Presentation is loading. Please wait.

Presentation is loading. Please wait.

1 5000 SERIES CURVE TRACER ATE MULTI-PURPOSE TEST SYSTEM Curve Tracer Range of Devices Range Extensions Device Screening/Characterization/ Incoming Inspection.

Similar presentations


Presentation on theme: "1 5000 SERIES CURVE TRACER ATE MULTI-PURPOSE TEST SYSTEM Curve Tracer Range of Devices Range Extensions Device Screening/Characterization/ Incoming Inspection."— Presentation transcript:

1 SERIES CURVE TRACER ATE MULTI-PURPOSE TEST SYSTEM Curve Tracer Range of Devices Range Extensions Device Screening/Characterization/ Incoming Inspection Typical Prober Production ATE Scanner with Fixture Multi Packaged Device Testing 50/100A 1KV/2KV (972)

2 ADAPTORS ADP-401A-8 (4x8 Matrix) ADP-401A-16 (4x16 Matrix) The Pin Programmable Scanner is used for testing multiple devices, mixed pin packages, opto-couplers, opto-logic, and other similar devices. Any input (drive/sense) can be programmed to any of 8 or 16 output pins. A personality module contains a socket for a specified package type. The pins of the package can be connected to any of the input drives for a given test step. Bias supplies can be added. PIN PROGRAMMABLE SCANNER 30A/1200V ADP-401A-8 Assignable Pins for Multiple Device Packages Simplified Diagram ADP-401A-8/16 Return to Main PageMain 2

3 Max IDIncrement Change2nd Increment VDS End VGS End VGS Increment 1st Increment VGS Start VDS Start Return to Main PageMain Continue Videos: Real-time curve example 3

4 Continue EXPORT DATA TO EXCEL Return to Main PageMain Back 4

5 A 16 bin handler interface and Logic Prober interface are available as options. Customer may specify handler and interface requirements. Bins or Sorts can be binary coded for use with wafer probers. STI 5300HX Pictured with Signatone Prober HANDLER / PROBER INTERFACE Return to Main PageMain 5

6 available on 5300HX EXTENDED HIGH CURRENT HC-500 (500A) HC-1000 (1000A) HC-1200 (1200A) On-state current tests such as VT, VF, VCESAT, VDSON and RDSON can be extended to the limits indicated above by use of the High Current Deck (pictured). RANGE EXTENSIONS Return to Main PageMain See Low Current DeckLow Current Deck 6

7 EXTENDED LOW CURRENT Leakage test low end can be extended downward to measurements as low as 20pA with a 1pA resolution using the Low Current Deck (pictured). Low Current Deck is also shown connected to the tester for testing from the handler. LC-1000 Return to Main PageMain 7

8 Additional curves can be added using any test available. These include but are not limited to transistor, triac, SCR, MOSFET, IGBT, OVP, gated device, diode, zener, opto-coupler, regulator, MOV, J-FET, opto-switch, diac, opto-logic, Quadrac®, sidac, STS, SBS, and relay. MOSFET N-Channel ID vs. VDS (at range of VGS) ID vs. VGS (at range of VDS) IS vs. VSD RDSON vs. VGS (at fixed ID) RDSON vs. ID (at several VGS) IDSS vs. VDS (Reverse Bias Selectable) VGSTH vs. ID MOSFET P-Channel ID vs. VDS (at range of VGS) ID vs. VGS (at range of VDS) IS vs. VSD RDSON vs. VGS (at fixed ID) RDSON vs. ID (at range of VGS) IDSS vs. VDS (Reverse Bias Selectable) VGSTH vs. ID Transistor NPN HFE vs. IC BVCE (O, S, R, V) vs. IC BVEBO vs. IE ICBO vs. VCBO VCE (SAT) vs. IC (at fixed IC/IB ratio) VCE (SAT) vs. IB (at range of IC) VBE (SAT) vs. IC (at fixed VCE) IC vs. VCE (at range of IB) (Curve Tracer Only) IEBO vs. VEB ICEO vs. VCE Transistor PNP HFE vs. IC BVCE (O, S, R, V) vs. IC BVEBO vs. IE ICBO vs. VCBO VCE (SAT) vs. IC (at fixed IC/IB ratio) VCE (SAT) vs. IB (at range of IC) VBE (SAT) vs. IB (at fixed IC/IB ratio) VBE (ON) vs. IC (at fixed VCE) IC vs. VCE (at range of IB) (Curve Tracer only) IEBO vs. VEB ICEO vs. VCE IGBT N-Channel IC vs. VCE (at range of VGE) IC vs. VGE (at range of VCE) ICES vs. VCE IF vs. VF VCE vs. VGE STANDARD CURVES CURVE TRACER CURVES AVAILABLE Return to Main PageMain Continue 8

