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NIST Synchrotron Measurement Science Vision at NSLS Establish structure function relationships for rational materials design to promote innovation and.

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Presentation on theme: "NIST Synchrotron Measurement Science Vision at NSLS Establish structure function relationships for rational materials design to promote innovation and."— Presentation transcript:

1 NIST Synchrotron Measurement Science Vision at NSLS Establish structure function relationships for rational materials design to promote innovation and industrial competitiveness Developing and exploiting new experimental methods, detectors and physics approaches in synchrotron materials science A suite of three beamlines spanning the entire periodic table! U7A, going strong X23A2 online 4/05 X24A, make over U7A: NEXAFS, XPS X23A2: XAS X24A: XPS, NEXAFS

2 Soft Matter Science at NSLS II Needs and Opportunities Soft Matter: Treat me nicely! Physician do no harm - Hippocrates Love me tender, Love me true - Elvis Dan Fischer Material Science & Engineering Laboratory National Institute of Standards and Technology Gaithersburg, Maryland NSLS II Workshop July 18, 2007 Soft Matter Breakout Session

3 NSLS II Soft Matter Science Needs Some NEXAFS Collaboration Examples from U7A Dean DeLongchamp (NIST): Organic electronics (some details next) Vivek Prabhu (NIST): Photolithography PAG chemical depth profiling Steve Hsu (NIST): MEMS lubrication; Organosilanes / silicon; chemistry / tribology Joe Lenhart (Sandia): Molecular orientation, solvent and stress induced polymer films Lin Loo (U.of Texas, Austin): molecular electronics, Solvent-Dependent Assembly of Terphenyl- and Quaterphenyldithiol on Gold and Gallium Arsenide\ Gary Mitchell (Dow Chemical): PLED and Catalysts Jan Genzer (NCSU, Raleigh): Gradient SAMs Ed Kramer (UC Santa Barbara) and Chris Ober (Cornell): UV active SAMs, nonstick coatings, and organic electronics Dave Castner (U. of Wash, NESAC/Bio): Biomaterials; proteins, DNA

4 Printed organic components for ubiquitous electronics (NIST internal initiative, Dean DeLongchamp) NOT a replacement for silicon: new products from new materials and new methods of production Large area / flexible Designed functionality (bio) Rapid prototyping self-destructs orders refills rollable photovoltaics © Iowa Thin Film sensor pack power supply processor & RFID communication display

5 carbonyl alkene incident soft X-rays = 90° = 20° E 90° E 20° NEXAFS for chemical conversion NEXAFS for molecular orientation T6 heated to 200 °C Soluble and printable Convert at °C Carrier mobility up to ~0.05 cm 2 /V·s Film thickness from 20 nm to 3 nm (~1 monolayer) Soluble oligothiophene precursors In collaboration with J.M.J. Fréchet, D. DeLongchamp (NIST)

6 Primary Chemical Structure Processing Film Structure and Chemistry Performance (Mobility) Clear correlations of field effect mobility to chemistry & microstructure Demonstration of NEXAFS as a microstructure evaluation tool for organic semiconductors Reveals consequences of molecular design on both microstructure & performance Mobility: from saturation regime analysis (OFETs) Chemistry: from carbonyl and alkene peaks Orientation: from peak area vs. electric field vector Coverage: from Oxygen Auger analysis T6 correlation Adv. Mater. 17, p2340 (2005) Series conversion & coverage Chem. Mater. 17, p6033 (2005) Series orientation vs. molecular design J. Phys. Chem. B 110 p10645 (2006) sub-monolayer

7 Soft Matter Science Needs / Opportunities: NSLS II Soft Bends - NEXAFS and XPS Create in one beamline a broad energy range for spectroscopy; ~50 to ~3000eV High energy resolution; very bright source Small beams sometimes; nano-tribology Big beams (1 cm x 1 cm); gradients and arrays; U7A Continue U7A focus on detector development (EY/FY) (Imaging XPS, NIST high resolution X-ray detector) Continue U7A focus on high throughput measurements

