Presentation on theme: "A Comparison of Touch & Optical CMM Probes for the International STEP-NC Demonstration (Renton, Wa. 2009) Eric Tingle Western Regional Sales Manager /"— Presentation transcript:
A Comparison of Touch & Optical CMM Probes for the International STEP-NC Demonstration (Renton, Wa. 2009) Eric Tingle Western Regional Sales Manager / Mitutoyo America Corporation Scott Harsila Mechanical Engineer / Micro Encoder, Inc. Larry Maggiano CTL Senior Systems Analyst / Mitutoyo America Corporation 15 May 2009 Copyright Mitutoyo America Corp. 2009
Measurement Scenario Copyright Mitutoyo America Corp AP238 v1 enables Measurement in – Touch Trigger Probe equipped MCs and CMMs to 1.Establish Coordinate Systems (6 DOF) 2.Measure Features for Datum Reference Frames 3.Measure vectored surface points 1.Construct multi-point Features 2.Tolerance to GD&T standards What may be required in AP238 v? to – Enable 3D Optical Sensing for tasks 1 to 4 above?
Native CAD Model (Courtesy Boeing Corp.) Measurement Point(s) defined as CAD Entities
CMM with Touch Probe
CMM Touch Probe Results
AP238 Touch Probe Considerations Touch Probe points for Datum Features? – Define touch points explicitly? Task uncertainty to tolerance ratio? Point “tunneling” accuracy? – Maximum limit? Min/max stylus tip diameter? – Appropriate for surface curvature & clearance? – Contact averaging effect?
CMM with Optical Probe
CMM Optical Probe Results
AP238 Optical Probe Considerations Use Optical Probe points for Datum Features? – Or use point set from touch probe measurement? Task uncertainty to tolerance ratio? Min/max point density per Feature? Parameters for outlier removal (filtering)? Parameter for trimming, as an offset from Feature boundaries, for ‘over scanned’ points?
AP238 Scenario Results Defined touch probe points are extractable Optical probes are applicable Probe type (optical, scanning or touch trigger) defined for Working Steps Data from different sensor types is comparable Copyright Mitutoyo America Corp. 2008