9 IGBT P-Channel IC vs. VCE (at range of VGE) IC vs. VGE (at range of VCE) ICES vs. VCE IF vs. VF VCE vs. VGE Diode IF vs. VF IR vs. VR Zener IF vs. VF IZ vs. BVZ Triac IT vs. VT+ (at fixed IG and RGK open) IT vs. VT- (at fixed IG and RGK open) SCR IT vs. VTM (at fixed IG and RGK open) SSOVP IT vs. VT+ (at fixed IBO) IT vs. VT- (at fixed IBO) SIDAC IT vs. VT+ (at fixed IBO) IT vs. VT- (at fixed IBO) DIAC ID vs. VF+ ID vs. VF- Regulator Positive Electronic Load vs. VOUT (at fixed IMAX) Regulator Negative Electronic Load vs. VOUT (at fixed IMAX) JFET N-Channel ID (OFF) vs. VDS (at range of VGS) ID (OFF) vs. VGS (Reverse Bias) (at fixed VDS) ID (ON) vs. VDS (at range of VGS) ID (ON) vs. VGS (Reverse Bias) (at fixed VDS) JFET P-Channel ID (OFF) vs. VDS (at range of VGS) ID (OFF) vs. VGS (Reverse Bias) (at fixed VDS) ID (ON) vs. VDS (at range of VGS) ID (ON) vs. VGS (Reverse Bias) (at fixed VDS) Other Curves Negative V vs. 1 (on state negative resistance devices, requires Load Box) Positive V vs. I (on state negative resistance devices, requires Load Box)V vs. I Quadrants I and III V vs. I Quadrants I and III STANDARD CURVES CONT’D Return to Main PageMain 9

10 ATE TEST PROGRAMMING Creating and editing test programs for the STI 5000E and 5300HX are both easy and intuitive. Each test program contains a series of test steps (these steps can be actual device tests or calculations), bin/sort plan, and if required, relay plan. Test steps are added or edited with a single or double mouse click. A device test window By default all programmed test steps are set to pass on SORT/BIN 1. Each test step may be set for pass, fail or do not care for each sort. Each sort may be set to any of the logical bins. Binning and sorting can be as simple as running all of the programmed test steps and then finding the first qualifying sort or as complex as branching on the first non-qualifying test to the next valid sort. In this more complex mode it is quite possible that only a subset of the programmed tests will be run on a given device and that all devices tested may not run the same subset of test steps. Four to fifteen (depending upon options supplied with the STI tester) relay drivers can be assigned to any programmed test step. These relay drivers can be used to provide external loads or connections for a given device test. BINNING / SORTING EXTERNAL RELAYS or calculation window is opened. In the device test window the limit parameter value is entered along with, if applicable, other bias voltages or currents (one of the biases can be a calculation), load resistors, etc. In the calculation window the calculation limit is entered along with the name and units to be used in displaying the results and then the actual calculation which may reference any test result from a previously entered device test. Continue Return to Main PageMain 10

11 TO-220/218 TO-72 TO-5/18 TO-92 TO-3/66 Axial (small and large) DP-4/5 8 Pin DIP 6 Pin TO-5 SOT-23, SOT-24, SOT-25, SOT-26 D-PAK TO-252 SOT-89 TO-243 A selection of fixtures is available, including: D2-PAK SOT-223 TO-261 SMA SMB SMC MELF (MINI-MELF, MICRO-MELF) SO-4, SO-6, SO-8, SO-16 SOD-123, SOD-323, SOD- Custom Fixtures (made for any device type for which a socket is commercially available) Blank A 16 bin handler interface and Logic Prober interface are available as options. Customer may specify handler and interface requirements. Bins or Sorts can be binary coded for use with wafer probers. Return to Main PageMain 11

12 PERFORMANCE A six test step MOSFET test program (VGSTH, BVDSS, RDSON, 2 VGSON and GFS calculation) takes approximately 96 milliseconds to run and provides a throughput of up to 37,440 devices per hour. The 5000E and 5300HX systems incorporate single test measure techniques to assure a measured value with only one application of stimulus, including tests such as hFE. This minimizes test time, minimizes internal device heating and maximizes throughput. Proven Technology High Speed Datalog 1 KHZ Zener Impedance 2NA to 50 Standard, 100A Optional 500A / 1000A / 1200A (available only on 5300HX) 1KV Standard, 2KV Optional 0.1NA Resolution RDSON to.01m Ω Resolution 96 Tests 99 Sorts Branching Optional Handler Interface Optional Prober Interface Programmable Relay Drivers Auto Calibration Self Test Data Management THROUGHPUT 5000E & 5300HX FEATURES TEST METHODS Model 5300HX Optional tests can be created for connection to external test equipment High resolution assures tests like RDSON to an accuracy of ± 0.5 milliohm at 1 A test current. Return to Main PageMain 12

13 The Series 5000 Curve Tracer provides all of the functions of our 5000E and 5300HX with the added ability to create digital curves for storage and intuitive manipulation. Curves are generated using high speed ATE test steps to build the curve point by point. Captured curves and data can be loaded into Excel® for later use.. Click on Curve to continue CURVE TRACER Return to Main PageMain 13 Continue

14 STI TESTER MODELS Return to Main PageMain Model 5300HX Semiconductor Tester Model 5000E Semiconductor Tester Continue 14