8 NSLS II soft bends 3-pole wigglers / NSLS Brightness and Flux Comparison

9 NSLS II Soft Bends - NEXAFS and XPS Create in one beamline a broad energy range for spectroscopy; ~50 to ~3000eV

10 U7A U8 U7A NIST and NSLS team to develop first NSLSII Soft Bend Beamline (at NSLS U8) FY08/09 80% GU time ~50eV to ~2500eV NIST funded now ASAP Transfer to NSLS II

11 U7A : High Throughput NEXAFS (EY/FY) and XPS Soft Matter Structure and Chemistry (in situ also)

12 Creating and utilizing the best detectors for electrons and soft x-rays to increase sensitivity and throughput Leveraging using a total 14 NIST SBIR grants to date = $2100 K Applying automated data acquisition Ultimately parallel processing of entire sample libraries Large area partial electron yield detector Windowless SiLi fluorescence detector Sample bar (back) Soft X-rays In U7A : High Throughput NEXAFS (EY/FY) and XPS Soft Matter Structure and Chemistry (in situ also)

13 U7A: Creating / utilizing the best detectors for electrons and soft x-rays; increase sensitivity and throughput Now fully working! 14 element Si(Li) detector with ultra-thin surface dead-layers Physical Sciences Inc. Phase I and II SBIR Impact -> soft x-ray sensitivity and resolution Improvement in the Low Energy Collection Efficiency of Si(Li) X-ray Detectors Conference on the Application of Accelerators in Research and Industry, Ft Worth, TX (2005). High Efficiency Circular Array Secondary Electron Yield Detectors: Final plan proceeding quickly Detector Technology Inc. Phase I and II SBIR Impact-> high throughput near surface chemical depth profile How accomplished-> parallel detection of all electron takeoff angles

14 U7A: Parallel process NEXAFS imaging of Soft Matter (10mm 2 areas) SAM gradients, DNA / protein chips, Catalyst libraries, Patterned surfaces Magnetic Lens (NIST SBIR) Tunable soft x-ray beam 10 x 10 mm -SAM gradients - DNA protein chips - Catalyst libraries - Patterned overlayers Channel plate imaging detector 75 micron spatial resolution (NIST SBIR)

15 Channel plate imaging detector 75 micron spatial resolution U7A: Parallel process NEXAFS imaging of Soft Matter (10mm 2 areas) SAM gradients, DNA / protein chips, Catalyst libraries, Patterned surfaces 8/07 NIST SBIR Phase II Awarded to E. L. Principe Inc. (Combi-NEXAFS detector) Large Area Imaging Two-Dimensional Electron Energy Analyzer soft x-ray beam 10 x 10 mm soft x-ray beam 10 x 10 mm High pass grid

16 Wobble Mirror optics for creating tunable Soft X- ray sample illumination beam (1cm 2 ) Gradients or Sample Array (~100 samples) Sample introduction / manipulator system Large Area Magnetic Imaging Electron Energy Analyzer Parallel process NEXAFS imaging, Phase II SBIR, delivery in FY07 U7A Existing Soft X-ray Experimental Chamber U7A: Parallel process NEXAFS imaging of Soft Matter (10mm2 areas) SAM gradients, DNA / protein chips, Catalyst libraries, Patterned surfaces

17 Summary: Soft Matter Science at NSLS II Needs and Opportunities Soft Matter: Treat me nicely! Beam sample damage possible Many soft matter NEXAFS and XPS experiments need to be accommodated NSLS II Soft Bend for NEXAFS and XPS Endstation similar to U7A In one beamline a broad energy range for spectroscopy; ~50 to ~3000eV NIST and NSLS team to develop first NSLS II Soft Bend Beamline (at NSLS U8) FY08/09 NSLS II Workshop July 18, 2007 Soft Matter Breakout Session


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