file by angleECU Event MeasurementDigital input timing capture of single event per cycleWindowing, multi-event per cycle, error detection, & improved usabilityAnalog input thresholding and waveform captureKnock SensorN/APseudorandom, amplitude & probability per cylinder.Directional Speed SensorDifferent forward/reverse digital pulse width triggered at tooth centersFPGA space utilizationBaseline3x ReductionIn q we will be releasing new IP for ECU event waveform capture & thresholding
13 Space and performance comparison PXIe 8130PXIe 1082AES Library1 APU1 N-M generation4 Fully Custom generation1 Analog Replay12 Event CaptureEngine Simulation Toolkit5 Digital Pattern GenerationSlices6,703 of 17,280 (38.8%)3,159 of 17,280 (18.3%)Registers14,882 of 69,120 (21.5%)5,912 of 69,120 (8.6%)LUTs19,702 of 69,120 (28.5%)8,239 of 69,120 (11.9%)DSP24 of 64 (37.5%)2 of 64 (3.1%)BRAM21 of 128 (37.5%)13 of 128 (10.2%)40 Mhz Max42.6965.35Compile time37 minutes21.7 minutesRT LoopDuration305 to 335 uS138 to 186 uS w/ RIO to 165 uS w/ RIO 15.0
14 Reconfigurable I/O Interfaces V6 ECUµPFPGAI/OV8 ECUThe ease with which FPGAs can be reconfigured to create custom hardware IO interfaces makes it possible to build a single HIL test system capable of adapting to multiple UUT types as well as changes to a UUT interface that occur during the development process. For example, a single HIL test system can be used to test several types of engine control units by simply changing the FPGA personality to provide the appropriate IO interface between the HIL test system and the unit under test.Multiple UUT typesEvolution of UUT interface
19 Example FPGA: APU + 1 Analog Replay Load Look Up TableWalk through this.Left most loop loads the memory with the look up table data from the host.Top loop is the APU, which writes to the registers (the globals) of speed, crank & cycle angle.Bottom right loop is the playback loop going out AO0 of this cardPlay Look Up Table
20 Example FPGA : APU + 2 Analog Replay Same as last one but we dropped two of the replay load loops instead of one and there are two playback subVIs instead of 1.
27 Knock Sensor Simulation Configuration Leverages FPGA technology to provide true pseudorandom generationConfigurable probability (0-100%) and amplitudeBase frequency can be hard coded or scale with engine speed
31 Directional Speed Sensor Generates pulses of different widths, depending on forward (Tf) or reverse (Tr) rotation, when passing tooth centersPulse slightly delayed from center by variable microseconds (Td)Directional sensor: forwardDirectional sensor: reverseCrank
35 Example FPGA : Typical MPI Injection Measurement (1 x Cylinder) Event measurement block outputs:Stuck active (Boolean)Window all active (Boolean)Window orphan start edge (Boolean)Window orphan end edge (Boolean)Digital InputThe measurement block does event measurements with respect to the window and time and has some general outputs about the measurement, mostly concerning errors. It will let you know if the event has stuck active because its been active longer than the timeout. It will also let you know if the event is active the whole window, or if there were orphaned start and end edges of an event inside the window (meaning half an event was present).ECU event timing input can be done with any speed digital inputs and does not need to be in an SCTL. The resolution and accuracy of the data will reflect the speed of the digital inputs.Event capture latches in data about a specific event # inside the window. You set which event you’re interested in latching the data for and it grabs if it was present, start angle, end angle, and duration.Max and Min angle can wrap 0. For example a valid window is degrees. So is -100 to 200 degrees.Capture outputs are in respect to a reference angle specified during host configuration. So if the start angle is 490 degrees and the reference angle is 500 degrees the start angle = -10 degrees. (Reference angle correction is actually done on host, not FPGA)Event measurement block settings:Angle Max (degrees)Angle Min (degrees)Active High (Boolean)Time based ‘stuck active’ timeout (milliseconds)Event capture block outputs:Event Present (Boolean)Start Angle (degrees)End Angle (degrees)Duration (milliseconds)
36 Example FPGA : Typical GDI or Diesel Injection Measurement (1 x Cylinder)
37 Example FPGA : Typical GDI or Diesel Injection Measurement (2 x Cylinder)
38 Example FPGA : Customize Windowing Per Event Here you can apply a window (min/max angle) for capture on each event on a single digital pin in any configuration you like
41 Generation and measurement of two events neither wrapping 0 and window does not wrap 0 This is a prototyping UI I used during development.
42 Generation of one event wrapping zero and one not wrapping zero; window wraps zero and measures both This is a prototyping UI I used during development.
43 Start of a full cycle event within window, causing an orphan start edge and a stuck active flag This is a prototyping UI I used during development.
44 End of full cycle event within next window, causing an orphan end edge This is a prototyping UI I used during development.
45 Future* FPGA : Typical GDI or Diesel Injection Timing & Waveform Measurement Analog InputThresholdingTiming Measurement and CaptureHere you can apply a window (min/max angle) for capture on each event on a single digital pinWaveform capture*Q4 2014
46 Case Study Application Creating a flexible HIL test system with I/O interfaces that require custom timing and synchronization schemes not easily implementable with traditional hardware.NI ProductsLabVIEW FPGA Module, PXI, and Reconfigurable I/O (RIO) hardwareKey BenefitGaining the ability to efficiently create custom hardware interfaces that can be reconfigured after deployment to adapt to different ECU types and changes to ECU interfaces."With LabVIEW FPGA and RIO hardware we were able to quickly and efficiently design custom analog and digital interfaces for our HIL test system.”– Roy Kranz, Wineman Technology Inc.HIL test system provider, Wineman Technologies, uses LabVIEW programmed reconfigurable IO devices in all of their HIL test systems because they provide the ability to quickly and efficiently design custom IO interfaces that can be easily reconfigured to adapt to different ECU types as well as changes to ECU interfaces.
47 SummaryFPGA-based I/O interfaces are used to expand the capabilities and performance of HIL test systems.Hard determinism – Realistic simulation timing and local intelligence with 25 ns resolutionOff-load processing – Achieve real-time performance with more complex simulationsCustom Hardware – Create custom H/W instrumentsIndustry standard technology – Off the shelf chips used for specific applications get COTS benefitsReconfigurable hardware personalities – Test multiple UUT types and adapt to changes in UUT interfaces without changing hardwareFPGAs enable test system developers to create custom hardware that can be easily reconfigured without physically modifying the device. In addition to being reconfigurable, for certain applications, FPGAs can offer superior performance compared to microprocessors due to the true parallelism and nanosecond determinism they provide.In today's presentation, we looked at several examples of how the hard determinism, ability to off-load processing from the test system microprocessor, and capability to create custom, reconfigurable IO allow HIL test system developers to lowering total system cost and improving its performance.