15 GRAPH CURVE AND DATA TO EXCEL Return to Main PageMain 15

16 CURVE TRACE VIDEO Back Return to Main PageMain 16

17 ATE VIDEO Back Return to Main PageMain 17

18 18 Export Data to Excel Return to Main PageMain Real-Time Datalog Example Videos:

19 REAL-TIME DATALOG EXAMPLE Back Return to Main PageMain 19

20 ClickClick to Continue TEST PROGRAMMING Return to Main PageMain 20

21 CAPTURE DATA POINTS AND GRAPH TO EXCEL See Available CurvesAvailable Curves Return to Main PageMain Back 21

22 Click on each schematic to see tests available for each device type Return to Main PageMain 22

23 DIODE BackBack to Devices Return to Main PageMain 23

24 ZENER BackBack to Devices Return to Main PageMain 24

25 TRANSISTOR NPN / TRANSISTOR PNP BackBack to Devices Return to Main PageMain 25

26 Select GFS at Add Menu Multi-Test (Available for N or P Channel) MOSFET N-CHANNEL / MOSFET P-CHANNEL BackBack to Devices Return to Main PageMain 26

27 Select GFE at Add Menu Multi-Test (Available for N or P Channel) IGBT N-CHANNEL / IGBT P-CHANNEL BackBack to Devices Return to Main PageMain 27

28 Current sense Ratio® (r) requires ADP-508 Adaptor ISENSE is measured. Ratio is determined with a calculation step as: r = ID/ISENSE All other tests are standard Mosfet tests. HEX SENSE BackBack to Devices Return to Main PageMain 28

29 POS GATED OVP / NEG GATED OVP BackBack to Devices Return to Main PageMain 29

30 JFET N-CHANNEL / JFET P-CHANNEL BackBack to Devices Return to Main PageMain 30

31 Scroll bar pulled down to show the rest of the available Base Driven Coupled Reverse LED IF IB VCESAT VSAT IF OPTO COUPLER NPN / OPTO COUPLER PNP BackBack to Devices Return to Main PageMain 31

32 Click here for Line and Load Regulation Testing Details. Click here for Voltage Reference Testing Details. Line regulation: Vout is measured with two different line voltages and the results are used to calculate Line Regulation Load regulation: Vout is measured with two different load currents and the results are used to calculate Load Regulation Reference current: VREF is measured with a short and through a 10K resistor, and the results are used to calculate Reference current. REGULATOR NEG / REGULATOR POS BackBack to Devices Return to Main PageMain 32

33 Scroll bar pulled down to show the rest of the available tests. TRIAC BackBack to Devices Return to Main PageMain 33

34 SCR BackBack to Devices Return to Main PageMain 34

35 OPTO LOGIC BackBack to Devices Return to Main PageMain 35

36 TVSDIODE / MOV BackBack to Devices Return to Main PageMain 36

37 Scrollbar pulled down to show the rest of the available tests. SSOVP BackBack to Devices Return to Main PageMain 37

38 RELAY BackBack to Devices Return to Main PageMain 38

39 QUADRAC BackBack to Devices Return to Main PageMain 39

40 Scrollbar pulled down below to show remaining tests 5 PIN MODULE I AND II BackBack to Devices Return to Main PageMain 40

41 SIDAC BackBack to Devices Return to Main PageMain 41

42 STS BackBack to Devices Return to Main PageMain 42

43 TVSDIODE / MOV BackBack to Devices Return to Main PageMain 43

44 POS GATED OVP / NEG GATED OVP BackBack to Devices Return to Main PageMain 44

45 DIAC BackBack to Devices Return to Main PageMain 45

46 Line Regulation = V01-V02 Load Regulation = V01-V02 VIN1 VIN2 (A) IL (G) (K) Vo VIN1 (A) IL1 IL2 (G) (K) Vo VO1 is measured at VIN1 with programmed IL VO2 is measured at VIN2 with same IL Calculate step: VO in mV or % VO1 is measured at IL1 with programmed VIN VO2 is measured at IL2 with same VIN Calculate step: VO Fixed or Adjustable Regulator REGULATOR CALCULATED PARAMETERS BackBack to Devices Return to Main PageMain 46 Back

47 Reference Current Calculated (Real Time) Using 2VREF Tests IREF = (VREF2 –VREF1) VREF1: Short K to REF VREF2: 10K(ANET) to REF 10K REF SHRT (G) (A) VREF1 = SHRT VREF2 = 10K K A (K) IKIK 10K Calculate step: VREF: VREF is Measured in a Single Step IREF : IREF CALCULATED Back Back to Devices Return to Main PageMain 47

48 Anode, Gate, Cathode can be assigned to any pin per test. SAMPLE SCANNER PLAN BackBack to Devices Return to Main PageMain 48

49 REAL-TIME CURVE EXAMPLE Back Return to Main PageMain 49


Download ppt "1 5000 SERIES CURVE TRACER ATE MULTI-PURPOSE TEST SYSTEM Curve Tracer Range of Devices Range Extensions Device Screening/Characterization/ Incoming Inspection."

Similar presentations


Ads by Google