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Published bySage Hazel Modified about 1 year ago

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h < 1

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Rekombinasjon via tilstand i bandgapet

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h < 1

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Spreading of a ’spike’ of electrons by diffusion t 1 < t 2 < t 3

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D n (cm 2 /s) D p (cm 2 /s) μ n (cm 2 /Vs) μ p (cm 2 /Vs) Si Ge GaAs Diffusjonskonstanter og mobiliteter ved 300 K i intrinsiske materialer (jfr ’Streetman’ Table 4-1) V

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Current entering and leaving a volume ΔxA Kontinuitetslikningen!

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= p 0 + δp(x) δp(x)

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Deplesjonsone EE VpVp VnVn Electrostatic potential Energy bands V0V0 Current Particle flow qV0qV0 E Cn E Vn E Fn E Fp E Cp E Vp EVEV ECEC ECEC EVEV EFEF EFEF

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-V0-V0

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Equilibrium (V = 0) Forward bias (V = V f ) Reverse bias (V = V r ) Particle flow Particle flow Particle flow Current EEE E Cp E Vp E Cn E Vn E Fp E Fn VpVp VnVn V0V0 (V 0 -V f ) (V 0 +V r ) qV0qV0 q(V 0 -V f ) q(V 0 +V r )

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+- W Figure 5.15 (a): Minority carrier distributions on the two sides of the transition (depletion) region for a forward-biased junction. The figure provides also definitions of distances x n and x p measured from the transition (depletion) region edges.

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I = I p + I n = konstant W

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Avalanche (skred) gjennombrudd Figure 5.21: Electron-hole pairs generated by impact ionization; (b) a single ionizing collision by an incoming electron and (c) primary, secondary and tertiary collisions. (b)(c)

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GeSiGaAsGaAsP

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(Diffusjon) Rekombinasjon og generasjon Jeppson

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Vakuumnivå Schottky kontakt på n-type halvledere

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Schottky kontakt på p-type halvledere Vakuumnivå

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Ohmsk kontakt n-type m < s Figure 5.43

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Ohmsk kontakt Figure 5.43 p-type m > s

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Figure 5.42 Forward bias Reverse bias VrVr V

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