Deane K. Smith & Ron Jenkins Tuition Waivers XRF: Thomas Kubic – John Jay College of Criminal Justice, U.S.A. XRD I: Quan Fan – State University of New York at Binghamton, U.S.A. Kenesha Wilson – University of the West Indies, Jamaica, W.I. XRD II : Stephen Burns – University of Rochester, U.S.A. Cynthia Day – Wake Forest University, U.S.A.
XRF Faculty John Anzelmo, Anzelmo and Assoc., Inc. Larry Arias, Bruker AXS, Inc. Eugene Bertin, Emeritus, RCA Labs. Richard Bostwick, Spex CertiPrep Dave Coler, PANalytical Larry Creasy, TIMET Tim Fawcett, ICDD Al Martin, Rigaku MSC, Inc. Mary Ann Zaitz, IBM Microelectronics
XRD Faculty Thomas Blanton, Eastman Kodak Company Kurt Erlacher, Bruker AXS, Inc. John Faber, ICDD Tim Fawcett, ICDD Lori Fields, Rigaku MSC, Inc. C.M. Foris, DuPont Central Research & Development Suri Kabekkodu, ICDD Jim Kaduk, Innovene W. Frank McClune, ICDD Fangling Needham, ICDD Sue Quick, The Pennsylvania State University Mark Rodriguez, Sandia National Laboratory Earle Ryba, The Pennsylvania State University Charles Weth, ICDD Steve Williams, PANalytical
Manufacturer Participation XRF Bruker S4 Explorer (WDS) PANalytical Epsilon 5 (EDS) Rigaku Mini ZSX (WDS) XRD I Bruker D4 Rigaku Miniflex XRD II Bruker D4
In their own words…….. “Exactly what I was looking for after first getting into XRF a year and half ago”…2005 XRF Clinic Attendee “A week well spent!”….. 2005 XRD II Clinic Attendee “Very well presented and done in a comfortable atmosphere”….2005 XRF Clinic Attendee
ICDD 2006 Clinics! Practical X-ray Fluorescence April 24-28, 2006 Fundamentals of X-ray Powder Diffractometry June 5-9, 2006 Advanced Methods in X-ray Powder Diffractometry June 12-16, 2006