Presentation on theme: "Advanced ITC Presentation A. Pogiel J. Rajski J. Tyszer."— Presentation transcript:
Advanced ITC Presentation A. Pogiel J. Rajski J. Tyszer
2 Motivation volume reduction higher than scan chains / channels ratio high observability of scan cells for wide range of X-profiles design simplicity minimum control information Reliable test response compactor
6 Synthesis algorithm Generate randomly a polynomial Verify sharing of mask bits Determine rank Repeat 1÷3 for several polynomials Accept poly with the highest rank Repeat 1÷5 for all outputs
7 Linear independence DAC 2001 specified bits 32 mask bits New
15 control data encoding Constants provided on a per pattern basis Asserting all variables turn off low power test 0 1 c 1 + c 3 + c 7 = 0 c 2 + c 4 + c 7 = 1 c 3 + c 5 + c 6 = 0 c n c n-1 … c 2 c 1 c 0
16 clock gater control data Design Specified bits per cube Gated FFs by one cube FFs per specified bit FFs with gated clocks (%) D17.694212461 D27.65016570 D315.6443328491 D45.155310752 Average9.0160714568 Specified bits refer to bits provided by scan to shut off flip-flops
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